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Scientific Reports, ISSN 2045-2322, 08/2015, Volume 5, Issue 1, p. 12882
Atomic-sized fluorescent defects in diamond are widely recognized as a promising solid state platform for quantum cryptography and quantum information... 
PHOTON EMISSION | DEFECTS | MULTIDISCIPLINARY SCIENCES | Temperature effects | Color | Luminescence | Information processing | Photons | Cryptography | Quantum theory | Crystal structure
Journal Article
The Journal of Medical Investigation, ISSN 1343-1420, 2016, Volume 63, Issue 3.4, pp. 171 - 174
Purpose: Our aim was to examine the outcome of an elbow check-up system for youth baseball players. In particular, we investigated the nature of elbow injuries... 
Baseball | Childhood and adolescent | Elbow check-up
Journal Article
Materials Science Forum, ISSN 0255-5476, 02/2014, Volume 778-780, pp. 685 - 688
Because Al and B (elements of III group) in SiC are deep-level acceptors and these acceptors cannot reduce the resistivity of p-type SiC very much, Mg (element... 
Distribution function for deep-level acceptor | Mg acceptor | Mg acceptor level | Mg implantation | Mg-implanted 4H-SiC | Occupation | Annealing | Energy levels | Silicon carbide | Electrical properties | Magnesium | Density | Distribution functions
Journal Article
The Journal of Medical Investigation, ISSN 1343-1420, 2016, Volume 63, Issue 1.2, pp. 131 - 134
Os acromiale is a rare anatomical variant that is caused by failure of fusion of the acromial apophysis and is usually asymptomatic. We report a case of... 
arthroscopic excision | impingement | shoulder | os acromiale | Arthroscopic excision | Os acromiale | Impingement | Shoulder
Journal Article
Materials Science Forum, ISSN 0255-5476, 05/2016, Volume 858, pp. 544 - 548
The warpage structure of 4°-off-axis (0001) 4H-SiC samples after implantation and annealing processes was investigated using white light interferometry (WLI)... 
Implantation and annealing | Silicon carbide | Warpage structure | Annealing | Energy use | White light interferometry | Mathematical analysis | X-rays | Warpage | Implantation
Journal Article
Japanese Journal of Applied Physics, ISSN 0021-4922, 01/2015, Volume 54, Issue 1, pp. 011301 - 1-011301-7
Reliably determining the densities and energy levels of deep-level dominant acceptors in heavily doped wide-band-gap semiconductors has been a topic of recent... 
CARRIER CONCENTRATION | PHYSICS, APPLIED | EPILAYERS | TEMPERATURE | MOBILITY | DONOR | HALL SCATTERING FACTOR | DEPENDENCE | Energy levels | Semiconductors | Electrical properties | Scattering | Hall effect | Impact tests | Magnesium | Density | Distribution functions
Journal Article
Materials Science Forum, ISSN 0255-5476, 02/2014, Volume 778-780, pp. 449 - 452
We examined the warpage structure in epitaxial 4H-SiC wafers subjected to phosphorus-ion (P+) implantation and post-annealing with varying implantation and... 
Raman spectroscopy | X-ray topography | Warpage structure
Journal Article
Semiconductor Science and Technology, ISSN 0268-1242, 02/2011, Volume 26, Issue 2, p. 025009
We have studied the structural change of defects caused by annealing Al-implanted SiC crystals at 1600 degrees C using channeling Rutherford backscattering... 
PHYSICS, CONDENSED MATTER | CARBIDE | MATERIALS SCIENCE, MULTIDISCIPLINARY | ION-IMPLANTATION | GROWTH | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Applied Physics Express, ISSN 1882-0778, 03/2008, Volume 1, Issue 3, pp. 0340011 - 0340013
A nano-size and position controlling technique of silicon-nanocrystal (Si-NC) assemblies in a SiO2 thin film has been investigated by using low-energy ion... 
PHYSICS, APPLIED
Journal Article
The journal of medical investigation : JMI, 2016, Volume 63, Issue 3-4, p. 171
Our aim was to examine the outcome of an elbow check-up system for youth baseball players. In particular, we investigated the nature of elbow injuries in youth... 
Baseball | Humans | Athletic Injuries - diagnosis | Ultrasonography | Elbow - diagnostic imaging | Physical Examination | Child | Osteochondritis Dissecans - diagnosis | Elbow - injuries | Pain - diagnosis
Journal Article
Patent
Japanese Journal of Applied Physics, ISSN 0021-4922, 10/2017, Volume 56, Issue 10, p. 106601
We performed X-ray topography using the asymmetric 1128 back-reflection by changing the incident X-ray energy (E) in order to evaluate the observable depth (t... 
X ray reflection | X rays | Topography | Linearity | Basal plane | X ray topography | Visibility | Dislocations
Journal Article
Japanese Journal of Applied Physics, ISSN 0021-4922, 10/2017, Volume 56, Issue 10, p. 106601
We performed X-ray topography using the asymmetric 1128 back-reflection by changing the incident X-ray energy (E) in order to evaluate the observable depth... 
CRYSTALS | PHYSICS, APPLIED | EPITAXIAL LAYER | GROWTH
Journal Article
IEEE Transactions on Magnetics, ISSN 0018-9464, 07/2013, Volume 49, Issue 7, pp. 3604 - 3607
Journal Article
Nuclear Inst. and Methods in Physics Research, A, ISSN 0168-9002, 11/2013, Volume 729, pp. 537 - 540
The penetration depth of x-rays into a crystal is one of the most important parameters in grazing incidence x-ray topography. In this paper, we introduce a... 
Optics | X-ray | Topography | Synchrotron radiation | BRAGG-CASE DIFFRACTION | RETARDERS | INSTRUMENTS & INSTRUMENTATION | SPECTROSCOPY | NUCLEAR SCIENCE & TECHNOLOGY | CRYSTAL | PHYSICS, PARTICLES & FIELDS | Epitaxy | X-rays | Polarization | Wavelengths | Accelerators | Grazing incidence | Phase plates | X-ray topography | Penetration depth
Journal Article
Materials Science Forum, ISSN 0255-5476, 02/2014, Volume 778-780, pp. 449 - 452
We examined the warpage structure in epitaxial 4H-SiC wafers subjected to phosphorus-ion (P super(+)) implantation and post-annealing with varying implantation... 
Synchrotrons | Wafers | Lattices | Disorders | Warpage | Implantation | Recovery | X-ray topography
Journal Article
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