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Scientific Reports, 12/2019, Volume 9, Issue 1, pp. 2029 - 9
In this report, we analyse X-ray induced damage of B C-coated bilayer materials under various irradiation geometries, following the conditions of our... 
Journal Article
Nature Communications, ISSN 2041-1723, 2012, Volume 3, Issue 1, p. 635
A topological insulator is a state of quantum matter that, while being an insulator in the bulk, hosts topologically protected electronic states at the... 
TRANSITION | SURFACE | PLANE-WAVE METHOD | SINGLE DIRAC CONE | MULTIDISCIPLINARY SCIENCES
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2017, Volume 10237, pp. ix - x
Conference Proceeding
SCIENTIFIC REPORTS, ISSN 2045-2322, 02/2019, Volume 9, Issue 1
In this report, we analyse X-ray induced damage of B4C-coated bilayer materials under various irradiation geometries, following the conditions of our... 
THRESHOLD | OPTICS | ENERGIES | MULTIDISCIPLINARY SCIENCES | Silicon wafers | Silicon carbide | Computer applications | Spatial discrimination | Optics | Silicon | Grazing | Coatings | Electron transport
Journal Article
Nature Communications, ISSN 2041-1723, 2013, Volume 4, Issue 1, p. 1470
Motivated by the premise that superconductivity in iron-based superconductors is unconventional and mediated by spin fluctuations, an intense research effort... 
MULTIDISCIPLINARY SCIENCES | SCATTERING
Journal Article
Physical Review B - Condensed Matter and Materials Physics, ISSN 1098-0121, 04/2008, Volume 77, Issue 16
Journal Article
AIP Conference Proceedings, ISSN 0094-243X, 01/2019, Volume 2054, Issue 1
SwissFEL is a free electron laser at the Paul Scherrer Institut in Switzerland, which became operational by the end of 2017. Initially, it will host two... 
Divergence | X rays | Free electron lasers | Photon beams | Measuring instruments | Absorbers | Soft x rays | Laser beams | Incidence
Journal Article
Journal Article
Journal of Synchrotron Radiation, ISSN 1600-5775, 11/2019, Volume 26, Issue 6, pp. 2081 - 2085
The transmission of the optical components of the Bernina branch of the Aramis beamline at SwissFEL has been measured with an X‐ray gas monitor from DESY and... 
XFEL | performance | instrumentation | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | OPTICS | Silicon carbide | Collaboration | Cooperation | Diamonds | Bolometers | Optical components | Coatings | Transmission efficiency | Gas detectors
Journal Article
by Milne, Christopher J and Schietinger, Thomas and Aiba, Masamitsu and Alarcon, Arturo and Alex, Jürgen and Anghel, Alexander and Arsov, Vladimir and Beard, Carl and Beaud, Paul and Bettoni, Simona and Bopp, Markus and Brands, Helge and Brönnimann, Manuel and Brunnenkant, Ingo and Calvi, Marco and Citterio, Alessandro and Craievich, Paolo and Divall, Marta Csatari and Dällenbach, Mark and D'Amico, Michael and Dax, Andreas and Deng, Yunpei and Dietrich, Alexander and Dinapoli, Roberto and Divall, Edwin and Dordevic, Sladana and Ebner, Simon and Erny, Christian and Fitze, Hansrudolf and Flechsig, Uwe and Follath, Rolf and Frei, Franziska and Gärtner, Florian and Ganter, Romain and Garvey, Terence and Geng, Zheqiao and Gorgisyan, Ishkhan and Gough, Christopher and Hauff, Andreas and Hauri, Christoph P and Hiller, Nicole and Humar, Tadej and Hunziker, Stephan and Ingold, Gerhard and Ischebeck, Rasmus and Janousch, Markus and Juranić, Pavle and Jurcevic, Mario and Kaiser, Maik and Kalantari, Babak and Kalt, Roger and Keil, Boris and Kittel, Christoph and Knopp, Gregor and Koprek, Waldemar and Lemke, Henrik T and Lippuner, Thomas and Sancho, Daniel Llorente and Löhl, Florian and Lopez-Cuenca, Carlos and Märki, Fabian and Marcellini, Fabio and Marinkovic, Goran and Martiel, Isabelle and Menzel, Ralf and Mozzanica, Aldo and Nass, Karol and Orlandi, Gian Luca and Loch, Cigdem Ozkan and Panepucci, Ezequiel and Paraliev, Martin and Patterson, Bruce and Pedrini, Bill and Pedrozzi, Marco and Pollet, Patrick and Pradervand, Claude and Prat, Eduard and Radi, Peter and Raguin, Jean-Yves and Redford, Sophie and Rehanek, Jens and Réhault, Julien and Reiche, Sven and Ringele, Matthias and Rittmann, Jochen and Rivkin, Leonid and Romann, Albert and Ruat, Marie and Ruder, Christian and Sala, Leonardo and Schebacher, Lionel and Schilcher, Thomas and Schlott, Volker and Schmidt, Thomas and Schmitt, Bernd and Shi, Xintian and Stadler, Markus and Stingelin, Lukas and Sturzenegger, Werner and Szlachetko, Jakub and ...
Applied Sciences (Switzerland), ISSN 2076-3417, 07/2017, Volume 7, Issue 7, p. 720
Journal Article
Journal of Synchrotron Radiation, ISSN 1600-5775, 01/2018, Volume 25, Issue 1, pp. 16 - 19
One of the remaining challenges for accurate photon diagnostics at X‐ray free‐electron lasers (FELs) is the shot‐to‐shot, non‐destructive, high‐resolution... 
tender X‐ray spectroscopy | free‐electron laser | single‐shot measurement | free-electron laser | single-shot measurement | tender X-ray spectroscopy | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | DETECTOR | APERTURE | OPTICS | SCATTERING | Data analysis | Energy resolution | Free electron lasers | Energy measurement | Elastic scattering | Shot | X ray spectrometers
Journal Article
Physical Review B - Condensed Matter and Materials Physics, ISSN 1098-0121, 05/2011, Volume 83, Issue 20
Journal Article
Physical Review Letters, ISSN 0031-9007, 08/2012, Volume 109, Issue 8
Journal Article