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Physica B: Physics of Condensed Matter, ISSN 0921-4526, 12/2009, Volume 404, Issue 23-24, pp. 4886 - 4888
The core structure of threading dislocations in AlN films was investigated by atomic-resolution scanning transmission electron microscopy. The threading... 
HAADF-STEM | AlN | Dislocations | 0001 SAPPHIRE | PHYSICS, CONDENSED MATTER | GAN FILMS | ELECTRON-MICROSCOPY | DIODES | GROWTH DEFECTS | EDGE | Thin films | Aluminum compounds | Dielectric films
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