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optics (44) 44
calibration (35) 35
metrology (33) 33
x-ray optics (32) 32
long trace profiler (28) 28
instruments & instrumentation (26) 26
surface metrology (26) 26
synchrotron radiation (25) 25
optical metrology (24) 24
power spectral density (22) 22
fluorescence (20) 20
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physics, applied (19) 19
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crystallography (15) 15
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testing (12) 12
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nuclear science & technology (11) 11
physics, particles & fields (11) 11
spectra (11) 11
design (10) 10
gratings (10) 10
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measuring (10) 10
phosphorescence (10) 10
profilers (10) 10
spectroscopy (10) 10
accuracy (9) 9
soft x-rays (9) 9
autoregressive moving average (8) 8
bendable mirrors (8) 8
diffraction (8) 8
dna (8) 8
microscopes (8) 8
modulation (8) 8
surface slope profilometry (8) 8
accelerators (7) 7
advanced light source (7) 7
density (7) 7
energy transfer (7) 7
time-invariant linear filter (7) 7
wavelengths (7) 7
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alignment (6) 6
beams (6) 6
chemistry, physical (6) 6
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multilayers (6) 6
optimization (6) 6
polymer science (6) 6
profilometers (6) 6
regression analysis (6) 6
resolution (6) 6
spectral density (6) 6
systematic errors (6) 6
transfer functions (6) 6
x-ray mirrors (6) 6
absorption (5) 5
arrays (5) 5
deoxyribonucleic acid--dna (5) 5
devices or arrangements, the optical operation of which ismodified by changing the optical properties of the medium of thedevices or arrangements for the control of the intensity,colour, phase, polarisation or direction of light, e.g.switching, gating, modulating or demodulating (5) 5
diffraction efficiency (5) 5
efficiency (5) 5
frequency-changing (5) 5
grooves (5) 5
index medicus (5) 5
lasers (5) 5
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luminescence (5) 5
magnetometers (5) 5
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measuring electric variables (5) 5
measuring magnetic variables (5) 5
nanoparticles (5) 5
non-linear optics (5) 5
nucleic-acids (5) 5
optical analogue/digital converters (5) 5
optical logic elements (5) 5
optical transfer function (5) 5
photons (5) 5
psd (5) 5
scattering (5) 5
shearing interferometry (5) 5
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Synchrotron Radiation News, ISSN 0894-0886, 09/2013, Volume 26, Issue 5, pp. 2 - 3
The International Bureau of Weights and Measures defines metrology as "the science of measurement, embracing both experimental and theoretical determinations... 
X rays
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 11/2009, Volume 80, Issue 11, pp. 115101 - 115101-10
Drifting of experimental setups with change in temperature or other environmental conditions is the limiting factor of many, if not all, precision... 
INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | ELECTRIC-DIPOLE MOMENT | SEARCH | POLYNOMIALS | RANDOMNESS | INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY | CALIBRATION | ERRORS | CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS | ACCURACY | BACKGROUND NOISE | SURFACES
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 05/2016, Volume 87, Issue 5, p. 051805
For glancing-incidence optical systems, such as short-wavelength optics used for nano-focusing, incorporating physical factors in the calculations used for... 
INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | GAUSSIAN BEAMS | STREHL RATIO | TERMS | SYMMETRIC AMPLITUDE DISTRIBUTIONS | PRIMARY ABERRATIONS | Physical factors | Focal plane | Shape optimization | Performance enhancement | Incidence angle | Regression analysis | Strehl ratio | Phase error | Physical properties | Electric power distribution | Reflectance
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 05/2016, Volume 87, Issue 5
For glancing-incidence optical systems, such as short-wavelength optics used for nano-focusing, incorporating physical factors in the calculations used for... 
OTHER INSTRUMENTATION
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 05/2016, Volume 87, Issue 5
Recent developments in synchrotron storage rings and free-electron laser-based x-ray sources with ever-increasing brightness and coherent flux have pushed... 
FREE ELECTRON LASERS | SYNCHROTRONS | INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY | X RADIATION | ELECTRONS | SYNCHROTRON RADIATION | FABRICATION | OPTICS | BRIGHTNESS | X-RAY SOURCES | MIRRORS | STORAGE RINGS
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 05/2016, Volume 87, Issue 5
For glancing-incidence optical systems, such as short-wavelength optics used for nano-focusing, incorporating physical factors in the calculations used for... 
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY | DISTANCE | OPTICAL SYSTEMS | REFLECTIVITY | WAVELENGTHS | BEAMS | EXPECTATION VALUE | COMPUTERIZED SIMULATION | MIRRORS | SHAPE | MINIMIZATION | POWER DISTRIBUTION | DIFFRACTION | REGRESSION ANALYSIS | INCIDENCE ANGLE | OPTICS | TUNING | SURFACES
Journal Article
Nanoscale Research Letters, ISSN 1931-7573, 2017, Volume 12, Issue 1, pp. 1 - 7
Formation and electronic excitation energy transfer process in the nanosystem consisting of Ce0.85Tb0.15F3 nanoparticles, cetrimonium bromide (CTAB)... 
