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Advances in physics, ISSN 0001-8732, 01/2014, Volume 63, Issue 1, pp. 1 - 76
73.22.Pr Electronic structure of graphene | d-wave superconductors | topological insulators | chirality | back scattering | 75.76.+j Spin transport effects | graphene | 73.20.-r Electron states at surfaces and interfaces | 73.50.-h Electronic transport phenomena in thin films | 73.25.+i Surface conductivity and carrier phenomena | impurity resonance | 71.55.-i Impurity and defect levels | Dirac materials | 74.20.-z Theories and models of superconducting state | Physics, Condensed Matter | Physical Sciences | Physics | Science & Technology
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Diamond and related materials, ISSN 0925-9635, 2007, Volume 16, Issue 1, pp. 6 - 11
Defect characterization | 81.05.Hd Material science: other semiconductors | 29.40.Wk Solid-state detectors | 71.55.Ht Other nonmetals (impurity and defect levels) | Detectors | 61.72.Ji Point defects: vacancies, interstitials, color centers, etc. and defect clusters | Implantation | Silicon carbide (SiC) | Physical Sciences | Materials Science | Technology | Materials Science, Coatings & Films | Materials Science, Multidisciplinary | Physics, Condensed Matter | Physics | Science & Technology | Physics, Applied | Electron states | Defects and impurities in crystals; microstructure | Exact sciences and technology | Condensed matter: structure, mechanical and thermal properties | Structure of solids and liquids; crystallography | Condensed matter: electronic structure, electrical, magnetic, and optical properties | Physical radiation effects, radiation damage | Impurity and defect levels
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Journal of applied physics, ISSN 0021-8979, 04/2005, Volume 97, Issue 7, p. 73707
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Electrical properties and recombination activity of copper, nickel and cobalt in silicon
Applied physics. A, Materials science & processing, ISSN 0947-8396, 02/1998, Volume 66, Issue 2, pp. 123 - 136
PACS: 71.55 | Physical Sciences | Materials Science | Technology | Materials Science, Multidisciplinary | Physics | Science & Technology | Physics, Applied | Electron states | Elemental semiconductors | Condensed matter: electronic structure, electrical, magnetic, and optical properties | Exact sciences and technology | Impurity and defect levels
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Applied Physics A, ISSN 0947-8396, 7/2009, Volume 96, Issue 1, pp. 235 - 253
Operating Procedures, Materials Treatment | Optical and Electronic Materials | Characterization and Evaluation of Materials | Condensed Matter | Surfaces and Interfaces, Thin Films | Physics | Nanotechnology | Physical Sciences | Materials Science | Technology | Materials Science, Multidisciplinary | Science & Technology | Physics, Applied | Silicon compounds | Transition metal compounds | Solar energy industry | Solid solutions | Silicon | Universities and colleges | Rain and rainfall | Dislocations | Reconstruction | Crystal defects | Stacking faults | Impurities | Materials science | Strain
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physica status solidi (b), ISSN 0370-1972, 07/2006, Volume 243, Issue 9, pp. 2071 - 2080
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physica status solidi (b), ISSN 0370-1972, 04/2008, Volume 245, Issue 4, pp. 641 - 652
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Applied Physics A Solids and Surfaces, ISSN 0721-7250, 10/1989, Volume 49, Issue 4, pp. 431 - 436