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basic electric elements (4) 4
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Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2015, Volume 9346
Conference Proceeding
02/2013
The invention aims - to prepare the semiconductor bolster substrate, cover it appropriate passivation layer and in said passivation layer to form in fixed... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
12/2012
The invention aims - to prepare the semiconductor bolster substrate, cover it appropriate passivation layer and in said passivation layer to form in fixed... 
TESTING | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES | MEASURING | PHYSICS
Patent
AIP Conference Proceedings, ISSN 0094-243X, 2012, Volume 1477, pp. 53 - 56
Conference Proceeding
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2008, Volume 7005
Conference Proceeding
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