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Journal of Electronic Testing, ISSN 0923-8174, 10/2013, Volume 29, Issue 5, pp. 625 - 634
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 6/2010, Volume 26, Issue 3, pp. 393 - 400
Journal Article
Formosan Journal of Surgery, ISSN 1682-606X, 12/2015, Volume 48, Issue 6, pp. 226 - 229
Tuberculum sellae meningioma is a common intracranial tumor. However, its coexistence with an intratumoral aneurysm is rare. Here, we present the case of a... 
meningioma | aneurysm | coexistence | Meningioma | Aneurysm | Coexistence
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 04/2012, Volume 31, Issue 4, pp. 644 - 648
Journal Article
Journal of the Chinese Institute of Engineers, ISSN 0253-3839, 03/2010, Volume 33, Issue 2, pp. 263 - 270
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. A simulation_based test vector ordering approach to... 
scan design | transition density | test vector ordering | switching activity | Transition density | Test vector ordering | Switching activity | Scan design | ENGINEERING, MULTIDISCIPLINARY
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 04/2012, Volume 31, Issue 4, pp. 644 - 648
This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2 | n | runs of compatible or... 
Multiplexing | Test data compression | pattern run-length | Encoding | Automated test equipment (ATE) | Decoding | System-on-a-chip | Synchronization | circuit under test (CUT) | Clocks | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS | test data compression | POWER | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
ETRI Journal, ISSN 1225-6463, 06/2011, Volume 33, Issue 3, pp. 374 - 381
Journal Article
2012 13th International Workshop on Microprocessor Test and Verification (MTV), ISSN 1550-4093, 12/2012, pp. 24 - 29
The excessive power consumption during testing has been a critical issue for scan-based designs. It gets even worst in the capture mode. This method combines... 
deterministic ATPG | low capture power | testing
Conference Proceeding
2012 13th International Workshop on Microprocessor Test and Verification (MTV), ISSN 1550-4093, 12/2012, pp. 30 - 34
Large test data volume and excessive test power are two strict challenges for VLSI testing. This paper presents a BIST scheme adopting dual-LFSR reseeding... 
low power | LFSR | compression | BIST
Conference Proceeding
2012 13th International Workshop on Microprocessor Test and Verification (MTV), ISSN 1550-4093, 12/2012, pp. 60 - 64
This paper presents a two-way multicasting scan (TMS) architecture for test data compression. TMS records the difference address between neighboring broadcasts... 
compression | multicasting | scan-chain
Conference Proceeding
Journal of the Chinese Institute of Engineers, ISSN 0253-3839, 09/2009, Volume 32, Issue 6, pp. 853 - 860
In Dilated Optical Multistage Interconnection Networks constructed by 2 x 2 photonic switches, each input-to-output connection can be established along one... 
Journal Article
2010 International Computer Symposium (ICS2010), 12/2010, pp. 562 - 567
This paper presents a pattern run-length compression method. Compression is conducted by encoding 2 |n| runs of compatible or inversely compatible patterns... 
Multiplexing | Test data compression | pattern run-length | automated test equipment (ATE) | Benchmark testing | Encoding | Decoding | System-on-a-chip | circuit under test (CUT) | Pattern run-length | Automated test equipment (ATE) | Circuit under test (CUT)
Conference Proceeding
2016 IEEE International Conference on Consumer Electronics (ICCE), 01/2016, pp. 202 - 203
This paper proposes a new wearable eye-gaze tracking system with a single webcam mounted on the glasses. First, the region of interest (ROI) of eye is... 
Webcams | Conferences | Estimation | Gaze tracking | Retina | Robustness | Skin | Algorithms | Eyes | Searching | Lighting | Tracking systems | Electronics | Illumination | Wearable
Conference Proceeding
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 04/2012, Volume 31, Issue 4, p. 644
Journal Article
2010 International Computer Symposium (ICS2010), 12/2010, pp. 557 - 561
This paper presents a cascaded broadcast scheme for test data compression. The basic idea is to conduct a different number of broadcasts in a cumulative way to... 
Test data compression | pattern run-length | automated test equipment (ATE) | Computer architecture | Broadcasting | Hardware | Encoding | System-on-a-chip | circuit under test (CUT) | Testing | Pattern run-length | Automated test equipment (ATE) | Circuit under test (CUT)
Conference Proceeding
2009 Asian Test Symposium, ISSN 1081-7735, 11/2009, pp. 325 - 330
This paper presents a run-length-based compression method considering dimensions of pattern information. Information such as pattern length and number of... 
Test data compression | Costs | pattern run-length | SOC | Encoding | Decoding | Circuit faults | Circuit testing | ATE | Integrated circuit testing | Intellectual property | Hardware | code-based testing | Huffman coding | Code-based testing | Pattern run-length
Conference Proceeding
2007 Eighth International Workshop on Microprocessor Test and Verification, ISSN 1550-4093, 12/2007, pp. 15 - 21
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to... 
scan cell transition count | Power demand | Computational modeling | test vector ordering | Switches | impact function | Logic gates | Sequential circuits | Integrated circuit modeling | test power reduction | Switching circuits
Conference Proceeding
Journal of the Chinese Institute of Engineers, ISSN 0253-3839, 09/2009, Volume 32, Issue 6, pp. 853 - 860
In Dilated Optical Multistage Interconnection Networks constructed by 2 ×2 photonic switches, each input-to-output connection can be established along one path... 
connections-scheduling | clique partitioning problem | DOMINs | faulty switch | Connections-scheduling | Clique partitioning problem | Domins | Faulty switch | MULTISTAGE INTERCONNECTION NETWORKS | ENGINEERING, MULTIDISCIPLINARY | DIAGNOSING CROSSTALK FAULTS
Journal Article
2009 Asian Test Symposium, ISSN 1081-7735, 11/2009, pp. 111 - 116
Large test data volume and excessive testing power are two strict challenges for VLSI testing. This paper presents a deterministic BIST using multiple LFSRs to... 
low-power testing | System testing | Costs | minimum transition fill | test data compression | Built-in self-test | Circuit faults | Circuit testing | Linear feedback shift registers | Automatic testing | Integrated circuit testing | BIST | multiple LFSRs | Hardware | Power generation | Minimum transition fill | Test data compression | Multiple LFSRs | Low-power testing
Conference Proceeding
ETRI Journal, ISSN 1225-6463, 06/2011, Volume 33, Issue 3, pp. 374 - 381
A simple and effective compression method is proposed for multiple-scan testing. For a given test set, each test pattern is compressed from the view of slices.... 
Journal Article
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