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àrees temàtiques de la upc (14) 14
octrees (11) 11
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enginyeria electrònica (10) 10
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pass (2) 2
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IEEE Electron Device Letters, ISSN 0741-3106, 02/2019, Volume 40, Issue 2, pp. 341 - 344
Journal Article
Journal Article
Microsystem Technologies, ISSN 0946-7076, 9/2015, Volume 21, Issue 9, pp. 1855 - 1866
Microelectromechanical systems fabrication and packaging may induce parametric defects which have to be efficiently diagnosed to improve fabrication yield and... 
Electronics and Microelectronics, Instrumentation | Engineering | Mechanical Engineering | Nanotechnology | CALIBRATION | NANOSCIENCE & NANOTECHNOLOGY | PHYSICS, APPLIED | MEMS | MATERIALS SCIENCE, MULTIDISCIPLINARY | ENGINEERING, ELECTRICAL & ELECTRONIC | Microelectromechanical systems | Integrated circuits | Analysis | Semiconductor chips
Journal Article
Journal of Electronic Testing: Theory and Applications (JETTA), ISSN 0923-8174, 06/2017, Volume 33, Issue 3, pp. 315 - 328
Journal Article
Integration, the VLSI Journal, ISSN 0167-9260, 09/2016, Volume 55, pp. 415 - 424
Journal Article
2016 Conference on Design of Circuits and Integrated Systems (DCIS), 11/2016, pp. 1 - 6
This work proposes a criterion to select a subset of indirect measurements avoiding redundant information. The key idea of the proposal is to reduce the actual... 
Correlation | Pairwise error probability | Indirect Measurements | Redundancy | Quadtrees | Mixed-Signal Test | Signature Selection | Biquad Filter | Proposals | Analog Test | Alternate Test | Test Metrics | Band-pass filters | Current measurement | Octrees | Measurements Selection | Alternate Feature Selection | Testing | Analog Filter
Conference Proceeding
Design of Circuits and Integrated Systems, 11/2014, pp. 1 - 6
Analog and mixed-signal circuit testing is a challenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing... 
Q-factor | Correlation | Indirect Measurements | Quadtrees | Mixed-Signal Test | Signature Selection | Analog Test | Alternate Test | Band-pass filters | Monte Carlo methods | Octrees | Optimum Measures Selection | Gain | Alternate Feature Selection | Testing | Analog Filter
Conference Proceeding
2014 IEEE 23rd Asian Test Symposium, ISSN 1081-7735, 11/2014, pp. 39 - 44
The advent of sensor networks, robots, autonomous vehicles and the smart grid have made the dependability of circuits and systems that control them critical to... 
Noise | Error compensation | Control systems | Vectors | Encoding | Circuit faults | Transient analysis
Conference Proceeding
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 11/2017, Volume 2017-, pp. 1 - 6
Testing of analogue and M-S circuits using octree encoding in alternate measurements space has been shown effective to detect parametric failures. In this... 
Band-pass filters | Operational amplifiers | Shape | Image color analysis | Octrees | alternate test | Structural Test | Octree encoding | catastrophic defects | Encoding | Mixed-Signal circuits | Integrated circuit modeling
Conference Proceeding
2013 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 04/2013, pp. 1 - 6
Microelectromechanical systems production is still an immature technology compared to the classical semiconductor industry. MEMS fabrication and packaging... 
Accelerometers | Sensitivity | Lissajous Compositions | Metrics | Accelerometer Diagnosis | Mechanical Misalignment | Angular velocity | Calibration | Acceleration | Spinning
Conference Proceeding
Design of Circuits and Integrated Systems, 11/2014, pp. 1 - 6
Analog and mixed-signal circuit design demands high amounts of knowledge, expertise and intuition. To that purpose, it is not deniable electrical CAD tools... 
Signal Flow Graph Simulation | Linear Analog Filters | Capacitors | Behavioral Simulation | Transfer functions | Electrical Simulation | Biquad Filter | Electrical CAD | Voltage control | Equations | Error Cancellation | SPICE | Behavioral Description | Mathematical model | Analog Checksums | Transient analysis | Fault Tolerance
Conference Proceeding
2014 19th IEEE European Test Symposium (ETS), ISSN 1530-1877, 05/2014, pp. 1 - 2
Analog checksum based fault tolerance for linear circuits has been proposed in the past but remains a theoretical artifact due to the high cost and complexity... 
