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materials science, multidisciplinary (102) 102
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Acta Materialia, ISSN 1359-6454, 2002, Volume 50, Issue 15, pp. 3845 - 3857
Journal Article
Journal of Microscopy, ISSN 0022-2720, 04/2017, Volume 266, Issue 1, pp. 60 - 68
Summary Measuring with a high accuracy the size distribution of small metallic nanoparticles loaded in a mesoporous metal oxide matrix is of particular... 
size histogram | image segmentation | image synthesis | HAADF‐STEM | nanoparticle | Ag:TiO2 composite films | statistical analysis | composite films | Ag:TiO | HAADF-STEM | TOMOGRAPHY | LASER | LIGHT | ELECTRON-MICROSCOPY | MECHANISMS | MICROSCOPY | SIZE DETERMINATION | IMAGE-ANALYSIS | GROWTH | PARTICLE-SIZE | METAL | Image processing | Nanoparticles | Morphology | Quantitative analysis | Engineering Sciences | Materials
Journal Article
Journal of Micro/Nanolithography, MEMS, and MOEMS, ISSN 1932-5150, 10/2016, Volume 15, Issue 4, pp. 044002 - 044002
Journal Article
MATERIALS TRANSACTIONS, ISSN 1345-9678, 09/2014, Volume 55, Issue 9, pp. 1377 - 1382
Using conventional transmission electron microscopy (TEM) and aberration-corrected high-angle annular dark field-scanning transmission electron microscopy... 
SYSTEM | magnesium alloy | transition layer | PERCENT-Y-ALLOY | MATERIALS SCIENCE, MULTIDISCIPLINARY | METALLURGY & METALLURGICAL ENGINEERING | STRENGTH | ORDER | PHASE | long-period stacking order structure (LPSO) | high angle annular dark field-scanning transmission electron microscopy (HAADF-STEM) | PERIOD | aging | ZN ALLOYS
Journal Article
Materials Science Forum, ISSN 0255-5476, 06/2010, Volume 654-656, pp. 2362 - 2365
The structures of Au particles on CeO2 surfaces were observed by an analytical transmission electron microscopy (TEM) equipped with annular dark field scanning... 
CeO | HAADF-STEM | TEM | Catalyst | Interface | Gold | Scanning electron microscopy | High resolution | Catalysts | Annular | Images | Nanomaterials | Orientation relationships | Nanostructure | Cerium oxide | Transmission electron microscopy | Nanocomposites | Mathematical analysis | Catalysis | Atomic structure | Scanning transmission electron microscopy | Deposition
Journal Article
Journal of Crystal Growth, ISSN 0022-0248, 03/2011, Volume 318, Issue 1, pp. 1151 - 1156
Scanning TEM with a High Angle Annular Dark Field (HAADF) detector is an outstanding tool for chemical analysis; it permits to image compositional variations... 
A1. Annular Dark Field | A1. Electron microscopy | A3. Nanowires | B2. Semiconducting materials | A1. Quantum Dots | A1. Defects
Journal Article
Journal of Crystal Growth, ISSN 0022-0248, 03/2011, Volume 318, Issue 1, pp. 1151 - 1156
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 6/2009, Volume 15, Issue 3, pp. 251 - 258
Journal Article
Particle & Particle Systems Characterization, ISSN 0934-0866, 12/2015, Volume 32, Issue 12, pp. 1063 - 1067
Journal Article
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