Chlorin e | nanoparticles | Photodynamic therapy | Electronic excitation energy transfer | Nanoparticles | Cetyltrimethylammonium bromide | Terbium | Embedding | Cesium | Excitation | Cetrimonium bromide | Energy transfer | Chlorin e6 | Ce0.85Tb0.15F3 nanoparticles
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 05/2016, Volume 87, Issue 5, p. 051701
Recent developments in synchrotron storage rings and free-electron laser-based x-ray sources with ever-increasing brightness and coherent flux have pushed... 
INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | Metrology | Set theory | Laser applications | Storage rings (particle accelerators) | X ray optics | X ray mirrors | Synchrotron radiation | X ray sources
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 02/2019, Volume 90, Issue 2, p. 021705
Deflectometric profilometers are indispensable tools for the precision form measurement of beam-shaping optics of synchrotrons and x-ray free electron lasers.... 
INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | NM TOPOGRAPHY MEASUREMENT | State of the art | Systematic errors | Free electrons | Synchrotrons | Free electron lasers | Metrology | Profilometers | Tolerances | Laser beams | X ray optics | OTHER INSTRUMENTATION
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 02/2019, Volume 90, Issue 2, p. 021717
Deflectometric profilometers based on industrial electronic autocollimators (ACs), as the ELCOMAT-3000, have become indispensable tools for precision form... 
INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | RESOLUTION | Free electrons | Free electron lasers | Apertures | Optical transfer function | Profilometers | Optics | Calibration | Aperture | Frequency ranges | Spatial resolution | X ray optics | OTHER INSTRUMENTATION
Journal Article
Proceedings of the National Academy of Sciences of the United States of America, ISSN 0027-8424, 8/2006, Volume 103, Issue 34, pp. 12668 - 12671
Journal Article
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, 05/2013, Volume 710, p. 1
Journal Article
Nuclear Inst. and Methods in Physics Research, A, ISSN 0168-9002, 05/2013, Volume 710, pp. 31 - 36
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 01/2017, Volume 88, Issue 1, p. 013110
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 04/2009
Drifting of experimental set-ups with change of temperature or other environmental conditions is the limiting factor of many, if not all, precision... 
POLYNOMIALS | CALIBRATION | OTHER INSTRUMENTATION | precision measurements, drift suppression, long trace profiler, LTP, surface slope metrology | ACCURACY
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 9/2013, Volume 8848, pp. 88480H - 88480H-13
Numerical simulations of the performance of new x-ray beamlines and those under upgrade require sophisticated and reliable information about the expected... 
PSD | Metrology of x-ray optics | Autoregressive moving average | Fabrication tolerances | Power spectral density | TILF | ARMA | Time-invariant linear filter | Surface metrology | Slopes | Fittings | Mathematical analysis | Particle physics | X-rays | Metrology | Mathematical models | Modelling
Conference Proceeding
Macromolecular Symposia, ISSN 1022-1360, 02/2014, Volume 336, Issue 1, pp. 25 - 29
  Summary The results of the optical absorption, fluorescence, phosphorescence in UV and visible spectral range, and effect of light irradiation on spectral... 
cobalt | photodegradation | fluorescence | metal ions | DNA | vis spectroscopy | DNA, fluorescence | UV-vis spectroscopy | Deoxyribonucleic acid--DNA | Photodegradation | Light irradiation | Optical properties | Deoxyribonucleic acid | Fluorescence | Phosphorescence | Spectra | Cobalt
Journal Article
Nuclear Inst. and Methods in Physics Research, A, ISSN 0168-9002, 05/2013, Volume 710, pp. 59 - 66
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 05/2016, Volume 87, Issue 5, p. 051904
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers and auto-collimator based deflectometers, is limited by... 
MEASURING MACHINE | METROLOGY | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | ANGLE COMPARATOR | Systematic errors | Collaboration | Cooperation | Measuring instruments | Metrology | Collimation | Deflectometers | Calibration | X ray optics | Profilers | OTHER INSTRUMENTATION
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 9/2013, Volume 8848, pp. 88480I - 88480I-15
We discuss an application of correlation analysis to surface metrology of high quality x-ray optics with the aim of elicitation and, when possible, suppression... 
Metrology of x-ray optics | Correlation analysis | Systematic error | Surface profilometer | Fabrication tolerances | Mirror polishing | Surface metrology | Surface slope measurement | Slopes | Systematic errors | Mathematical analysis | X-rays | Metrology | Instrumentation | Interferometers
Conference Proceeding
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