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investigating or analysing materials by determining theirchemical or physical properties (2) 2
measuring (2) 2
physics (2) 2
testing (2) 2
copper (1) 1
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02/2013
The invention aims - to prepare the semiconductor bolster substrate, cover it appropriate passivation layer and in said passivation layer to form in fixed... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
12/2012
The invention aims - to prepare the semiconductor bolster substrate, cover it appropriate passivation layer and in said passivation layer to form in fixed... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
AIP Conference Proceedings, ISSN 0094-243X, 2012, Volume 1477, pp. 53 - 56
Conference Proceeding
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