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IEEE Photonics Journal, ISSN 1943-0655, 08/2016, Volume 8, Issue 4, pp. 1 - 10
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 05/2012, Volume 59, Issue 5, pp. 1475 - 1479
Journal Article
Optics Communications, ISSN 0030-4018, 03/2019, Volume 435, pp. 374 - 377
We proposed one structure of InP/In Ga As avalanche photodiode (APD) with a multi-layer multiplication which is created by inserting a p-type layer into a... 
Mean gain | Surface leakage current | Excess noise factor | Dead space | Avalanche photodiodes (APD) | Generation–recombination | MULTIPLICATION NOISE | OPTICS | GAIN | Generation-recombination
Journal Article
IEEE Photonics Technology Letters, ISSN 1041-1135, 04/2010, Volume 22, Issue 8, pp. 529 - 531
Journal Article
Journal of Lightwave Technology, ISSN 0733-8724, 06/2017, Volume 35, Issue 11, pp. 2315 - 2324
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 05/2018, Volume 65, Issue 5, pp. 1823 - 1829
We present a nonlocal history-dependent model for impact ionization gain and noise in avalanche photodiodes (APDs) especially suited for staircase APDs. The... 
simulation | Avalanche photodiodes | Charge carrier processes | Impact ionization | Semiconductor process modeling | Mathematical model | High definition video | Avalanche photodiodes (APDs) | impact ionization | DEAD SPACE | PHYSICS, APPLIED | MULTIPLICATION NOISE | DETECTOR | IMPACT-IONIZATION | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 04/2019, Volume 66, Issue 4, pp. 1810 - 1814
Journal Article
IEEE Photonics Technology Letters, ISSN 1041-1135, 07/2009, Volume 21, Issue 13, pp. 866 - 868
Journal Article
OPTICAL ENGINEERING, ISSN 0091-3286, 04/2018, Volume 57, Issue 4
The excess noise of avalanche photodiodes (APDs) integrated in a high-voltage (HV) CMOS process and in a pin-photodiode CMOS process, both with 0.35-mu m... 
APDS | impact ionization | HIGH RESPONSIVITY | avalanche photodiodes | MULTIPLICATION NOISE | OPTICS | excess noise | ionization coefficients
Journal Article
IEEE Journal of Selected Topics in Quantum Electronics, ISSN 1077-260X, 03/2018, Volume 24, Issue 2, pp. 1 - 5
We present here the noise properties of the 4H-SiC avalanche photodiodes (APD) operated in Geiger mode. After-pulse events together with the dark count rate... 
photodetectors | Temperature | Avalanche photodiodes | Detectors | Logic gates | Light emitting diodes | Avalanche photodiodes (APDs) | Electric fields | silicon carbide (SiC) | Photonics | ultraviolet (UV) single-photon detection | SPACE | PHYSICS, APPLIED | PERFORMANCE | OPTICS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 07/2013, Volume 60, Issue 7, pp. 2296 - 2301
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 9/2013, Volume 8905, pp. 890525 - 890525-8
The laser pulse detection is widely used in the field of laser range finders, laser communications, laser radar, laser Identification Friend or Foe, et al, for... 
Circuit design | APD | Noise reduction | Weak signal detection | Amplification | Noise | Lasers | Circuits | Photoelectricity | Signal detection
Conference Proceeding
IEEE TRANSACTIONS ON ELECTRON DEVICES, ISSN 0018-9383, 01/2008, Volume 55, Issue 1, pp. 457 - 461
In this paper, we report on an Avalanche Photodiode (APD) fabricated in a standard 0.35-mu m CMOS technology. The main electrooptical characteristics of the... 
DEAD SPACE | CMOS | IMAGE SENSOR | PHYSICS, APPLIED | shot noise | avalanche photodiodes (APDs) | GAIN | ENGINEERING, ELECTRICAL & ELECTRONIC | Electrooptical | Noise | Avalanches | Devices | Photodiodes | Pixels | Standards
Journal Article
IEEE Transactions on Electron Devices, ISSN 0018-9383, 04/2012, Volume 59, Issue 4, pp. 1030 - 1036
Journal Article
Proceedings of SPIE, ISSN 0277-786X, 07/2010, Volume 7742, Issue 1, pp. 77421K - 77421K-14
The most promising way to overcome the CMOS noise barrier of infrared AO sensors is the amplification of the photoelectron signal directly at the point of... 
excess noise. APD gain | avalanche photodiode | wavefront sensor | cryogenic amplifier | HgCdTe | infrared | fringe tracker | eAPD | readout noise | Amplification | Avalanches | Intermetallics | Arrays | Gain | Mercury compounds | Pixels | Cadmium compounds
Conference Proceeding
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