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Electrochimica Acta, ISSN 0013-4686, 05/2016, Volume 199, pp. 394 - 402
The incorporation of plating additives into Cu films was studied by means of complementary Laser Ablation/Ionization Mass Spectrometry (LIMS) and Secondary Ion... 
additives | Electroplating | Damascene process | chemical depth profiling | laser ablation/ionization mass spectrometry (LIMS) | Electrochemistry | Electrochemical reactions | Analysis | Grain boundaries | LIMS | POLYMERS | Additives | Deposits | BOUNDARIES | Contaminants | ELECTRODES | Secondary ion mass spectrometry | ELECTRODEPOSITION | Depth profiling | Ion beams
Journal Article
Analytical Chemistry, ISSN 0003-2700, 02/2015, Volume 87, Issue 4, pp. 2037 - 2041
High-resolution chemical depth profiling measurements of copper films are presented. The 10 μm thick copper test samples were electrodeposited on a... 
CHEMISTRY, ANALYTICAL | COPPER INTERCONNECT METALLIZATION | SURFACE | ABLATION | SUPPRESSOR ADDITIVES | MODEL | ELECTRODEPOSITION | IONIZATION | Plating | Usage | Chemical properties | Inductively coupled plasma mass spectrometry | Research | Copper
Journal Article
Chemistry – A European Journal, ISSN 0947-6539, 04/2014, Volume 20, Issue 16, pp. 4653 - 4660
The synthesis and characterisation is described of six diaryltetrayne derivatives [Ar‐(CC)4‐Ar] with Ar=4‐NO2‐C6H4‐ (NO24), 4‐NH(Me)C6H4‐ (NHMe4), 4‐NMe2C6H4‐... 
X‐ray diffraction | polyynes | cross‐coupling | single‐molecule conductance | oligoynes | cross-coupling | X-ray diffraction | single-molecule conductance | CONDUCTANCE | WIRES | COMPLEXES | CHEMISTRY, MULTIDISCIPLINARY | LENGTH DEPENDENCE | SP CARBON CHAINS | ANCHORING GROUPS | CHROMOPHORES | RESISTANCE | CHARGE-TRANSFER | Backbone | Anchors | Electrodes | Synthesis | Molecular structure | Breaking | Decomposition | Derivatives
Journal Article
Journal of the American Chemical Society, ISSN 0002-7863, 08/2013, Volume 135, Issue 33, pp. 12228 - 12240
We report a combined experimental and theoretical investigation of the length dependence and anchor group dependence of the electrical conductance of a series... 
WIRES | ATOMIC-FORCE MICROSCOPY | CARBON | ANCHORING GROUPS | CHARGE-TRANSPORT | RESISTANCE | MODEL | CHEMISTRY, MULTIDISCIPLINARY | ELECTRICAL CONDUCTANCE | Usage | Chemical reaction, Rate of | Analysis | Innovations | P-N junctions | Research | Light-emitting diodes | Semiconductor doping | Methods
Journal Article
Journal of the American Chemical Society, ISSN 0002-7863, 03/2012, Volume 134, Issue 11, pp. 5262 - 5275
The charge transport characteristics of 11 tailor-made dithiol-terminated oligo(phenylene-ethynylene) (OPE)-type molecules attached to two gold electrodes were... 
CONTACT | ATOMIC-FORCE MICROSCOPY | SELF-ASSEMBLED MONOLAYERS | ANCHORING GROUPS | CHARGE-TRANSPORT | RESISTANCE | LEVEL | ELECTRONIC JUNCTIONS | LENGTH DEPENDENCE | ELECTRICAL CONDUCTANCE | ALIGNMENT | CHEMISTRY, MULTIDISCIPLINARY | Measurement | Oligomers | Electrical conductivity | Molecular structure | Analysis | Charge transfer | Structure | Electric properties
Journal Article
Journal of the American Chemical Society, ISSN 0002-7863, 02/2015, Volume 137, Issue 6, pp. 2318 - 2327
Single molecule charge transport characteristics of buckminsterfullerene-capped symmetric fluorene-based dumbbell-type compound 1 were investigated by scanning... 
