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24th IEEE VLSI Test Symposium, ISSN 1093-0167, 2006, Volume 2006, pp. 10 pp. - 251
This paper describes a new time compactor built of multiple-input circular registers of relatively prime length. It has excellent ability to detect errors... 
Graphics | Feedback | Built-in self-test | Shift registers | Polynomials | Compaction | Circuit testing | Logic testing | Flip-flops | Arithmetic
Conference Proceeding
04/2012
Exemplary embodiments of a compactor for compacting test responses are disclosed. In certain embodiments, the compactor comprises circular registers and has... 
TESTING | MEASURING ELECTRIC VARIABLES | MEASURING MAGNETIC VARIABLES | MEASURING | PHYSICS
Patent
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 11/1996, Volume 15, Issue 11, pp. 1409 - 1423
Journal Article
Proceedings International Test Conference 2001 (Cat. No.01CH37260), ISSN 1089-3539, 2001, pp. 258 - 267
This paper introduces a method that enables the diagnosis of embedded memories via test response compression and automatic bitmap recognition. The proposed... 
Manufacturing processes | Automatic testing | Random access memory | Laser feedback | Production | Built-in self-test | Encoding | Pins | Circuit testing | Monitoring | Process monitoring | Bitmap | Embedded memories | BIST | RAM testing | Diagnosis | Memory repair
Conference Proceeding
05/2007
Exemplary embodiments of a compactor for compacting test responses are disclosed. In certain embodiments, the compactor comprises circular registers and has... 
TESTING | MEASURING ELECTRIC VARIABLES | MEASURING MAGNETIC VARIABLES | MEASURING | COMPUTING | COUNTING | PHYSICS | ELECTRIC DIGITAL DATA PROCESSING | CALCULATING
Patent
Proceedings of the 32nd annual ACM/IEEE Design Automation Conference, ISSN 0738-100X, 01/1995, pp. 176 - 182
Recently, it has been shown that retiming has a very strong impact on the run time of sequential, structural automatic test pattern generators (ATPGs), as well... 
Integrated circuit synthesis | Graphics | Laboratories | Sequential circuits | Registers | Circuit faults | Test pattern generators | Synchronization | Circuit testing | Optimization
Conference Proceeding
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