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Interferometry VII: Techniques and analysis; Proceedings of the Conference, San Diego, CA; UNITED STATES; 11-12 July 1995, 07/1995, pp. 57 - 63
Conference Proceeding
F and M; Feinwerktechnik, Mikrotechnik, Messtechnik, ISSN 0944-1018, 06/1995, Volume 103, Issue 6, pp. 338 - 341
Journal Article
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