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Chemical Society Reviews, ISSN 0306-0012, 1/2014, Volume 43, Issue 4, pp. 1311 - 1337
Journal Article
Physical Review Letters, ISSN 0031-9007, 12/2012, Volume 109, Issue 24, p. 245003
The x-ray intensities made available by x-ray free electron lasers (FEL) open up new x-ray matter interaction channels not accessible with previous sources. We... 
FREE-ELECTRON LASER | YIELDS | AUGER | PHYSICS, MULTIDISCIPLINARY | SCATTERING
Journal Article
Vacuum, ISSN 0042-207X, 07/2012, Volume 86, Issue 12, pp. 1988 - 1991
The assignment of silver oxidation state by XPS is a matter of large controversy. In fact, a large discrepancy of binding energy values for its most intense... 
XPS Ag 3d peak | Silver oxides | Silver salts | Silver oxidation states | ENERGY | PHYSICS, APPLIED | OXIDE | MATERIALS SCIENCE, MULTIDISCIPLINARY | FREE ARGON CLUSTERS | THERMAL-DECOMPOSITION | SURFACE CHARACTERIZATION | OXYGEN | FILMS | XPS | SPECTRA | Oxides | X-ray spectroscopy | Silver nitrate | Silver | Stoichiometry | Valence | Binding energy | X-rays | X-ray photoelectron spectroscopy | Augers
Journal Article
Surface and Interface Analysis, ISSN 0142-2421, 08/2012, Volume 44, Issue 8, pp. 1155 - 1161
Every surface scientist knows about the importance of carbon spectroscopy: the signals of C 1 s and C KLL usually are indicating the surface cleanness, whereas... 
carbon hybridization | XPS | DLC | carbon nitride | XAES | THIN-FILMS | LINE-SHAPE ANALYSIS | CHEMISTRY, PHYSICAL | GLASSY-CARBON | HYDROGENATED AMORPHOUS-CARBON | ORIENTED PYROLYTIC-GRAPHITE | SURFACE CHARACTERIZATION | NANOCRYSTALLINE DIAMOND | AUGER-ELECTRON-SPECTROSCOPY | X-RAY PHOTOELECTRON | ION-BEAM DEPOSITION | Thin films | Usage | Dielectric films | Optical properties | Spectrum analysis | Graphite
Journal Article
Nuclear Inst. and Methods in Physics Research, A, ISSN 0168-9002, 2009, Volume 601, Issue 1, pp. 139 - 150
Journal Article
Journal Article
Surface and Interface Analysis, ISSN 0142-2421, 11/2005, Volume 37, Issue 11, pp. 1059 - 1067
A description of a new NIST database for quantitative Auger‐electron and X‐ray photoelectron spectroscopy (AES/XPS) is given: Simulation of Electron Spectra... 
inelastic | attenuation | scattering | spectroscopy | electron | elastic | microscopy | energy loss | backscattering | Energy loss | Spectroscopy | Inelastic | Elastic | Microscopy | Backscattering | Scattering | Electron | Attenuation | CROSS-SECTIONS | ELASTIC-SCATTERING | INTENSITY | CHEMISTRY, PHYSICAL | ANGLE | PARAMETERS | ELEMENTS | ANGULAR-DISTRIBUTION | MEAN FREE PATHS | SOLIDS | DEPTH
Journal Article