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Applied Physics Letters, ISSN 0003-6951, 2013, Volume 102, Issue 21, p. 213116
Microfocal spectroscopic ellipsometry mapping of the electronic properties and thickness of epitaxial graphene grown by high-temperature sublimation on 3C-SiC... 
CONFINEMENT | PHYSICS, APPLIED | GROWTH | Teknik och teknologier | TEKNIKVETENSKAP | Engineering and Technology | TECHNOLOGY
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 02/2010, Volume 81, Issue 2, pp. 023101 - 023101-7
We report an experimental setup for wavelength-tunable frequency-domain ellipsometric measurements in the terahertz spectral range from 0.2 to 1.5 THz... 
CALIBRATION | MULTISAMPLE | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | ellipsometry | silicon | OPTICAL-CONSTANTS | SPECTROSCOPY | backward wave oscillators | TIME | optical polarisers | phosphorus
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 10/2011, Volume 82, Issue 10, pp. 103111 - 103111-10
Journal Article
Applied Physics Letters, ISSN 0003-6951, 2009, Volume 95, Issue 3, p. 32102
Noninvasive optical measurement of hole diffusion profiles in p-p(+) silicon homojunction is reported by ellipsometry in the terahertz (0.2-1.5 THz) and... 
terahertz spectroscopy | diffusion | PHYSICS, APPLIED | effective mass | polarisation | P-TYPE GAAS | THZ | semiconductor junctions | hole density | DOPED SILICON | TIME-DOMAIN SPECTROSCOPY | elemental semiconductors | ellipsometry | silicon | infrared spectra
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2011, Volume 8018
We studied various liquids using a vertical attenuated total reflection (ATR) liquid sampling assembly in conjunction with Infrared Variable Angle... 
Liquid | Infrared | Optical constants | ATR | Ellipsometry | Dimethyl | Spectroscopy | Liquids | Spectroscopic analysis | Constants | Warfare
Conference Proceeding
Journal of Applied Physics, ISSN 0021-8979, 04/2013, Volume 113, Issue 16, p. 164102
Spectroscopic ellipsometry in the mid-infrared and far-infrared spectral range and generalized ellipsometry in the mid-infrared spectral range are used to... 
RAMAN-SPECTRA | DEGREES K | PHYSICS, APPLIED | CONSTANTS | TEMPERATURE-DEPENDENCE | TRANSVERSE | LONGITUDINAL-OPTIC MODES | SYSTEMS | THIN-FILM | SELF-ENERGY | GENERALIZED ELLIPSOMETRY
Journal Article
Physical Review B - Condensed Matter and Materials Physics, ISSN 0163-1829, 2000, Volume 61, Issue 12, pp. 8187 - 8201
Journal Article
Surface and Interface Analysis, ISSN 0142-2421, 09/2007, Volume 39, Issue 9, pp. 747 - 751
Optical properties of spin‐cast chitosan films were determined in the vacuum ultraviolet (VUV) through visible regions of the spectrum using spectroscopic... 
chitosan | optical constants | ellipsometry | spectroscopy | vacuum ultraviolet | Vacuum ultraviolet | Spectroscopy | Chitosan | Optical constants | Ellipsometry | AFM | CHEMISTRY, PHYSICAL
Journal Article
Physical Review B - Condensed Matter and Materials Physics, ISSN 0163-1829, 1997, Volume 56, Issue 20, pp. 13306 - 13313
Journal Article
Materials Research Society Symposium Proceedings, ISSN 0272-9172, 2008, Volume 1146, pp. 53 - 59
The change of the visible light ellipsometric parameters and mechanical harmonic frequencies of a hydrophobic gold surface attached to a quartz crystal are... 
Conference Proceeding
Thin Solid Films, ISSN 0040-6090, 02/2011, Volume 519, Issue 9, pp. 2817 - 2820
Self-assembled monolayers (SAMs) formed via chemisorption are important for a variety of surface enhancement and biological applications. We demonstrate that... 
SAMs | Alkanethiols | Quartz crystal microbalance | Spectroscopic ellipsometry | Self-assembled monolayers | GOLD | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | THIOLS | FILMS | METALS | MATERIALS SCIENCE, COATINGS & FILMS | Chemisorption | Microorganisms | Surface chemistry | Ethyl alcohol | Alkanes | Combinatorial analysis | Ellipsometry
Journal Article
Journal of Materials Research, ISSN 0884-2914, 5/2001, Volume 16, Issue 5, pp. 1241 - 1244
Aging properties of porous GaAs were investigated nondestructively using variable angle of incidence infrared spectroscopic ellipsometry. In addition to the... 
VIBRATIONAL EXCITATIONS | OXIDE | LAYER | MATERIALS SCIENCE, MULTIDISCIPLINARY | AS2O3
Journal Article
Physical Review B - Condensed Matter and Materials Physics, ISSN 0163-1829, 09/2000, Volume 62, Issue 11, pp. 7365 - 7377
Journal Article
Applied Physics Letters, ISSN 0003-6951, 03/1997, Volume 70, Issue 13, pp. 1668 - 1670
Infrared spectroscopic ellipsometry (IRSE) over the wavelength range from 700 to 3000 cm(-1) has been used to study and distinguish the microstructure of... 
OPTICAL-PROPERTIES | PHYSICS, APPLIED | DEPOSITION
Journal Article
Physical Review B - Condensed Matter and Materials Physics, ISSN 1098-0121, 04/2009, Volume 79, Issue 14
Journal Article
Journal of Applied Physics, ISSN 0021-8979, 09/1997, Volume 82, Issue 6, pp. 2906 - 2911
Spectroscopic ellipsometry over the spectral range from 700 to 3000 cm(-1) and from 1.5 to 3.5 eV is used to simultaneously determine phase and microstructure... 
BN FILMS | PRESSURE | PHYSICS, APPLIED | CARBIDE | DEPOSITION | GROWTH | OPTICAL-PROPERTIES | Thin films | Boron nitride | Infrared spectroscopy | Usage | Research
Journal Article
Journal of Applied Physics, ISSN 0021-8979, 07/1998, Volume 84, Issue 1, pp. 526 - 532
In situ infrared (IR) spectroscopy and visible-light (VIS) spectroscopic ellipsometry over the spectral range from 700 to 2000 cm(-1) and 1.5-3.5 eV,... 
BN FILMS | RAMAN-SCATTERING | PHYSICS, APPLIED | CONSTANTS | DEPOSITION | SILICON | GROWTH | OPTICAL-PROPERTIES | SPECTROSCOPIC ELLIPSOMETRY | DIELECTRIC FUNCTION | DEPENDENCE | Thin films | Boron nitride | Research | Optical properties
Journal Article
Proceedings, Annual Technical Conference - Society of Vacuum Coaters, ISSN 0737-5921, 2003, pp. 365 - 370
Conference Proceeding
Thin Solid Films, ISSN 0040-6090, 11/1999, Volume 355, pp. 1 - 5
We prepared several photochromic composite films based on a hybrid organic-inorganic matrix in which metal heteropolyoxometallates are entrapped. Infrared... 
Tungsten compounds | Spectrum analysis | Optical properties | Analysis | Electrical engineering | Molybdenum
Journal Article
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