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Review of Scientific Instruments, ISSN 0034-6748, 11/2005, Volume 76, Issue 11, pp. 113701 - 113701-6
We describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors. The short... 
ESRF | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | OPTICS | MICROSCOPY | SYNCHROTRONS | WAVELENGTHS | COMPUTERS | PERFORMANCE | ADVANCED PHOTON SOURCE | PARTICLE ACCELERATORS | FOCUSING | MIRRORS | POLISHING | REFLECTION | COATINGS | FABRICATION
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2010, Volume 7802
To realize achromatic full-field hard X-ray microscopy with a resolution better than 100 nm, we studied an imaging system consisting of an elliptical mirror... 
Wolter mirror | Full-field X-ray microscopy | X-ray mirror | Advanced Kirkpatrick-Baez mirror | Energy use | Diffraction | Simulation | X-ray microscopy | Imaging | X-rays | Images | Upstream | Slits
Conference Proceeding
Optical Engineering, ISSN 0091-3286, 12/2003, Volume 42, Issue 12, pp. 3622 - 3628
For microfocusing x-ray mirrors, an elliptical shape is essential for aberration-free optics. However, it is difficult to polish elliptical mirrors to x-ray... 
sputter deposition | ellipsometry | microfocusing | profile coating | KB mirrors | x-ray optics | LTP metrology | ESRF | OPTICS | ACCURACY | COATINGS | ADVANCED PHOTON SOURCE | PARTICLE ACCELERATORS | MIRRORS
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 11/2005, Volume 76, Issue 11
We describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors. The short... 
BEAM PRODUCTION | MONOCHROMATIC RADIATION | HARD X RADIATION | PERFORMANCE | LENGTH | SYNCHROTRON RADIATION | NANOSTRUCTURES | ADVANCED PHOTON SOURCE | PARTICLE ACCELERATORS | X-RAY SPECTRA | MIRRORS | EQUIPMENT | REFLECTION | FABRICATION | OPTICS | SURFACES
Journal Article
Journal of Research of the National Institute of Standards and Technology, ISSN 1044-677X, 2006, Volume 111, Issue 3, pp. 219 - 225
We describe the distinction between the operation of a short focal length x-ray microscope forming a real image with a laboratory source (convergent... 
Diffraction limit | Kirkpatrick-Baez | Microscopy | Multilayer mirror | X-ray optics | multilayer mirror | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | diffraction limit | microscopy | x-ray optics | PLASMAS | Technology application | Optics | Research | X-ray microscopy | Methods | X rays | SYNCHROTRONS | advanced photon source | OPTICS | MICROSCOPY | PARTICLE ACCELERATORS
Journal Article
Annual Review of Materials Research, ISSN 1531-7331, 7/2017, Volume 47, Issue 1, pp. 135 - 152
Most X-ray optics for use at synchrotron beamlines are structured to achieve a desired performance level. The fabrication steps needed to achieve a certain... 
structured | multilayers | focusing | mirrors | monochromators | MONOCHROMATOR | PERFORMANCE | MATERIALS SCIENCE, MULTIDISCIPLINARY | BAND | RADIATION | REFLECTION | KIRKPATRICK-BAEZ MIRRORS | PHASE ZONE PLATES | FABRICATION | MULTILAYER LAUE LENSES | ADVANCED-PHOTON-SOURCE | Measurement | Synchrotron radiation | X-ray optics
Journal Article
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2013, Volume 8851
Compact advanced Kirkpatrick-Baez optics are used to construct a microscope that is easy to align and robust against vibrations and thermal drifts. The entire... 
Advanced Kirkpatrick-Baez optics | Wolter mirror | Full-field X-ray microscopy | X-ray mirror | Vibration | X-ray microscopy | Particle physics | Imaging | X-rays | Cameras | Microscopes | Image contrast
Conference Proceeding
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2015, Volume 9592
Conference Proceeding
AIP Conference Proceedings, ISSN 0094-243X, 05/2004, Volume 705, Issue 1, pp. 776 - 779
In the last several years, Kirkpatrick-Baez (K-B) mirror systems have been extensively applied as two-dimensional x-ray focusing elements on x-ray beamlines at... 
X RADIATION | ERRORS | X-RAY DIFFRACTION | SYNCHROTRON RADIATION | TOPOGRAPHY | CRYSTALLOGRAPHY | ADVANCED PHOTON SOURCE | PARTICLE ACCELERATORS | FOCUSING | MIRRORS | EQUIPMENT | BEAM OPTICS | ANL | SURFACES
Conference Proceeding
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X, 2011, Volume 8139
Conference Proceeding
Journal Article
Materials Science & Engineering A, ISSN 0921-5093, 2009, Volume 524, Issue 1, pp. 28 - 32
Beamline 12.3.2 at the Advanced Light Source (ALS) is a newly commissioned beamline dedicated to X-ray microdiffraction. It operates in both monochromatic and... 
X-ray beamline | Microprobe | Strain/stress measurements | Laue diffraction | X-ray microdiffraction | MATERIALS SCIENCE, MULTIDISCIPLINARY | NANOSCIENCE & NANOTECHNOLOGY | Superconductors | Diffraction | Analysis | X-rays
Journal Article
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, ISSN 0168-583X, 08/2007, Volume 261, Issue 1-2, pp. 850 - 854
Journal Article
Journal of Synchrotron Radiation, ISSN 1600-5775, 07/2010, Volume 17, Issue 4, pp. 522 - 529
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 05/2013, Volume 84, Issue 5, p. 053103
The short pulse x-ray imaging and microscopy beamline is one of the two x-ray beamlines that will take full advantage of the short pulse x-ray source in the... 
INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | SYNCHROTRON-RADIATION | INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY | X RADIATION | APPROXIMATIONS | ENERGY RESOLUTION | PHOTONS | ELECTRON BEAMS | MONOCHROMATORS | ADVANCED PHOTON SOURCE | MICROSCOPY | PARTICLE ACCELERATORS | X-RAY SOURCES | PULSES | TIME RESOLUTION | CRYSTALS | DIFFRACTION
Journal Article
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