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holographic interferometry (8) 8
industrial applications (8) 8
optical detectors (6) 6
holography (5) 5
congresses (4) 4
digital holography (4) 4
digitale holographie (4) 4
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lasers (4) 4
optical instruments (4) 4
optical methods (4) 4
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conferences (3) 3
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optics (3) 3
aspherical micro-optics (2) 2
data processing (2) 2
digital techniques (2) 2
engineering inspection (2) 2
hertzian waves (2) 2
high numerical aperture (2) 2
holographische interferometrie (2) 2
image processing and computer vision (2) 2
interferometry (2) 2
laser interferometry (2) 2
light amplification by stimulated emission of radiation (2) 2
masers, optical (2) 2
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microwaves, rf and optical engineering (2) 2
new optics (2) 2
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optical masers (2) 2
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optics, optoelectronics, plasmonics and optical devices (2) 2
optoelectronics (2) 2
photonics (2) 2
pictorial data processing (2) 2
picture processing (2) 2
plasmons (2) 2
processing, image (2) 2
processing, signal (2) 2
signal processing (2) 2
signal, image and speech processing (2) 2
speckle interferometry (2) 2
speech processing systems (2) 2
technology & engineering / mechanical (2) 2
visual data processing (2) 2
3-d shape measurement (1) 1
absolute phase measurement (1) 1
aperture synthesis (1) 1
ccd (1) 1
coherent mask (1) 1
computers in experimental physics (1) 1
depth scanning (1) 1
digital comparative holography (1) 1
digitalaufzeichnung (1) 1
digitale bildrekonstruktion (1) 1
digitale darstellung (1) 1
engineering, multidisciplinary (1) 1
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finite element method (1) 1
formmessung (1) 1
fringe projection (1) 1
fundamental areas of phenomenology (1) 1
general (1) 1
holographic interferometry; other holographic techniques (1) 1
holographie (1) 1
holographische bildrekonstruktion (1) 1
imaging techniques (1) 1
industrial design (1) 1
industries (1) 1
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instruments, apparatus, components and techniques common to several branches of physics and astronomy (1) 1
intensitätsmodulation (1) 1
interference pattern (1) 1
inverse projection (1) 1
laserinterferometrie (1) 1
lichtmodulator (1) 1
maske (1) 1
materials (1) 1
measurement (1) 1
measuring (1) 1
measuring instruments (1) 1
mensuration (1) 1
messtechnik (1) 1
miniaturization (1) 1
moire interferometry (1) 1
morphology (1) 1
morphometrie (1) 1
multiple wavelength technique (1) 1
nondestructive testing (1) 1
nondestructive tests (1) 1
oberflächenbeschaffenheit (1) 1
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Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2002, Volume 4777, pp. 69 - 76
Conference Proceeding
Conference Proceeding
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2002, Volume 4778, pp. 188 - 197
Conference Proceeding
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2001, Volume 4451, pp. 345 - 355
Conference Proceeding
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2002, Volume 4778, pp. 338 - 349
Conference Proceeding
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