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PLoS ONE, ISSN 1932-6203, 03/2013, Volume 8, Issue 3, p. e57051
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 12/2012, Volume 18, Issue 6, pp. 1253 - 1262
Journal Article
2012, Advances in Imaging and Electron Physics, ISBN 9780123943965, Volume 170, 84
Recent developments in the area of gas field ion sources, coupled with knowledge gained from field ion microscopy, have made the realization of very high... 
GFIS | scanning ion microscope | Helium ion source | high-resolution imaging | HIM | ENERGY | PHYSICS, APPLIED | ELECTRON-BEAM | OPERATION | MICROANALYSIS | RESOLUTION | BEAM LITHOGRAPHY | FABRICATION | EMISSION | MICROSCOPY | HIGH-BRIGHTNESS | CARTILAGE
Book Chapter
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, ISSN 1071-1023, 01/2010, Volume 28, Issue 1, pp. 73 - 77
The newly introduced ORION ™ helium ion microscope has been used for high resolution imaging and nanofabrication. More recently, an energy sensitive detector... 
PHYSICS, APPLIED | helium ions | MICROSCOPE | backscatter | CONTRAST | NANOSCIENCE & NANOTECHNOLOGY | ion beams | focused ion beam technology | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Proceedings of SPIE, ISSN 0277-786X, 06/2011, Volume 8036, Issue 1, pp. 80360M - 80360M-13
Helium Ion Microscopy has been established as a powerful imaging technique offering unique contrast and high resolution surface information. More recently, the... 
Helium Ion Microscopy | Sensors | Nanopores | Focused ion beam | Drilling | Microscopy | Nanocomposites | Homeland security | Nanomaterials | Nanostructure | Helium | Ion beams
Conference Proceeding
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, ISSN 1071-1023, 11/2010, Volume 28, Issue 6, pp. C6P18 - C6P23
Toward the end goal of creating transducers with nanometer scale sensing features, the helium ion microscope (HIM) has been employed to create and characterize... 
NANOSCIENCE & NANOTECHNOLOGY | PHYSICS, APPLIED | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Advances in Imaging and Electron Physics, ISSN 1076-5670, 01/2012, Volume 170, pp. 65 - 65
Recent developments in the area of gas field ion sources, coupled with knowledge gained from field ion microscopy, have made the realization of very high... 
Scanning electron microscopy | Scanning | Microscopy | Brightness | Imaging | Ion sources | Ion microscopes | Helium
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 06/2010, Volume 7729
Recent helium ion microscope (HIM) imaging studies have shown the strong sensitivity of HIM induced secondary electron (SE) yields [1] to the sample physical... 
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 06/2010, Volume 7729
Recent helium ion microscope (HIM) imaging studies have shown the strong sensitivity of HIM induced secondary electron (SE) yields [1] to the sample physical... 
Imaging | Oxides | Mathematical models | Ion microscopes | Cleaning | Argon | Helium | Copper
Journal Article
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, ISSN 1071-1023, 11/2010, Volume 28, Issue 6, pp. C6P59 - C6P65
Peculiarities of the structural organization and electrical properties of two core-shell polymer systems under different fabrication protocols have been... 
PHYSICS, APPLIED | CHEMICAL SENSORS | CONJUGATED POLYMERS | NANOFIBERS | POLYANILINE | NANOSCIENCE & NANOTECHNOLOGY | GAS SENSORS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Jpn J Appl Phys, ISSN 0021-4922, 4/2010, Volume 49, Issue 4, pp. 04DB12 - 04DB12-4
The recently developed helium ion microscope (HIM) is now capable of 0.35 nm secondary electron (SE) mode image resolution. When low-$k$ dielectrics or copper... 
PHYSICS, APPLIED
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 2012, Volume 18, Issue 2, pp. 828 - 829
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. 
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 2012, Volume 18, Issue 2, pp. 810 - 811
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. 
Journal Article
Applied Physics Letters, ISSN 0003-6951, 03/2006, Volume 88, Issue 12, pp. 124104 - 124104-3
The interaction between high-energy Ga + ions and condensed matter is studied for circuit edit applications. A new "electrical breakthrough effect" due to... 
Journal Article
Applied Physics Letters, ISSN 0003-6951, 03/2006, Volume 88, Issue 12, p. 124104
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 7/2009, Volume 15, Issue S2, pp. 220 - 221
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009 
Journal Article
Applied Physics Letters, ISSN 0003-6951, 03/2006, Volume 88, Issue 12
The interaction between high-energy Ga+ ions and condensed matter is studied for circuit edit applications. A new "electrical breakthrough effect" due to... 
DEVICES | PHYSICS, APPLIED | EMISSION | INTEGRATED-CIRCUITS | CROSS SECTIONS | GALLIUM IONS | MILLING | CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS | ION BEAMS | ASPECT RATIO | DIELECTRIC MATERIALS | INTEGRATED CIRCUITS
Journal Article
2009 IEEE International Reliability Physics Symposium, ISSN 1541-7026, 04/2009, pp. 317 - 321
The helium ion microscope, a new imaging technology, is being applied also to sample modification. The application opportunity exists due to the extreme high... 
helium ion | Scanning electron microscopy | Dielectric materials | Dielectric substrates | Helium | HIM | backscattering | imaging | Ion beams | Electron beams | dopant | Ion sources | Health information management | microscopy | Optical films | Optical sensors | Dopant | Helium ion | Microscopy | Backscattering | Imaging
Conference Proceeding
Microscopy and Microanalysis, ISSN 1431-9276, 7/2009, Volume 15, Issue S2, pp. 654 - 655
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009 
Journal Article
Proceedings of SPIE, ISSN 0277-786X, 06/2010, Volume 7729, Issue 1, pp. 77290J - 77290J-9
Recent helium ion microscope (HIM) imaging studies have shown the strong sensitivity of HIM induced secondary electron (SE) yields [1] to the sample physical... 
Argon Cleaning | Contamination Reduction | High resolution | Surface Sensitive | Helium Ion Microscope
Conference Proceeding
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