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detectors (57) 57
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engineering, electrical & electronic (31) 31
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general tagging of cross-sectional technologies spanning over several sections of the ipc (5) 5
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investigating or analysing materials by determining theirchemical or physical properties (5) 5
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Alta Frequenza Rivista Di Elettronica, ISSN 1120-1908, 07/1995, Volume 7, Issue 4, pp. 52 - 54
Journal Article
Alta Frequenza Rivista Di Elettronica, ISSN 1120-1908, 01/1997, Volume 9, Issue 1, pp. 23 - 30
Journal Article
04/1999, 6
The production of the device involving performing a first diffusion for obtaining a p-type zone (12) and a subsequent n<+> type diffusion to obtain the gate... 
SEMICONDUCTOR DEVICES | BASIC ELECTRIC ELEMENTS | ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR | ELECTRICITY
Patent
IEEE Nuclear Science Symposium and Medical Imaging Conference, 2001, Volume 2, pp. 906 - 908
Conference Proceeding
IEEE Transactions on Nuclear Science, ISSN 0018-9499, 08/2001, Volume 48, Issue 4, pp. 972 - 976
Journal Article
IEEE Nuclear Science Symposium and Medical Imaging Conference, 01/2001, Volume 1, pp. 185 - 188
We report on an R&D activity aimed at the realisation of silicon microstrip detectors with integrated front-end electronics, to be used in high-energy physics... 
Journal Article
Nuclear Inst. and Methods in Physics Research, A, ISSN 0168-9002, 2001, Volume 461, Issue 1, pp. 188 - 191
We report on the development of double-sided, AC-coupled, microstrip detectors oriented to the A Large Ion Collider Experiment (ALICE). The main design and... 
Electrical characterization | Silicon microstrip detectors | Fabrication technology | INSTRUMENTS & INSTRUMENTATION | SPECTROSCOPY | NUCLEAR SCIENCE & TECHNOLOGY | silicon microstrip detectors | electrical characterization | fabrication technology | PHYSICS, PARTICLES & FIELDS
Journal Article
Digest of Technical Papers - IEEE International Solid-State Circuits Conference, ISSN 0193-6530, 2002, pp. 24 - 25+383
Conference Proceeding
2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315), ISSN 0193-6530, 2002, Volume 1, pp. 40 - 442 vol.1
A 128/spl times/64 pixel image sensor in 0.35 /spl mu/m 3.3V CMOS technology achieves 138 dB dynamic range by adapting single-pixel integration time to the... 
Image sensors | Lighting | Dynamic range | CMOS image sensors | Capacitance | CMOS technology | Threshold voltage | Photodiodes | Analog memory | Pixel
Conference Proceeding
IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 12/2002, Volume 37, Issue 12, pp. 1846 - 1852
Journal Article
IEEE Transactions on Nuclear Science, ISSN 0018-9499, 06/2002, Volume 49, Issue 3, pp. 1022 - 1026
Journal Article
DIG TECH PAP IEEE INT SOLID STATE CIRCUITS CONF. pp. 40-41+442+33. 2002, ISSN 0193-6530, 01/2002
A dynamic range CMOS image sensor with new pixel architecture is presented. The image sensor achieves a dynamic range of 138 dB by adapting the single-pixel... 
Journal Article
DIG TECH PAP IEEE INT SOLID STATE CIRCUITS CONF, ISSN 0193-6530, 01/2002, pp. 24 - 25+383-384
A 138dB-dynamic-range CMOS image sensor was described with latest pixel architecture. A 128x64 pixel image sensor in 3.3V CMOS technology achieved 138dB... 
Journal Article
IEEE Transactions on Nuclear Science, ISSN 0018-9499, 08/2002, Volume 49, Issue 4, pp. 1712 - 1716
Journal Article
IEEE Transactions on Nuclear Science, ISSN 0018-9499, 12/2003, Volume 50, Issue 6, pp. 2474 - 2480
Journal Article
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