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Nature photonics, ISSN 1749-4885, 08/2017, Volume 11, Issue 8, pp. 486 - 490
Journal Article
Journal of lightwave technology, ISSN 0733-8724, 09/2017, Volume 35, Issue 18, pp. 4047 - 4055
Optical losses | Optical filters | Optical polarization | Phase shifters | Electrooptic modulators | intensity modulation | Silicon | optical transmitters | Optical modulation | silicon photonics | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Optics | Telecommunications | Science & Technology | Gallium indium arsenide phosphide | Fiber optic networks | Benchmarks | Wavelength division multiplexing | Product development | Devices | Wavelength division | Modulators | Figure of merit | Photonics | Silicon germanides
Journal Article
Journal of lightwave technology, ISSN 0733-8724, 01/2016, Volume 34, Issue 2, pp. 286 - 295
Journal Article
Journal of lightwave technology, ISSN 0733-8724, 03/2015, Volume 33, Issue 6, pp. 1247 - 1254
Integrated circuits | Integrated optics | Mach-Zehnder Modulator | Silicon photonics | Optical modulation | 50Gb/s | Optical waveguides | High-speed optical techniques | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Optics | Telecommunications | Science & Technology | Optical fibers | Lasers | Electronics | Silicon | Lanes | Devices | Channels | Photonics
Journal Article
Journal of lightwave technology, ISSN 0733-8724, 09/2018, Volume 36, Issue 18, pp. 3935 - 3940
Advanced modulation formats | silicon modulators | Phase shift keying | Constellation diagram | Lithium niobate | Silicon | optical transmitters | integrated optics | silicon photonics | Optical waveguides | coherent optical communications | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Optics | Telecommunications | Science & Technology | Mach-Zehnder interferometers | Keying | Signal generation | Modulation | Lithium niobates | Bandwidth | Optical communication | On-Off Keying | Photonic | Engineering Sciences
Journal Article
Journal of lightwave technology, ISSN 0733-8724, 03/2019, Volume 37, Issue 5, pp. 1474 - 1483
Optical interferometry | Optical switches | Phase shifters | heterogeneous integration | Si photonics | optical phase shifter | III-V compound semiconductor | Electronic-photonic integration | photonic neural network | Optical variables control | Silicon | optical modulator | Optical modulation | Optical refraction | optical switch | Phase modulation | Capacitors | Refractivity | Accumulation | Aluminum oxide | Photonics | Integrated circuits | Mach-Zehnder interferometers | Gallium indium arsenide phosphide | Absorption | Numerical analysis | Atomic layer deposition | Neural networks | Optical switching | Machine learning | Chemical bonds | Bonding | Electrons
Journal Article
IEEE transactions on electron devices, ISSN 0018-9383, 05/2015, Volume 62, Issue 5, pp. 1375 - 1382
MOSFET | compact model | III--V | Logic gates | Energy states | Quantum capacitance | Mathematical model | Equations | double gate (DG) | ultrathin-body BOX (UTBB) | III - V | quantum capacitance | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Physics | Science & Technology | Physics, Applied | Metal oxide semiconductor field effect transistors | Gates (Electronics) | Research | Perturbation theory | Energy levels | Computer simulation | Mathematical analysis | Capacitance | Channels | MOSFETs | Gates | Engineering Sciences | Micro and nanotechnologies | Microelectronics
Journal Article
Journal of optics (2010), ISSN 2040-8978, 06/2016, Volume 18, Issue 7, p. 73003
Journal Article
IEEE transactions on electron devices, ISSN 0018-9383, 01/2015, Volume 62, Issue 1, pp. 28 - 35
short-channel effects (SCEs) | Electric potential | nanowire (NW) | Boundary conditions | Approximation methods | Equations | effective built-in potential | Semiconductor process modeling | Compact model | Mathematical model | fully depleted | Junctions | double gate (DG) | junctions | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Physics | Science & Technology | Physics, Applied | Models | Engineering Sciences | Micro and nanotechnologies | Microelectronics
Journal Article
Japanese Journal of Applied Physics, ISSN 0021-4922, 02/2019, Volume 58, Issue SB, p. SBBE02
Journal Article
IEEE transactions on electron devices, ISSN 0018-9383, 01/2008, Volume 55, Issue 1, pp. 96 - 130
emerging technologies | MOSFET | mobility | 32 nm | Materials | FinFET | H-K | multithreshold voltage | Mobile communication | static noise margin (SNM) | roadmap | germanium | variability | gate dielectric | CMOS | thin body | nanotechnologies | CMOS integrated circuits | fully depleted silicon-on-insulator (FDSOI) | strain | mobile | technology | SRAM | double gate | metallic gate | silicon-on-nothing (SON) | multimedia | silicon | Logic gates | CMOS technology | low power | shallow junction | Power dissipation | Transistors | thin BOX | Emerging technologies | Silicon-on-nothing (SON) | Variability | Fully depleted silicon-on-insulator (FDSOI) | Mobility | Multithreshold voltage | Technology | Silicon | Gate dielectric | Shallow junction | Multimedia | Double gate | Static noise margin (SNM) | Thin body | Low power | Mobile | Metallic gate | Strain | Thin BOX | Roadmap | Nanotechnologies | Germanium | Engineering | Physical Sciences | Engineering, Electrical & Electronic | Physics | Science & Technology | Physics, Applied | Metal oxide semiconductor field effect transistors | Silicon-on-isolator | Design and construction | Comparative analysis | Complementary metal oxide semiconductors | Pictures | Drivers | Semiconductor devices | Manufacturability | Devices | Density
Journal Article
Optics express, ISSN 1094-4087, 05/2017, Volume 25, Issue 10, pp. 11217 - 11222
Journal Article
IEEE transactions on electron devices, ISSN 0018-9383, 05/2012, Volume 59, Issue 5, pp. 1332 - 1344
Semiconductor device modeling | Analytical model | CMOS | benchmarking | Logic gates | Capacitance | Numerical models | Mathematical model | Junctions | Mercury (metals) | parasitic capacitance | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Physics | Science & Technology | Physics, Applied | Integrated circuits | Exact sciences and technology | Electronics | Applied sciences | Design. Technologies. Operation analysis. Testing | Transistors | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Measurement | Three-dimensional display systems | Usage | Field-effect transistors | Voltage | Design and construction | Complementary metal oxide semiconductors | Simulation methods
Journal Article
Nature communications, ISSN 2041-1723, 2014, Volume 5, Issue 1, pp. 4957 - 4957
Journal Article
Optics express, ISSN 1094-4087, 09/2019, Volume 27, Issue 18, pp. 26239 - 26250
Journal Article
Optics letters, ISSN 0146-9592, 09/2017, Volume 42, Issue 17, pp. 3439 - 3442