X
Search Filters
Format Format
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
complementary metal oxide semiconductors (2) 2
devices (2) 2
engineering, electrical & electronic (2) 2
gates (2) 2
[ spi.nano ] engineering sciences [physics]/micro and nanotechnologies/microelectronics (1) 1
advanced cmos (1) 1
advanced fin-shaped field effect transistors technology (1) 1
analysis (1) 1
antennas (1) 1
architecture (1) 1
characterization (1) 1
charge (1) 1
charging (1) 1
cmos (1) 1
collectors (1) 1
couplings (1) 1
engineering sciences (1) 1
field effect transistors (1) 1
field-effect transistors (1) 1
finfets (1) 1
flicker noise (1) 1
gate (1) 1
gate oxides (1) 1
induced damage (1) 1
interface (1) 1
inversion (1) 1
logic gates (1) 1
low-frequency noise (1) 1
low‐frequency noise (1) 1
mathematical models (1) 1
mathematical optimization (1) 1
mathematics, interdisciplinary applications (1) 1
metal oxide semiconductor field effect transistors (1) 1
metal oxide semiconductors (1) 1
micro and nanotechnologies (1) 1
microelectronics (1) 1
mobility (1) 1
modeling (1) 1
models (1) 1
mos-transistors (1) 1
n-mosfets (1) 1
noise (1) 1
novel materials (1) 1
oxide damage (1) 1
physics, applied (1) 1
plasma-induced damage (1) 1
plasmas (1) 1
recorders (1) 1
reliability (1) 1
semiconductor devices (1) 1
semiconductors (1) 1
simulation (1) 1
slot contact (1) 1
soi mosfets (1) 1
stress (1) 1
usage (1) 1
variability (1) 1
more...
Language Language
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, ISSN 0894-3370, 11/2015, Volume 28, Issue 6, pp. 613 - 627
Journal Article
No results were found for your search.

Cannot display more than 1000 results, please narrow the terms of your search.