Fault tolerance | Fault tolerant systems | Signal processing algorithms | Analog circuits | Control systems | Real-time systems | Circuit faults | Analog Checksums | Error Compensation | Structural Fault
Conference Proceeding
2014 19th IEEE European Test Symposium (ETS), ISSN 1530-1877, 05/2014, pp. 1 - 6
Binning of IC circuits after volume fabrication is widely used to separate tested circuits in different classes depending on different degrees of... 
Classifiers | Phase measurement | Indirect Measurements | Noise | Quality Binning | Quadtrees | Specification Binning | Biquad Filter | Alternate Test | Training | Octrees | Production | Mixed-Signal Binning
Conference Proceeding
Microelectronics Journal, ISSN 0026-2692, 10/2014, Volume 45, Issue 10, pp. 1348 - 1353
The conventional way to analyze the robustness of an SRAM bit cell is to quantify its immunity to static noise. The static immunity to disturbances like... 
Dynamic robustness | Signal energy metric | 6T SRAM | Data retention | Voltage noise induced SRAM failures | NANOSCIENCE & NANOTECHNOLOGY | LOGIC | ENGINEERING, ELECTRICAL & ELECTRONIC | Memory (Computers) | Analysis | Memòries digitals | Electronics | Àrees temàtiques de la UPC | Enginyeria electrònica
Journal Article
2011 Asian Test Symposium, ISSN 1081-7735, 11/2011, pp. 413 - 418
Current nanometric IC processes need to assess the robustness of memories under any possible source of disturbance: process and mismatch variations, bulk... 
Measurement | energy metric | Single event upset | Noise | data retention | dynamic robustness | Random access memory | Robustness | Trajectory | 6T SRAM | Transient analysis | voltage noise induced SRAM failures
Conference Proceeding
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW), 07/2016, pp. 1 - 6
Indirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever... 
Measurement | Classifiers | Indirect Measurements | 2n-Trees | Quadtrees | Mixed-Signal Test | Encoding | Biquad Filter | Analog Metrics | Alternate Test | Band-pass filters | Training | Test Escapes | Octrees | Band-Pass Filter | Production | Testing | Trees | Tessellation | Computer simulation | Circuits | Boundaries | Criteria | Proposals | Devices
Conference Proceeding
2015 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 09/2015, pp. 1 - 4
Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods... 
Analog Signature | Signature Compaction | Classifiers | Phase measurement | Indirect Measurements | Mixed-Signal Testing | Noise | 2 n -Trees | Quadtrees | Band Guarding | Test Escapes Control | Biquad Filter | Alternate Test | Band-pass filters | Training | Octrees | Band-Pass Filter | Testing | Trees | Tasks | Conferences | Circuit design | Simulation | Specifications | Circuits | Criteria
Conference Proceeding
2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 04/2015, pp. 1 - 6
Conference Proceeding
2014 IEEE 20th International On-Line Testing Symposium (IOLTS), ISSN 1942-9398, 07/2014, pp. 25 - 30
Analog circuits are sensitive to signal aggressions and power supply noise, crosstalk coupling and alpha particle strikes can cause significant degradation of... 
Band-pass filters | Minimum Distance Check-sums | Linear Analog Filters | Noise cancellation | Vectors | Real-time systems | Learning-Assisted Checksums | Real-Time Error Cancellation | Analog Checksums | Real-Time Noise Cancellation | Transient analysis | Equations | Circuits analògics | Electronics | Àrees temàtiques de la UPC | Enginyeria electrònica
Conference Proceeding
2013 18th IEEE European Test Symposium (ETS), ISSN 1530-1877, 05/2013, pp. 1 - 6
Testing M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect testing methods have been adopted as an... 
Resistors | Monte Carlo methods | Test Escapes | Lissajous Compositions | Octrees | Capacitors | Quadtrees | Mixed-Signal Test | Extraterrestrial measurements | Test Yield Loss | Test Metrics | Testing | Electrical engineering | Assaigs | Circuits electrònics | Electric circuits | Electronic circuits | Àrees temàtiques de la UPC | Enginyeria electrònica
Conference Proceeding
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