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Journal of structural biology, ISSN 1047-8477, 2017, Volume 197, Issue 2, pp. 83 - 93
Journal Article
04/2020
A loading station for translocating a frozen sample for electron microscopy, encompassing a chamber, open toward the top, that is fillable at least partly with... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
02/2019
A loading station (100, 200) for translocating a frozen sample for electron microscopy, encompassing a chamber (104, 204), open toward the top, that is... 
TESTING | OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS | BASIC ELECTRIC ELEMENTS | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS | OPTICS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
12/2018
A loading station for translocating a frozen sample for electron microscopy, encompassing a chamber, open toward the top, that is fillable at least partly with... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
07/2017
A loading station (100, 200) for translocating a frozen sample for electron microscopy, encompassing a chamber (104, 204), open toward the top, that is... 
TESTING | OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS | BASIC ELECTRIC ELEMENTS | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS | OPTICS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
09/2020
The invention relates to a sample transfer device (10) for reception of a sample, having a transfer rod (4) that is configured for reception of a sample... 
TESTING | BASIC ELECTRIC ELEMENTS | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
06/2017
A loading station (100, 200) for translocating a frozen sample for electron microscopy, encompassing a chamber (104, 204), open toward the top, that is... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
03/2017
The invention relates to a loading station (100, 200) for transferring a frozen sample for electron microscopy, comprising a chamber (104, 204), which is open... 
APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] | SCANNING-PROBE TECHNIQUES OR APPARATUS | TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
03/2017
The invention relates to a loading station (100, 200) for transferring a frozen sample for electron microscopy, comprising a chamber (104, 204), which is open... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
11/2013
The mount (100) has a support surface (107) used for supporting an electron microscopy sample carrier and partially extended around an opening (103). Two... 
BASIC ELECTRIC ELEMENTS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
03/2013
A mount (100, 200) for holding an electron microscopy sample carrier (310) comprises a base plate (101) having an opening (103) through a middle region thereof... 
TESTING | BASIC ELECTRIC ELEMENTS | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
12/2012
Fassung (100, 200) zum Halten eines elektronenmikroskopischen Probenträgers (310), welche eine Grundplatte (101) mit einer in einem Mittelbereich der... 
BASIC ELECTRIC ELEMENTS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
02/2016
Ladestation (100, 200) zum Umladen einer gefrorenen Probe für die Elektronenmikroskopie umfassend eine nach oben hin offene Kammer (104, 204), die zumindest... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
05/2012
A mount (100, 200) for holding an electron microscopy sample carrier (310) comprises a base plate (101) having an opening (103) through a middle region thereof... 
BASIC ELECTRIC ELEMENTS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
06/2012
Fassung (100,200) zum Halten eines elektronenmikroskopischen Probenträgers (310), welche eine Grundplatte (101) mit einer in einem Mittelbereich der... 
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS | BASIC ELECTRIC ELEMENTS | PHYSICS | OPTICS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
05/2012
The mount (100) has a support surface (107) used for supporting an electron microscopy sample carrier and partially extended around an opening (103). Two... 
BASIC ELECTRIC ELEMENTS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
10/2018
The invention relates to a holding apparatus (100) for sample carriers (200) for use in cryomicroscopy, an arrangement having a manipulation container and such... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
10/2018
The invention relates to a holding apparatus (100) for sample carriers (200) for use in cryomicroscopy, encompassing: a body having at least one sample carrier... 
TRANSPORTING | PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL | CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE | PERFORMING OPERATIONS
Patent
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