X
Search Filters
Format Format
Format Format
X
Sort by Item Count (A-Z)
Filter by Count
Journal Article (259) 259
Conference Proceeding (39) 39
Book Chapter (4) 4
Report (4) 4
Publication (3) 3
Dissertation (2) 2
Technical Report (2) 2
Magazine Article (1) 1
Patent (1) 1
more...
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
microscopy (44) 44
materials science, multidisciplinary (27) 27
materials science (23) 23
physics, applied (20) 20
transmission electron microscopy (18) 18
spectroscopy (15) 15
electron microscopy (14) 14
physics, condensed matter (14) 14
chemistry, physical (13) 13
tomography (10) 10
chemistry, multidisciplinary (9) 9
energy-loss spectroscopy (9) 9
nanoparticles (8) 8
nanoscience & nanotechnology (8) 8
xeds (8) 8
analysis (7) 7
in-situ (7) 7
irradiation (7) 7
nanoscience and nanotechnology (7) 7
stem (7) 7
aem (6) 6
crystal structure (6) 6
electron diffraction (6) 6
electrons (6) 6
mining & mineral processing (6) 6
nuclear science & technology (6) 6
pyrochlore (6) 6
scanning electron microscopy (6) 6
tem (6) 6
x-ray spectroscopy (6) 6
chemistry (5) 5
crystals (5) 5
defects (5) 5
eels (5) 5
electron microscopes (5) 5
electron-microscopy (5) 5
elements (5) 5
films (5) 5
growth (5) 5
irradiation-induced amorphization (5) 5
metals (5) 5
nanostructures (5) 5
radiation (5) 5
radiation damage (5) 5
resolution (5) 5
transmissionselektronenmikroskopie (5) 5
zirconolite (5) 5
aberration (4) 4
anl (4) 4
chemistry, inorganic & nuclear (4) 4
diffraction (4) 4
electron beams (4) 4
electron spectroscopy (4) 4
elektronenmikroskopie (4) 4
general and miscellaneous//mathematics, computing, and information science (4) 4
gold (4) 4
index medicus (4) 4
magnetization (4) 4
microanalysis (4) 4
multidisciplinary sciences (4) 4
orientation (4) 4
physics (4) 4
radiation-damage (4) 4
research (4) 4
scattering (4) 4
silicon (4) 4
spectrum analysis (4) 4
temperature (4) 4
thin films (4) 4
tomographie (4) 4
transmission electron microscopes (4) 4
transmissionselektronenmikroskop (4) 4
x-rays (4) 4
alpha-decay damage (3) 3
amino acid sequence (3) 3
animals (3) 3
annihilation (3) 3
assembly (3) 3
biochemistry & molecular biology (3) 3
block copolymers (3) 3
carbon (3) 3
ceramics (3) 3
cobalt (3) 3
condensed matter physics, superconductivity and superfluidity (3) 3
crystal defects (3) 3
crystallization (3) 3
damage (3) 3
dots (3) 3
electron energy loss spectroscopy (3) 3
elektronenenergieverlustspektrometrie (3) 3
elektronenmikroskop (3) 3
fixtures (3) 3
gd2ti2o7 (3) 3
geochemistry & geophysics (3) 3
induced amorphization (3) 3
inorganic, organic, physical and analytical chemistry (3) 3
inorganic, organic, physical, and analytical chemistry (3) 3
ion beams (3) 3
iron (3) 3
kinetics (3) 3
more...
Language Language
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


ACTA MATERIALIA, ISSN 1359-6454, 08/2010, Volume 58, Issue 13, pp. 4362 - 4368
During investigations of novel material types with uses in future nuclear technologies (ITER/DEMO and GenIV fission reactors), ternary carbides with... 
ELECTRONIC-PROPERTIES | Electron diffraction | MATERIALS SCIENCE, MULTIDISCIPLINARY | METALLURGY & METALLURGICAL ENGINEERING | Titanium | ION | Ceramics | Transmission electron microscopy (TEM) | IRRADIATION-INDUCED AMORPHIZATION | Ion-beam processing
Journal Article
Acta Materialia, ISSN 1359-6454, 08/2010, Volume 58, Issue 13, pp. 4362 - 4368
During investigations of novel material types with uses in future nuclear technologies (ITER/DEMO and GenIV fission reactors), ternary carbides with... 
Phases | Indication | Radiation tolerance | Activation | Tolerances | Argon | Bonding | Carbides | Crystal structure
Journal Article
Acta Materialia, ISSN 1359-6454, 2010, Volume 58, Issue 13, pp. 4362 - 4368
During investigations of novel material types with uses in future nuclear technologies (ITER/DEMO and GenIV fission reactors), ternary carbides with... 
