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Journal Article
Journal of Applied Physics, ISSN 0021-8979, 09/2016, Volume 120, Issue 12, p. 125703
...Recombination activity of light-activated copper defects in p-type silicon studied by injection- and temperature-dependent lifetime spectroscopy Alessandro... 
INTERSTITIAL COPPER | MINORITY-CARRIERS | STATES | PHYSICS, APPLIED | INDUCED DEGRADATION | DIFFUSION LENGTH | Usage | Optical properties | Copper compounds | Silicon | Semiconductor wafers | Research | Structure | Mass spectrometry | Electric properties
Journal Article
AIP advances, ISSN 2158-3226, 2018, Volume 8, Issue 1, pp. 015112 - 015112-7
The presence of copper (Cu) contamination is known to cause relevant light-induced degradation (Cu-LID) effects in p-type silicon. Due to its high diffusivity,... 
RECOMBINATION | VOLTAGE | IMPACT | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | NANOSCIENCE & NANOTECHNOLOGY | COPPER | DIFFUSION | MULTICRYSTALLINE SILICON | Photodegradation | Cooling | Impurities | Phosphorus | Silicon | Emitters | Copper | Gettering
Journal Article
Brain Imaging and Behavior, ISSN 1931-7557, 2/2019, Volume 13, Issue 1, pp. 200 - 209
... · Kristina Simonyan1,2 · Maria Petracca1,3 · Miroslaw Brys4 · Alessandro Di Rocco4 · Maria Felice Ghilardi5 · Matilde Inglese1,6,7,8 © Springer Science+Business Media... 
Functional connectivity | Neurosciences | Biomedicine | Cognition | Graph theory | Neuropsychology | Psychiatry | Neuroradiology | Parkinson’s disease | DIAGNOSIS | Parkinson's disease | RESTING-STATE | DEFAULT-MODE NETWORK | NEUROIMAGING | IMPAIRMENT | LEVODOPA | GRAPH-THEORETICAL ANALYSIS | MOTOR | DYSFUNCTION | Brain - diagnostic imaging | Neural Pathways - drug effects | Parkinson Disease - diagnostic imaging | Prospective Studies | Brain - physiopathology | Humans | Middle Aged | Magnetic Resonance Imaging - methods | Male | Parkinson Disease - drug therapy | Brain Mapping - methods | Cognition - drug effects | Cognitive Dysfunction - etiology | Cognitive Dysfunction - physiopathology | Parkinson Disease - physiopathology | Parkinson Disease - psychology | Antiparkinson Agents - therapeutic use | Brain - drug effects | Rest | Neural Pathways - diagnostic imaging | Cognition - physiology | Female | Neural Pathways - physiopathology | Cognitive Dysfunction - diagnostic imaging | Care and treatment | Cognition disorders | Research | Brain | Correlation | Executive function | Cognitive ability | Visual pathways | Motors | Theoretical analysis | Motor task performance | Efficiency | Network topologies | Functional magnetic resonance imaging | Levodopa | Hubs | Movement disorders | Dopamine receptors | Brain architecture | Dopamine | Neurodegenerative diseases | Medical treatment | Data processing | Topology | Clustering | Patients | Functional morphology | Neural networks | Information processing | Sensorimotor integration | Connectivity | Graph matching
Journal Article
physica status solidi c, ISSN 1862-6351, 07/2017, Volume 14, Issue 7, p. n/a
The presence of copper contamination is known to severely degrade the minority carrier lifetime of p‐type silicon upon exposure to illumination. In this... 
Cu‐LID | copper impurities | silicon | defect characterization | metal precipitates | Cu-LID | Precipitation | Transition metals | Carrier lifetime | Beryllium | Illumination | Silicon | Iron | Nickel | Copper | Precipitates | Contamination | Defects
Journal Article
Applied Physics Letters, ISSN 0003-6951, 08/2015, Volume 107, Issue 5, p. 52101
Copper is a harmful metal impurity that significantly impacts the performance of silicon-based devices if present in active regions. In this contribution, we... 
TRANSFORMATION | PHYSICS, APPLIED | DEFECT REACTIONS | CRYSTALLINE SILICON | OXYGEN | BORON | ANNEALING | MAPS | CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS | PERFORMANCE | SILICON | COPPER | CARRIER LIFETIME | IMPURITIES | SPATIAL DISTRIBUTION | VISIBLE RADIATION
Journal Article
Energy Procedia, ISSN 1876-6102, 08/2016, Volume 92, pp. 808 - 814
In this contribution, we provide an insight into the light-induced degradation of multicrystalline (mc-) silicon caused by copper contamination. Particularly... 
multicrystalline silicon | Light-induced degradation | copper metal impurities
Journal Article
Applied physics letters, ISSN 0003-6951, 08/2015, Volume 107, Issue 5
Copper is a harmful metal impurity that significantly impacts the performance of silicon-based devices if present in active regions. In this contribution, we... 
Photodegradation | Boron | Spatial distribution | Defect annealing | Carrier lifetime | Light | Silicon | Minority carriers | Copper | Contamination
Journal Article
Energy Procedia, ISSN 1876-6102, 09/2017, Volume 124, pp. 188 - 196
Copper is a common impurity in photovoltaic silicon. While reported to precipitate instantly in n-type Si, copper causes light-induced degradation (Cu-LID) in... 
precipitate | Cu | silicon | recovery | LID
Journal Article
Frontiers in medicine, ISSN 2296-858X, 2017, Volume 4, p. 203
...Author(s): Giulia A. M. Dolci, Sarah Damanti, Valeria Scortichini, Alessandro Galli, Paolo D. Rossi, Carlo Abbate, Beatrice Arosio, Daniela Mari, Andrea Arighi... 
Neuroimaging | Usage | Spine | Analysis | Diagnosis | Puncture | Alzheimer's disease | Risk factors | cerebrovascular disease | aging | neuropsychological tests | Alzheimer | clinical criteria | biomarkers
Journal Article
Journal Article
Energy Procedia, ISSN 1876-6102, 2013, Volume 38, pp. 531 - 535
This study aims at the reduction of light-induced degradation of boron-doped solar-grade Czochralski silicon wafers by corona charging. The method consists of... 
Light-Induced Degradation | Solar-grade | Cz-Si | Corona Charging | Copper
Journal Article
Journal Article
Journal Article
Human brain mapping, ISSN 1065-9471, 05/2020
Graph theory and network modelling have been previously applied to characterize motor network structural topology in multiple sclerosis (MS). However,... 
Journal Article
Journal of applied physics, ISSN 0021-8979, 09/2016, Volume 120, Issue 12
The presence of copper contamination is known to cause strong light-induced degradation (Cu-LID) in silicon. In this paper, we parametrize the recombination... 
Photodegradation | Temperature dependence | Silicon wafers | Energy levels | Spectrum analysis | Carrier lifetime | Silicon | Copper | Absorption cross sections | Precipitates | Defects
Journal Article
Journal of Urology, The, ISSN 0022-5347, 2010, Volume 183, Issue 4, pp. e157 - e157
Journal Article