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àrees temàtiques de la upc (15) 15
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Sensors (Basel, Switzerland), ISSN 1424-8220, 01/2020, Volume 20, Issue 2, p. 411
Visual corona tests have been broadly applied for identifying the critical corona points of diverse high-voltage devices, although other approaches based on... 
Imaging sensor | Image converters | Partial discharge | Arc tracking | Convertidors | Electric discharges | Aeronautics | Energies | Imatges | High voltages | More electric aircraft | Aeronàutica | Enginyeria elèctrica | Energia elèctrica | High voltage | Corona (Electricity) | Alta tensió | Electricitat | Descàrregues elèctriques | Low pressure | Corona effect | Àrees temàtiques de la UPC
Journal Article
IEEE Electron Device Letters, ISSN 0741-3106, 02/2019, Volume 40, Issue 2, pp. 341 - 344
Journal Article
Journal of Electronic Testing: Theory and Applications (JETTA), ISSN 0923-8174, 06/2017, Volume 33, Issue 3, pp. 315 - 328
Journal Article
Integration, the VLSI Journal, ISSN 0167-9260, 09/2016, Volume 55, pp. 415 - 424
Journal Article
Journal Article
Electronics, ISSN 2079-9292, 01/2020, Volume 9, Issue 1, p. 200
The ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs... 
Journal Article
Microsystem Technologies, ISSN 0946-7076, 9/2015, Volume 21, Issue 9, pp. 1855 - 1866
Microelectromechanical systems fabrication and packaging may induce parametric defects which have to be efficiently diagnosed to improve fabrication yield and... 
Electronics and Microelectronics, Instrumentation | Engineering | Mechanical Engineering | Nanotechnology | CALIBRATION | NANOSCIENCE & NANOTECHNOLOGY | PHYSICS, APPLIED | MEMS | MATERIALS SCIENCE, MULTIDISCIPLINARY | ENGINEERING, ELECTRICAL & ELECTRONIC | Microelectromechanical systems | Integrated circuits | Analysis | Semiconductor chips
Journal Article
2014 IEEE 23rd Asian Test Symposium, ISSN 1081-7735, 11/2014, pp. 39 - 44
The advent of sensor networks, robots, autonomous vehicles and the smart grid have made the dependability of circuits and systems that control them critical to... 
Noise | Error compensation | Control systems | Vectors | Encoding | Circuit faults | Transient analysis
Conference Proceeding
2011 Asian Test Symposium, ISSN 1081-7735, 11/2011, pp. 413 - 418
Current nanometric IC processes need to assess the robustness of memories under any possible source of disturbance: process and mismatch variations, bulk... 
Measurement | energy metric | Single event upset | Noise | data retention | dynamic robustness | Random access memory | Robustness | Trajectory | 6T SRAM | Transient analysis | voltage noise induced SRAM failures
Conference Proceeding
Microelectronics Journal, ISSN 0026-2692, 10/2014, Volume 45, Issue 10, pp. 1348 - 1353
The conventional way to analyze the robustness of an SRAM bit cell is to quantify its immunity to static noise. The static immunity to disturbances like... 
Dynamic robustness | Signal energy metric | 6T SRAM | Data retention | Voltage noise induced SRAM failures | NANOSCIENCE & NANOTECHNOLOGY | LOGIC | ENGINEERING, ELECTRICAL & ELECTRONIC | Memory (Computers) | Analysis | Memòries digitals | Electronics | Àrees temàtiques de la UPC | Enginyeria electrònica
Journal Article
2014 IEEE 20th International On-Line Testing Symposium (IOLTS), ISSN 1942-9398, 07/2014, pp. 25 - 30
Analog circuits are sensitive to signal aggressions and power supply noise, crosstalk coupling and alpha particle strikes can cause significant degradation of... 
Band-pass filters | Minimum Distance Check-sums | Linear Analog Filters | Noise cancellation | Vectors | Real-time systems | Learning-Assisted Checksums | Real-Time Error Cancellation | Analog Checksums | Real-Time Noise Cancellation | Transient analysis | Equations | Circuits analògics | Electronics | Àrees temàtiques de la UPC | Enginyeria electrònica
Conference Proceeding
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 11/2017, Volume 2017-, pp. 1 - 6
Testing of analogue and M-S circuits using octree encoding in alternate measurements space has been shown effective to detect parametric failures. In this... 
Band-pass filters | Operational amplifiers | Shape | Image color analysis | Octrees | alternate test | Structural Test | Octree encoding | catastrophic defects | Encoding | Mixed-Signal circuits | Integrated circuit modeling
Conference Proceeding
2014 19th IEEE European Test Symposium (ETS), ISSN 1530-1877, 05/2014, pp. 1 - 2
Analog checksum based fault tolerance for linear circuits has been proposed in the past but remains a theoretical artifact due to the high cost and complexity... 
Fault tolerance | Fault tolerant systems | Signal processing algorithms | Analog circuits | Control systems | Real-time systems | Circuit faults | Analog Checksums | Error Compensation | Structural Fault
Conference Proceeding
2014 19th IEEE European Test Symposium (ETS), ISSN 1530-1877, 05/2014, pp. 1 - 6
Binning of IC circuits after volume fabrication is widely used to separate tested circuits in different classes depending on different degrees of... 
Classifiers | Phase measurement | Indirect Measurements | Noise | Quality Binning | Quadtrees | Specification Binning | Biquad Filter | Alternate Test | Training | Octrees | Production | Mixed-Signal Binning
Conference Proceeding
2011 Proceedings of 7th International Conference on Perspective Technologies and Methods in MEMS Design, MEMSTECH 2011, 2011, pp. 75 - 81
Conference Proceeding
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW), 07/2016, pp. 1 - 6
Indirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever... 
Measurement | Classifiers | Indirect Measurements | 2n-Trees | Quadtrees | Mixed-Signal Test | Encoding | Biquad Filter | Analog Metrics | Alternate Test | Band-pass filters | Training | Test Escapes | Octrees | Band-Pass Filter | Production | Testing | Trees | Tessellation | Computer simulation | Circuits | Boundaries | Criteria | Proposals | Devices
Conference Proceeding
2015 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 09/2015, pp. 1 - 4
Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods... 
Analog Signature | Signature Compaction | Classifiers | Phase measurement | Indirect Measurements | Mixed-Signal Testing | Noise | 2 n -Trees | Quadtrees | Band Guarding | Test Escapes Control | Biquad Filter | Alternate Test | Band-pass filters | Training | Octrees | Band-Pass Filter | Testing | Trees | Tasks | Conferences | Circuit design | Simulation | Specifications | Circuits | Criteria
Conference Proceeding
2014, ISBN 9781479953233
Analog circuits are sensitive to signal aggressions and power supply noise, crosstalk coupling and alpha particle strikes can cause significant degradation of... 
Circuits analògics | Electric circuit analysis | Àrees temàtiques de la UPC | Enginyeria electrònica
Publication
2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 04/2015, pp. 1 - 6
Conference Proceeding
2013 18th IEEE European Test Symposium (ETS), ISSN 1530-1877, 05/2013, pp. 1 - 6
Testing M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect testing methods have been adopted as an... 
Resistors | Monte Carlo methods | Test Escapes | Lissajous Compositions | Octrees | Capacitors | Quadtrees | Mixed-Signal Test | Extraterrestrial measurements | Test Yield Loss | Test Metrics | Testing | Electrical engineering | Assaigs | Circuits electrònics | Electric circuits | Electronic circuits | Àrees temàtiques de la UPC | Enginyeria electrònica
Conference Proceeding
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