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CIRP Annals - Manufacturing Technology, ISSN 0007-8506, 2015, Volume 64, Issue 2, pp. 797 - 813
In this paper, the calibration and verification infrastructure to support areal surface texture measurement and characterisation will be reviewed. A short... 
Uncertainty | Topography | Calibration | WHITE-LIGHT INTERFEROMETRY | STYLUS TIP CURVATURE | ROUGHNESS MEASUREMENTS | WAVELENGTH | HIGH-RESOLUTION | ENGINEERING, MANUFACTURING | SPECTRAL-ANALYSIS | ENGINEERING, INDUSTRIAL | PHASE-CHANGE | STANDARD
Journal Article
Applied Optics, ISSN 1559-128X, 04/2017, Volume 56, Issue 10, pp. 2960 - 2967
It was suggested in [Appl. Opt. 52, 3662 (2013)] that the result of a measurement via coherence scanning interferometry could be viewed as the convolution of a... 
UNCERTAINTY | ERRORS | OPTICS | APPROXIMATION | INSTRUMENTS | Surface roughness | Research | Analysis | Coherence (Optics) | Interferometers | Scanning | Approximation | Mathematical analysis | Coherence | Measuring instruments | Point spread functions | Interferometry
Journal Article
Optics Express, ISSN 1094-4087, 09/2015, Volume 23, Issue 18, pp. 24057 - 24070
Frequency Domain Analysis of measurement results from coherence scanning interferometers provides an estimate of the topography of the surface scattering the... 
WHITE-LIGHT INTERFEROGRAMS | INTERFEROMETRY | OPTICS
Journal Article
Journal of Microscopy, ISSN 0022-2720, 07/2013, Volume 251, Issue 1, pp. 99 - 107
Summary This work reports on the retrieval of the pupil function and coherent transfer function of a coherent reflection type confocal microscope from... 
Confocal microscopy | phase retrieval | 3D transfer function | Phase retrieval | WAVE-FRONT RECONSTRUCTION | LOCALIZATION | POINT-SPREAD FUNCTION | IMAGE | FOCAL REGION | SINGULARITIES | RESOLUTION | MICROSCOPY | Microscope and microscopy | Algorithms | Microscopy | Microscopes | Computer simulation | Mathematical analysis | Coherence | Mathematical models | Confocal | Pupils
Journal Article
Optics Express, ISSN 1094-4087, 06/2015, Volume 23, Issue 13, pp. 16617 - 16627
It has been suggested recently that the Transfer Function of instruments such as Coherence Scanning Interferometers could be measured via a single measurement... 
MICROSCOPE | DECONVOLUTION | OPTICS
Journal Article
Journal of Microscopy, ISSN 0022-2720, 07/2013, Volume 251, Issue 1, pp. 99 - 107
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2012, Volume 8430
Conference Proceeding
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2012, Volume 8430
Conference Proceeding
Journal of Physics: Conference Series, ISSN 1742-6588, 2011, Volume 311, Issue 1, pp. 12005 - 6
The use of areal surface topography measuring instruments has increased significantly over the past ten years as industry starts to embrace the use of surface... 
Scanning | Topography | Measuring instruments | Artefacts | Calibration | Styli | Standards | Interferometers
Conference Proceeding
ACS Nano, ISSN 1936-0851, 08/2016, Volume 10, Issue 8, pp. 7840 - 7846
Light emission in atomically thin heterostructures is known to depend on the type of materials and the number and stacking sequence of the constituent layers.... 
work function | ab initio calculations | trions | epitaxial graphene | tungsten disulfide monolayer | heterostructures | excitonic effects | ENERGY | PHOTOLUMINESCENCE | MOS2 | MATERIALS SCIENCE, MULTIDISCIPLINARY | CHEMISTRY, PHYSICAL | NANOSCIENCE & NANOTECHNOLOGY | BAND-STRUCTURE | CHEMISTRY, MULTIDISCIPLINARY | TRANSITION | WS2 | GROWTH | ELECTRONICS
Journal Article
Measurement, ISSN 0263-2241, 2011, Volume 44, Issue 5, pp. 988 - 993
The National Physical Laboratory has recently developed a traceable measuring instrument that uses a stylus probe to measure topography in three dimensions.... 
Traceability | Uncertainty | Surface texture measurement | Areal surface texture | GUM | Monte Carlo simulation | Interferometry | INSTRUMENTS & INSTRUMENTATION | ENGINEERING, MULTIDISCIPLINARY | Monte Carlo method | Analysis | Measuring instruments | Monte Carlo methods | Computer simulation | Topography | Surface layer | Mathematical models | Texture
Journal Article
Materials Research Society Symposium Proceedings, ISSN 0272-9172, 2010, Volume 1258, pp. 239 - 244
The electronic properties of carbon nanotubes are quite often drastically affected by the presence of defects that can develop during nanotube growth,... 
Scanning tunneling microscopy | Electronic properties | Nanocomposites | Carbon nanotubes | Nanomaterials | Nanostructure | Helicity | Defects
Conference Proceeding
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