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physics, applied (22) 22
materials science, multidisciplinary (17) 17
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photoemission (11) 11
physics, condensed matter (11) 11
engineering, electrical & electronic (9) 9
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oxid (8) 8
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internal photoemission (5) 5
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ab initio calculations (2) 2
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dichtefunktionaltheorie (2) 2
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electron spin resonance (2) 2
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2014, 2nd ed., ISBN 0080999298, xviii, 385
The second edition of Internal Photoemission Spectroscopy thoroughly updates this vital, practical guide to internal photoemission (IPE) phenomena and... 
Semiconductors | Photoelectron spectroscopy | Junctions | Photoemission | Chemistry
Book
Advances in Condensed Matter Physics, ISSN 1687-8108, 2014, Volume 2014, pp. 1 - 30
Evolution of the electron energy band alignment at interfaces between different semiconductors and wide-gap oxide insulators is examined using the internal... 
ENERGY-LOSS SPECTROSCOPY | OFFSETS | CONDENSATION TECHNIQUE | PHYSICS, CONDENSED MATTER | GATE DIELECTRICS | GAP | RAY PHOTOELECTRON-SPECTROSCOPY | LAYER-DEPOSITED AL2O3 | HIGH-K DIELECTRICS | METAL-OXIDES | Nanoparticles | Semiconductors | Spectrum analysis
Journal Article
Nanotechnology, ISSN 0957-4484, 03/2019, Volume 30, Issue 20, p. 205201
Amorphous aluminum oxide Al O (a-Al O ) layers grown by various deposition techniques contain a significant density of negative charges. In spite of several... 
solar | amorphous | DFT | hybrid functional | defects | charge trapping | Physics - Materials Science
Journal Article
Journal of Physics Condensed Matter, ISSN 0953-8984, 05/2018, Volume 30, Issue 23, p. 233001
We review the current understanding of intrinsic electron and hole trapping in insulating amorphous oxide films on semiconductor and metal substrates. The... 
ab initio calculations | Frenkel defects | amorphous oxides | charge trapping | HFO2 | HOLE | PHYSICS, CONDENSED MATTER | LOCALIZED STATES | DENSITY-FUNCTIONAL CALCULATIONS | KAPPA GATE DIELECTRICS | SUPERCOOLED LIQUIDS | SMALL POLARONS | GLASS | EXCESS ELECTRONS | TIO2
Journal Article
Nanotechnology, ISSN 0957-4484, 02/2018, Volume 29, Issue 12, p. 125703
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 04/2019, Volume 66, Issue 4, pp. 1892 - 1898
We present a defect spectroscopy technique to profile the energy and spatial distribution of defects within a material stack from leakage current (J-V),... 
metal-insulator-metal (MIM) capacitor | dynamic random-access memory (DRAM) | gate leakage | ZrO | defect spectroscopy | Capacitance | conductance | ZrO2 | PHYSICS, APPLIED | GENERATION | THIN OXIDES | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
NANOTECHNOLOGY, ISSN 0957-4484, 05/2019, Volume 30, Issue 20, p. 205201
Amorphous aluminum oxide Al2O3 (a-Al2O3) layers grown by various deposition techniques contain a significant density of negative charges. In spite of several... 
PHYSICS, APPLIED | amorphous | MATERIALS SCIENCE, MULTIDISCIPLINARY | solar | NANOSCIENCE & NANOTECHNOLOGY | Al2O3 | ULTRATHIN LAYERS | DENSITY | HYDROGEN | ZRO2 | TRANSISTORS | DFT | INTERFACE | BOND-TYPE DEFECTS | hybrid functional | defects | SIOX | OXIDES | charge trapping
Journal Article
Microelectronic Engineering, ISSN 0167-9317, 11/2015, Volume 147, pp. 141 - 144
Journal Article
Solid State Electronics, ISSN 0038-1101, 01/2016, Volume 115, pp. 133 - 139
DRAM capacitors are reaching the scaling limit and new approaches are necessary to enable further reduction of the physical thickness of the capacitor... 
PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | ENGINEERING, ELECTRICAL & ELECTRONIC | Circuit components | Electronic components industry | Memory (Computers) | Capacitors | Nitrides | Analysis
Journal Article
2008, ISBN 9780080451459
Photoemission of charge carriers from one solid into another (internal photoemission, IPE) is the counterpart of the well-known photoemission into vacuum... 
Book
Nano Research, ISSN 1998-0124, 3/2018, Volume 11, Issue 3, pp. 1755 - 1755
The name of the second author in the original version of this article was unfortunately wrongly written on page 1169.Instead ofKostantina IordanidouIt should... 
Condensed Matter Physics | Biomedicine, general | Biotechnology | Materials Science | Materials Science, general | Atomic/Molecular Structure and Spectra | Nanotechnology | Silicene | Substrates
Journal Article
The Journal of Physical Chemistry C, ISSN 1932-7447, 04/2016, Volume 120, Issue 16, pp. 8979 - 8985
γ-Al2O3 layers fabricated by annealing-induced crystallization of ALD-grown amorphous (a-) Al2O3 films were studied using near-edge-X-ray absorption fine... 
OPTICAL-CONSTANTS | MATERIALS SCIENCE, MULTIDISCIPLINARY | CHEMISTRY, PHYSICAL | NANOSCIENCE & NANOTECHNOLOGY | TRANSITIONS | BAND-GAP | RANGE | SIO2
Journal Article
Advanced Materials Interfaces, ISSN 2196-7350, 02/2016, Volume 3, Issue 4, p. n/a
Large area MoS2 films with tunable physical‐chemical properties are grown on dielectric substrates by annealing of ultrathin Mo layers in the presence of a... 
transition metal dichalcogenides | MoS2 | MX2 heterostructures | 2D materials | MoS | heterostructures | THIN-LAYERS | MONOLAYER MOS2 | MONO LAYER | TRANSISTORS | CHEMICAL-VAPOR-DEPOSITION | SINGLE-LAYER | MATERIALS SCIENCE, MULTIDISCIPLINARY | ATOMIC LAYERS | HIGH-QUALITY | PHASE GROWTH | HIGH-MOBILITY | CHEMISTRY, MULTIDISCIPLINARY
Journal Article
Thin Solid Films, ISSN 0040-6090, 03/2019, Volume 674, pp. 39 - 43
Internal photoemission of electrons from uncapped monolayer graphene to insulating SiO2 has been observed in samples prepared by water-intercalation based... 
Internal photoemission | Interface barrier | Uncapped graphene | Graphene | Effective work function | PHYSICS, CONDENSED MATTER | CONTACT | ENERGY | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | INTERFACE | SCIENCE | MATERIALS SCIENCE, COATINGS & FILMS | WATER | Silicon | Silica | Analysis | Graphite
Journal Article
Microelectronic Engineering, ISSN 0167-9317, 09/2013, Volume 109, pp. 68 - 71
[Display omitted] •Wide O–Si–O angles in bulk amorphous silica are shown to trap electrons.•Trapped electron levels appear 3.2eV below the bottom of the silica... 
Electron trapping | Device Reliability | Deep state traps | Silica defects | PHYSICS, APPLIED | TRAPS | OXIDE | NANOSCIENCE & NANOTECHNOLOGY | ENGINEERING, ELECTRICAL & ELECTRONIC | DENSITY | INTERFACE | OPTICS | SIO2 | Silica | Trapping | Amorphous structure | Precursors | Banded structure | Density functional theory | Mathematical models | Elongation | Silicon dioxide
Journal Article
physica status solidi (RRL) – Rapid Research Letters, ISSN 1862-6254, 05/2016, Volume 10, Issue 5, pp. 420 - 425
Journal Article
physica status solidi (a), ISSN 1862-6300, 02/2014, Volume 211, Issue 2, pp. 382 - 388
Precise evaluation of the effective work function and the built‐in voltage in metal–oxide–metal (MOS) or metal–insulator–metal (MIM) stacks is crucial for... 
interfaces | internal photoemission | work function | band alignment | energy barriers | RANDOM-ACCESS MEMORY | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | SYSTEMS | HEIGHT | Analysis | Aluminum oxide
Journal Article