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Journal Article
Lancet, The, ISSN 0140-6736, 2010, Volume 376, Issue 9758, pp. 2075 - 2085
Journal Article
Liver Transplantation, ISSN 1527-6465, 02/2017, Volume 23, Issue 2, pp. 184 - 193
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 2014, Volume 61, Issue 1, pp. 178 - 185
Journal Article
Journal Article
IEEE Electron Device Letters, ISSN 0741-3106, 05/2016, Volume 37, Issue 5, pp. 560 - 563
A simulation study on the effects of different strain configurations on n-type III-V-based nanowire tunnel-FETs is presented, with the aim to determine optimal... 
strain | NEGF | Photonic band gap | Tensile strain | Tunneling | Nanoscale devices | III-V materials | Stress | Tunnel FETs | nanowire | OPTIMIZATION | FIELD-EFFECT TRANSISTORS | FETS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Plastic and Reconstructive Surgery - Global Open, ISSN 2169-7574, 11/2018, Volume 6, Issue 11, pp. e2020 - e2020
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 01/2013, Volume 60, Issue 1, pp. 140 - 146
Journal Article
IEEE Electron Device Letters, ISSN 0741-3106, 11/2016, Volume 37, Issue 11, pp. 1489 - 1492
A simulation study of the graphene base transistor is presented based on the most recent experimental results involving a novel double-layer emitter-to-base... 
modeling | Current measurement | Graphene | simulation | Solids | Insulators | Silicon | Diamond | Transistors | transistor | HOT-ELECTRON TRANSISTOR | OPERATION | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Transactions on Dielectrics and Electrical Insulation, ISSN 1070-9878, 12/2018, Volume 25, Issue 6, pp. 2421 - 2428
The properties of different molding-compound materials with high filler contents have been investigated in order to assess their electrical properties. The... 
spectroscopy | dielectric polarization | epoxy resins | GLASS-TRANSITION | PHYSICS, APPLIED | FILMS | RELAXATION | COMPOSITES | VISCOSITY | MICRO | ENGINEERING, ELECTRICAL & ELECTRONIC | Electrical properties | Electrical resistivity | Electric fields | Dielectric properties
Journal Article
Haematologica, ISSN 0390-6078, 02/2013, Volume 98, Issue 2, pp. 193 - 200
Imatinib has so far been the first-choice treatment in chronic myeloid leukemia with excellent results. However, only a proportion of patients achieve major... 
CHRONIC MYELOGENOUS LEUKEMIA | CHRONIC-PHASE | LOW OCT-1 ACTIVITY | STANDARD-DOSE IMATINIB | TYROSINE KINASE INHIBITOR | MDR1 GENE | FOLLOW-UP | DRUG-RESISTANCE | HEMATOLOGY | MULTIDRUG-RESISTANCE GENE | CML PATIENTS | Humans | Middle Aged | Leukemia, Myelogenous, Chronic, BCR-ABL Positive - drug therapy | Benzamides - metabolism | Cytochrome P-450 Enzyme System - metabolism | Leukemia, Myelogenous, Chronic, BCR-ABL Positive - genetics | Male | Piperazines - metabolism | Antineoplastic Agents - therapeutic use | Pyrimidines - metabolism | Antineoplastic Agents - metabolism | Young Adult | Benzamides - therapeutic use | Cytochrome P-450 CYP3A - genetics | Cation Transport Proteins - metabolism | Adult | Cation Transport Proteins - genetics | Female | Organic Cation Transport Proteins - metabolism | Genotype | Treatment Outcome | Piperazines - therapeutic use | Imatinib Mesylate | ATP Binding Cassette Transporter, Subfamily B, Member 1 - genetics | ATP Binding Cassette Transporter, Subfamily B, Member 1 - metabolism | Cytochrome P-450 CYP3A - metabolism | Protein Kinase Inhibitors - therapeutic use | Pyrimidines - therapeutic use | Adolescent | Alleles | Cytochrome P-450 Enzyme System - genetics | Aged | Polymorphism, Single Nucleotide | Organic Cation Transport Proteins - genetics | Protein Kinase Inhibitors - metabolism
Journal Article
IEEE Electron Device Letters, ISSN 0741-3106, 12/2013, Volume 34, Issue 12, pp. 1557 - 1559
The impact of semiconductor/oxide interface traps (ITs) on the turn-on characteristics of tunnel field-effect transistors (TFETs) is carefully investigated... 
band-to-band tunneling (BTBT) | Electron traps | tunnel field-effect transistor (TFET) | Field effect transistors | InAs | Logic gates | Tunneling | interface traps | Semiconductor process modeling | Ambipolarity | Aluminum oxide | MODEL | FIELD-EFFECT TRANSISTORS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article