Electron diffraction | Titanium | Ceramics | Transmission electron microscopy (TEM) | Ion-beam processing
Journal Article
Ultramicroscopy, ISSN 0304-3991, 2018, Volume 203, pp. 163 - 169
A study of the influence of experimental parameters on the sensitivity of x-ray energy dispersive spectroscopy in the analytical electron microscope from... 
AEM | MAF | XEDS | MDM | MMF | MICROSCOPY | Detectors
Journal Article
Journal of Applied Physics, ISSN 0021-8979, 08/2010, Volume 108, Issue 4, pp. 044303 - 044303-8
Nanopyramid light emitting diodes (LEDs) have been synthesized by selective area organometallic vapor phase epitaxy. Self-organized porous anodic alumina is... 
SHIFT | PHYSICS, APPLIED | LUMINESCENCE | GAN | DIFFRACTION CONTRAST | EMISSION | EFFICIENCY | Usage | Transmission electron microscopes | Analysis | Optical properties | Quantum electrodynamics | Organometallic compounds | Photoluminescence | Light-emitting diodes | Structure | Electric properties
Journal Article
Physical Review Letters, ISSN 0031-9007, 09/2010, Volume 105, Issue 12, p. 125504
Using electron correlograph analysis we show that coherent nanodiffraction patterns from sputtered amorphous silicon indicate that there is more local... 
DISORDERED MATERIALS | THIN-FILMS | FLUCTUATION MICROSCOPY | PHYSICS, MULTIDISCIPLINARY | PROBE | MEDIUM-RANGE ORDER | SCATTERING
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 2014, Volume 20, Issue 4, pp. 1318 - 1326
Closed form analytical equations used to calculate the collection solid angle of six common geometries of solid-state X-ray detectors in scanning and... 
SDD | X-ray detectors | SiLi | EDS | XEDS | microanalysis | EDXS | SEM | solid angle | TEM | STEM | MATERIALS SCIENCE, MULTIDISCIPLINARY | MICROSCOPY
Journal Article
Ultramicroscopy, ISSN 0304-3991, 04/2015, Volume 151, pp. 240 - 249
Aberration correction in scanning/transmission electron microscopy (S/TEM) owes much to the efforts of a small dedicated group of innovators. Leading that... 
HREM | In-situ | Phase contrast | XEDS | Amplitude contrast | EFTEM | EELS | ETEM | Tomography | Aberration correction | AEM | MICROSCOPY | STEM | ENERGY-LOSS SPECTROSCOPY | HIGH-RESOLUTION | PROGRESS | ABERRATIONS | Scanning electron microscopy | Spectroscopy | Leadership | Scanning | Mathematical analysis | Imaging | Aberration
Journal Article
Applied Physics Letters, ISSN 0003-6951, 05/2007, Volume 90, Issue 20, pp. 204105 - 204105-3
High-angular-resolution electron energy loss spectroscopy (EELS) is used to study the anisotropic behavior of the boron and nitrogen K ionization edges in h... 
PHYSICS, APPLIED | CARBON | RAMAN-SPECTROSCOPY | EELS | NANOTUBES | NEAR-EDGE STRUCTURE | ANISOTROPY | SCATTERING | ENERGY-LOSS SPECTROSCOPY | BORON NITRIDES | HEXAGONAL LATTICES | MATERIALS SCIENCE | RESOLUTION
Journal Article
Nature Materials, ISSN 1476-1122, 12/2002, Volume 1, Issue 4, pp. 247 - 252
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 02/2016, Volume 22, Issue 1, pp. 230 - 236
Modern analytical electron microscopes equipped with silicon drift detectors now allow for a wide range of geometrical configurations capable of performing... 
MMF/MDM | AEM | X-ray microanalysis | XEDS | peak/background | SPECTROSCOPY | MATERIALS SCIENCE, MULTIDISCIPLINARY | MICROSCOPY | Models, Theoretical | Spectrometry, X-Ray Emission - methods | Statistics as Topic - methods | Microscopy, Electron - methods
Journal Article
Acta Materialia, ISSN 1359-6454, 12/2011, Volume 59, Issue 20, pp. 7530 - 7537
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 11/2016, Volume 22, Issue S5, pp. 72 - 73
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 08/2015, Volume 21, Issue S3, pp. 961 - 962
Journal Article
No results were found for your search.

Cannot display more than 1000 results, please narrow the terms of your search.