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Scientific Reports, 3, 2013, ISSN 2045-2322, 01/2013, Volume 3, Issue 1, p. 1115
We shed light on the catalyst-free growth of graphene from amorphous carbon (a–C) by current induced annealing by witnessing the mechanism both with in-situ... 
IN-SITU OBSERVATION | HIGH-BIAS | FREE GROWTH | PHASE | CHEMICAL MOLECULAR-DYNAMICS | MULTIDISCIPLINARY SCIENCES | SUBLIMATION | GAS | NANOTUBES | NANOSTRUCTURES | SIMULATIONS | Transformation | Transmission electron microscopy | Electron microscopy | Nanotubes | Physics - Materials Science
Journal Article
Nature Communications, ISSN 2041-1723, 12/2018, Volume 9, Issue 1, pp. 836 - 9
Oxidative wet-chemical delamination of graphene from graphite is expected to become a scalable production method. However, the formation process of the... 
FUNCTIONALIZATION | DEFECTS | OXIDE | COVALENT | SULFATE | MULTIDISCIPLINARY SCIENCES | GROWTH | CHEMISTRY | CHALLENGES | WATER | Atomic force microscopy | Crystal defects | Flakes (defects) | Molecular dynamics | Stability analysis | Intercalation | Sulfates | Electron microscopy | Sulfuric acid | Friction reduction | Transmission electron microscopy | Acids | Friction | Graphene | Graphite | Oxidation | Sulfate
Journal Article
Angewandte Chemie International Edition, ISSN 1433-7851, 07/2017, Volume 56, Issue 31, pp. 9222 - 9225
Journal Article
Ultramicroscopy, ISSN 0304-3991, 2019, Volume 203, pp. 12 - 20
Fundamental solid state physics phenomena often occur at very low temperatures, requiring liquid helium cooling in experimental studies. Transmission electron... 
Instrumentation | In-situ | TEM | STEM | STAGE | RESOLUTION | ELECTRON-MICROSCOPY | MICROSCOPY | ABERRATION CORRECTORS | Atoms | Electron microscopy | Transmission electron microscopes
Journal Article
Physical Review Letters, ISSN 0031-9007, 10/2013, Volume 111, Issue 17, pp. 173902 - 173902
The phase problem can be considered as one of the cornerstones of quantum mechanics intimately connected to the detection process and the uncertainty relation.... 
PARTIALLY COHERENT FIELDS | DISLOCATIONS | IMAGE | PHYSICS, MULTIDISCIPLINARY | ELECTRON-MICROSCOPY | FRESNEL REGION | EQUATION
Journal Article
Journal of the American Chemical Society, ISSN 0002-7863, 07/2018, Volume 140, Issue 29, pp. 9051 - 9055
Stabilizing nanoparticles on surfaces, such as graphene, is a growing field of research. Thereby, iron particle stabilization on carbon materials is attractive... 
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 06/2018, Volume 24, Issue 3, pp. 249 - 255
The electron source brightness is an important parameter of an electron microscope. Reliable and easy brightness measurement routes are not easily found. A... 
electron source | optical parameters | electron microscopy | brightness | TEM | HOLOGRAPHY | MATERIALS SCIENCE, MULTIDISCIPLINARY | SPREAD | MICROSCOPY | FRINGES | Automation | Fourier transforms | Transmission electron microscopy | Brightness | Illumination | Textbooks | Luminance distribution
Journal Article
Physical Review Letters, ISSN 0031-9007, 08/2016, Volume 117, Issue 7, pp. 076101 - 076101
Atomic resolution in transmission electron microscopy of thin and light-atom materials requires a rigorous reduction of the beam energy to reduce knockon... 
TRANSMISSION ELECTRON-MICROSCOPY | VOLTAGE | SERIES | SPHERICAL-ABERRATION | SPECTROSCOPY | PHYSICS, MULTIDISCIPLINARY | Electric potential | Transmission electron microscopy | Graphene | Imaging | Voltage | Apertures | Aberration | Image contrast
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 2016, Volume 22, Issue S3, pp. 776 - 777
Journal Article
Ultramicroscopy, ISSN 0304-3991, 11/2017, Volume 182, pp. 308 - 308
Journal Article