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IEEE Transactions on Electron Devices, ISSN 0018-9383, 11/2000, Volume 47, Issue 11, pp. 2146 - 2152
Journal Article
Microelectronics Reliability, ISSN 0026-2714, 1999, Volume 40, Issue 11, pp. 1847 - 1853
Journal Article
Microelectronics Reliability, ISSN 0026-2714, 2000, Volume 40, Issue 11, pp. 1847 - 1853
In this paper, we discuss the impact of current crowding on 1/ f noise generation and third harmonic distortion in semiconductor devices. We propose a model... 
DIAGNOSTIC-TOOL | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Solid State Electronics, ISSN 0038-1101, 2002, Volume 46, Issue 3, pp. 353 - 360
The improved RF performance of silicon-based technologies over the years and their potential use in telecommunication applications has increased the research... 
MOSFET | RF modelling | Compact models | Equivalent circuit based model | Table look-up model | BSIM3v3 | Large signal (nonlinear) | PHYSICS, CONDENSED MATTER | EXTRACTION | PHYSICS, APPLIED | equivalent circuit based model | table look-up model | large signal (nonlinear) | compact models | SIMULATION | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 07/2000, Volume 47, Issue 7, pp. 1484 - 1491
The continuous downscaling of CMOS devices aims at cost reduction and performance improvement. Process development constantly faces new constraints and... 
MOSFETs | MOSFET | PHYSICS, APPLIED | short-channel effect | COSI2 | LEAKAGE MECHANISMS | JUNCTIONS | selective epitaxy | MOSFETS | elevated source/drain | ENGINEERING, ELECTRICAL & ELECTRONIC | Complementary metal oxide semiconductors | Research
Journal Article
IEEE Electron Device Letters, ISSN 0741-3106, 08/1997, Volume 18, Issue 8, pp. 369 - 371
This letter reports on the bias-dependence of the inverse subthreshold slope or subthreshold swing in MOSFET's. It is shown by calculations and verified by... 
Temperature dependence | Photonic band gap | MOSFET circuits | Predictive models | Analog circuits | Transconductors | Leakage current | Threshold voltage | Silicon | Differential amplifiers | CMOS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Solid State Electronics, ISSN 0038-1101, 1997, Volume 41, Issue 6, pp. 901 - 908
In this article two different generations of silicon material from the early-eighties and the mid-nineties are compared. The impact of iron contamination and... 
PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | K UB PHYSICS, APPLIED | K UK PHYSICS, CONDENSED MATTER | LOW-FREQUENCY NOISE | N DIODES | 1/F NOISE | K IQ ENGINEERING, ELECTRICAL & ELECTRONIC | JUNCTION DIODES | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article