Journal Article
Journal of the American Chemical Society, ISSN 0002-7863, 12/2014, Volume 136, Issue 52, pp. 17922 - 17925
Controlling charge transport through a single molecule connected to metallic electrodes remains one of the most fundamental challenges of nanoelectronics. Here... 
Chemical properties | Redox potential | Anthraquinones | Analysis | Electric properties
Journal Article
Analytical Chemistry, ISSN 0003-2700, 02/2017, Volume 89, Issue 3, pp. 1632 - 1641
Femtosecond laser ablation/ionization mass spectrometry (LIMS) has been applied to probe the spatial element composition of three ternary Cu–Sn–Pb model bronze... 
DEPTH-PROFILE ANALYSIS | SPACE RESEARCH | CHEMISTRY, ANALYTICAL | BRONZE | POTENTIAL OSCILLATIONS | ELEMENTAL ANALYSIS | RESOLUTION | ABLATION | SIMS | ELECTRODEPOSITION | IONIZATION
Journal Article
Geostandards and Geoanalytical Research, ISSN 1639-4488, 12/2014, Volume 38, Issue 4, pp. 441 - 466
Journal Article
Analytical Chemistry, ISSN 0003-2700, 06/2018, Volume 90, Issue 11, pp. 6666 - 6674
State-of-the-art three-dimensional very large-scale integration (3D-VLSI) relies, among other factors, on the purity of high-aspect-ratio Cu interconnects such... 
CHEMISTRY, ANALYTICAL | FLIGHT MASS-SPECTROMETER | ASPECT-RATIO | FRACTIONATION | ELECTRODEPOSITION | GROWTH | Copper compounds | Usage | Chemical properties | Mass spectrometry | Ablation (Vaporization technology)
Journal Article
Journal Article
Physical Chemistry Chemical Physics, ISSN 1463-9076, 10/2014, Volume 16, Issue 43, pp. 23529 - 23539
The understanding of the charge transport through single molecule junctions is a prerequisite for the design and building of electronic circuits based on... 
Design engineering | Gold | Construction | Breaking | Alkanes | Formations | Conductance | Anchoring
Journal Article
Physical Chemistry Chemical Physics, ISSN 1463-9076, 10/2014, Volume 16, Issue 43, pp. 23529 - 23539
The understanding of the charge transport through single molecule junctions is a prerequisite for the design and building of electronic circuits based on... 
LENGTH-DEPENDENT CONDUCTANCE | JUNCTION CONDUCTANCE | ATOMIC-FORCE MICROSCOPY | ETHYNYLENE)S | PHYSICS, ATOMIC, MOLECULAR & CHEMICAL | CHARGE-TRANSPORT | RESISTANCE | CHEMISTRY, PHYSICAL | METAL | ELECTRONIC JUNCTIONS | QUANTUM INTERFERENCE | ELECTRICAL CONDUCTANCE
Journal Article
Analytical Chemistry, ISSN 0003-2700, 02/2018, Volume 90, Issue 4, pp. 2692 - 2700
State-of-the-art laser ablation (LA) depth-profiling techniques (e.g. LA-ICP-MS, LIBS, and LIMS) allow for chemical composition analysis of solid materials... 
SIGNAL | GLASS | CHEMISTRY, ANALYTICAL | FRACTIONATION | PLASMA-MASS SPECTROMETRY | RESOLUTION | GROWTH | INDUCED BREAKDOWN SPECTROSCOPY | ICP-MS | LIBS | Usage | Silicon | Structure | Ablation (Vaporization technology) | Electric properties
Journal Article
Analytical Chemistry, ISSN 0003-2700, 04/2018, Volume 90, Issue 8, pp. 5179 - 5186
Through-silicon-via (TSV) technology enables 3D integration of multiple 2D components in advanced microchip architectures. Key in the TSV fabrication is an... 
CHEMISTRY, ANALYTICAL | COPPER ELECTRODEPOSITION | FRACTIONATION | Silicon compounds | Usage | Chemistry, Analytic | Ablation (Vaporization technology) | Chemical properties | Research | Mass spectrometry
Journal Article
Nanoscale, ISSN 2040-3364, 12/2014, Volume 6, Issue 24, pp. 15117 - 15126
Single gold particles may serve as room temperature single electron memory units because of their size dependent electronic level spacing. Here, we present a... 
Journal Article