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2006, ISBN 0415950392, xix, 454
Book
2020, ISBN 9789811516559, 409
eBook
2019, ISBN 0367352443, 293
eBook
1973, x, 599 p. illus.
Book
2010, ISBN 0521762316, 619
eBook
2011, ISBN 9780754679349, xx, 355
Book
1993, Advances in industrial control., ISBN 0387198261, xii, 225
Book
2014, Volume 4, 5
Reference
1992, ISBN 0803987641, x, 286
Book
08/2018
Patent
The Astrophysical journal, ISSN 1538-4357, 07/2015, Volume 807, Issue 2, p. 150
Journal Article
06/2018
EARTH DRILLING, e.g. DEEP DRILLING | MISCELLANEOUS APPLICATIONS OF MATERIALS | DYES | FIXED CONSTRUCTIONS | MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE | ADHESIVES | PAINTS | METALLURGY | CHEMISTRY | POLISHES | EARTH DRILLING | NATURAL RESINS | OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR ASLURRY OF MINERALS FROM WELLS | MISCELLANEOUS COMPOSITIONS | MINING
Patent
The Astrophysical journal, ISSN 1538-4357, 09/2015, Volume 810, Issue 2, p. 159
Journal Article
15.
Landmark-basierte statistische Procrustes Analyse bei der Untersuchung der Brustform und -symmetrie
Handchirurgie, Mikrochirurgie, plastische Chirurgie, ISSN 0722-1819, 12/2014, Volume 46, Issue 6, pp. 342 - 349
Journal Article
2000, ISBN 9780822324539, 210
eBook
05/2009
Patent
05/2010
ELECTROGRAPHY | HOLOGRAPHY | MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR | APPARATUS SPECIALLY ADAPTED THEREFOR | MEASURING | PHOTOGRAPHY | CINEMATOGRAPHY | ORIGINALS THEREFOR | TESTING | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES | MATERIALS THEREFOR | TARIFF METERING APPARATUS | PHYSICS | MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
Patent
09/2008
ELECTROGRAPHY | HOLOGRAPHY | MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR | APPARATUS SPECIALLY ADAPTED THEREFOR | MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS | MEASURING AREAS | MEASURING | PHOTOGRAPHY | CINEMATOGRAPHY | MEASURING ANGLES | ORIGINALS THEREFOR | TESTING | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES | MATERIALS THEREFOR | TARIFF METERING APPARATUS | PHYSICS | MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE | MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Patent
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