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Journal of Electronic Testing, ISSN 0923-8174, 10/2013, Volume 29, Issue 5, pp. 625 - 634
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 04/2012, Volume 31, Issue 4, pp. 644 - 648
Journal Article
Journal of Electronic Testing, ISSN 0923-8174, 6/2010, Volume 26, Issue 3, pp. 393 - 400
Journal Article
ETRI Journal, ISSN 1225-6463, 06/2011, Volume 33, Issue 3, pp. 374 - 381
Journal Article
Formosan Journal of Surgery, ISSN 1682-606X, 12/2015, Volume 48, Issue 6, pp. 226 - 229
Tuberculum sellae meningioma is a common intracranial tumor. However, its coexistence with an intratumoral aneurysm is rare. Here, we present the case of a... 
meningioma | aneurysm | coexistence | Meningioma | Aneurysm | Coexistence
Journal Article
2009 Asian Test Symposium, ISSN 1081-7735, 11/2009, pp. 325 - 330
This paper presents a run-length-based compression method considering dimensions of pattern information. Information such as pattern length and number of... 
Test data compression | Costs | pattern run-length | SOC | Encoding | Decoding | Circuit faults | Circuit testing | ATE | Integrated circuit testing | Intellectual property | Hardware | code-based testing | Huffman coding | Code-based testing | Pattern run-length
Conference Proceeding
Journal of the Chinese Institute of Engineers, ISSN 0253-3839, 03/2010, Volume 33, Issue 2, pp. 263 - 270
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. A simulation_based test vector ordering approach to... 
scan design | transition density | test vector ordering | switching activity | Transition density | Test vector ordering | Switching activity | Scan design | ENGINEERING, MULTIDISCIPLINARY
Journal Article
Journal of the Chinese Institute of Engineers, ISSN 0253-3839, 09/2009, Volume 32, Issue 6, pp. 853 - 860
In Dilated Optical Multistage Interconnection Networks constructed by 2 ×2 photonic switches, each input-to-output connection can be established along one path... 
connections-scheduling | clique partitioning problem | DOMINs | faulty switch | Connections-scheduling | Clique partitioning problem | Domins | Faulty switch | MULTISTAGE INTERCONNECTION NETWORKS | ENGINEERING, MULTIDISCIPLINARY | DIAGNOSING CROSSTALK FAULTS
Journal Article
Journal of the Chinese Institute of Engineers, ISSN 0253-3839, 02/2015, Volume 38, Issue 2, pp. 169 - 180
This paper presents a hybrid compression method for scan-based testing. Four distinctive compression techniques, i.e. frequency-directed run-length codes... 
OSHC | test data compression | FDR | SOC | ENGINEERING, MULTIDISCIPLINARY | DECOMPRESSION | POWER
Journal Article
Journal of Applied Animal Welfare Science, ISSN 1088-8705, 10/2012, Volume 15, Issue 4, pp. 346 - 357
Trends in the number of dogs entering and departing Taiwan public shelters are analyzed in this article. There were 40 public shelters surveyed from 2000 to... 
ADOPTION | VETERINARY SCIENCES | Animal Welfare - organization & administration | Animals | Animal Welfare - trends | Dogs | Taiwan | Euthanasia, Animal - statistics & numerical data | Animal Welfare - statistics & numerical data
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 04/2012, Volume 31, Issue 4, pp. 644 - 648
This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2 | n | runs of compatible or... 
Multiplexing | Test data compression | pattern run-length | Encoding | Automated test equipment (ATE) | Decoding | System-on-a-chip | Synchronization | circuit under test (CUT) | Clocks | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS | test data compression | POWER | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 04/2012, Volume 31, Issue 4, p. 644
Journal Article
2009 Asian Test Symposium, ISSN 1081-7735, 11/2009, pp. 111 - 116
Large test data volume and excessive testing power are two strict challenges for VLSI testing. This paper presents a deterministic BIST using multiple LFSRs to... 
low-power testing | System testing | Costs | minimum transition fill | test data compression | Built-in self-test | Circuit faults | Circuit testing | Linear feedback shift registers | Automatic testing | Integrated circuit testing | BIST | multiple LFSRs | Hardware | Power generation | Minimum transition fill | Test data compression | Multiple LFSRs | Low-power testing
Conference Proceeding
Journal of the Chinese Institute of Engineers, ISSN 0253-3839, 09/2009, Volume 32, Issue 6, pp. 853 - 860
In Dilated Optical Multistage Interconnection Networks constructed by 2 x 2 photonic switches, each input-to-output connection can be established along one... 
Journal Article
ETRI Journal, ISSN 1225-6463, 06/2011, Volume 33, Issue 3, pp. 374 - 381
A simple and effective compression method is proposed for multiple-scan testing. For a given test set, each test pattern is compressed from the view of slices.... 
Journal Article
Journal of the Chinese Institute of Engineers, ISSN 0253-3839, 09/2012, Volume 35, Issue 6, pp. 687 - 696
This article presents a method for test data compression aiming at simultaneously reducing test data volume and test application time for the scan sequential... 
test time reduction | scan chain disabling | compatibility | test data volume reduction | Compatibility | Scan chain disabling | Test data volume reduction | Test time reduction | TEST-DATA-COMPRESSION | COMPACT | ENGINEERING, MULTIDISCIPLINARY | POWER
Journal Article
Journal of the Chinese Institute of Engineers, ISSN 0253-3839, 12/2011, Volume 34, Issue 8, pp. 1035 - 1045
Test data volume is a major problem encountered in System-On-Chip testing. One solution to this problem is to use compression techniques to reduce the test... 
test data compression | test vector reordering | Hamiltonian path | Test data compression | Test vector reordering | POWER | ENGINEERING, MULTIDISCIPLINARY
Journal Article
IEICE Transactions on Electronics, ISSN 0916-8524, 2008, Volume E91-C, Issue 5, pp. 798 - 805
In this paper, we present a multiple capture approach to reducing the peak power as well as average power consumption during testing. The basic idea behind is... 
Multiple capture technique | Pattern insertion | Test pattern reordering | Capture violation problem | CIRCUITS | pattern insertion | capture violation problem | test pattern reordering | multiple capture technique | ENGINEERING, ELECTRICAL & ELECTRONIC | Power consumption | Circuits | Testing time | Electronics | Insertion | Benchmarking | Chains | Time measurements
Journal Article
2016 IEEE International Conference on Consumer Electronics (ICCE), 01/2016, pp. 202 - 203
This paper proposes a new wearable eye-gaze tracking system with a single webcam mounted on the glasses. First, the region of interest (ROI) of eye is... 
Webcams | Conferences | Estimation | Gaze tracking | Retina | Robustness | Skin | Algorithms | Eyes | Searching | Lighting | Tracking systems | Electronics | Illumination | Wearable
Conference Proceeding
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