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12/2019
A method for creating a low-cost specimen used for training users in lift out techniques is prepared using additive manufacturing. This replaces the more... 
TESTING | BASIC ELECTRIC ELEMENTS | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
Microscopy and Microanalysis, ISSN 1431-9276, 08/2019, Volume 25, Issue S2, pp. 1584 - 1585
A key challenge with nuclear safeguards environmental sampling is chemical and structure characterization of particulate material post release due to... 
RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 08/2019, Volume 25, Issue S2, pp. 914 - 915
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 08/2019, Volume 25, Issue S2, pp. 912 - 913
Journal Article
04/2019, ISBN 1118654064, 16
The combined focused ion beam microscope‐scanning electron microscope (FIB‐SEM) instrument has been used for many biomaterials applications over the years.... 
backscattered electron signal | soft biomaterials | non‐cryo‐applications | focused ion beam milling operations | FIB‐SEM | secondary electron signal | multi‐signal scanning electron microscope tomography | dental implants
Book Chapter
01/2019
A probe includes a solid elongate body disposed along a long axis of the probe and terminating in a probe tip, and a solid planar beveled surface at or... 
TESTING | BASIC ELECTRIC ELEMENTS | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS | ELECTRICITY | ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Patent
Microscopy and Microanalysis, ISSN 1431-9276, 08/2018, Volume 24, Issue S1, pp. 832 - 833
Journal Article
05/2018, Volume 20, Issue 2
The ability to apply focused ion beam (FIB) milling to just about any material for site-specific scanning/transmission electron microscopy was realized in the... 
Scanning electron microscopy | Transmission electron microscopy | Reproducibility | Van der Waals forces | Ion beams | Lift
Magazine Article
Microscopy and Microanalysis, ISSN 1431-9276, 2018
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 07/2017, Volume 23, Issue S1, pp. 306 - 307
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 07/2017, Volume 23, Issue S1, pp. 1672 - 1673
Journal Article
Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2017, Volume 2017-, pp. 275 - 278
Conference Proceeding
Microscopy and Microanalysis, ISSN 1431-9276, 07/2016, Volume 22, Issue S3, pp. 134 - 135
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 07/2016, Volume 22, Issue S3, pp. 1744 - 1745
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 07/2016, Volume 22, Issue S3, pp. 180 - 181
Journal Article
Polymer Engineering and Science, ISSN 0032-3888, 11/2015, Volume 55, Issue 11, p. 2603
  Polyacrylonitrile (PAN) and PAN/carbon nanotube (PAN/CNT) fibers were manufactured through dry-jet wet spinning and gel spinning. Fiber coagulation occurred... 
Carbon fibers | Morphology | Coagulation | Mechanical properties | Spinning | Tensile strength
Journal Article
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