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Surface and Interface Analysis, ISSN 0142-2421, 12/2014, Volume 46, Issue 12-13, pp. 1291 - 1295
The contrasts in backscattered electron (BSE) images were studied from the cross section of a heat‐treated steel sheet using a scanning electron microscope... 
primary electron energy | backscattered electron | channeling contrast | SEM | material contrast | take‐off angle | Electron microscopy | Ferric oxide | Iron compounds | Scanning electron microscopy | Heat treatment | Channeling | BSE | Backscattering | Electron energy | Takeoff | Image detection
Journal Article
Ultramicroscopy, ISSN 0304-3991, 02/2017, Volume 173, pp. 71 - 75
The contrast of backscattered electron (BSE) images in scanning electron microscopy (SEM) depends on material parameters which can be exploited for composition... 
InGaAs | Scanning electron microscopy | Backscattered electrons | Low electron energy | Composition quantification | FILMS | HUMAN-BONE | ANALYTIC MODEL | MICROSCOPY | MINERAL DENSITY DISTRIBUTION | Electron microscopy | Monte Carlo method | Detectors
Journal Article
Ultramicroscopy, ISSN 0304-3991, 03/2018, Volume 186, pp. 82 - 93
•Compositional contrast of annular backscattered electron detectors is increased.•The method is based on physical properties of the backscattered electron... 
Scanning electron microscopy | Compositional contrast | Topography | Material contrast | Backscattered electron image | DETECTORS | IMAGES | LVSEM | ANGLES | MICROSCOPY
Journal Article
Methods in molecular biology (Clifton, N.J.), ISSN 1064-3745, 2012, Volume 887, pp. 81 - 93
Journal Article
Vacuum, ISSN 0042-207X, 01/2019, Volume 159, pp. 182 - 185
Based on the results of a process simulation, a subsequent structural simulation enables a better understanding of metallurgical effects such as solidification... 
Backscattered electrons | Backscattered current distribution | Electron beam welding | Efficiency | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | Measurement | Welding | Electrons
Journal Article
Solar Energy Materials and Solar Cells, ISSN 0927-0248, 02/2017, Volume 160, pp. 182 - 192
Finding the optimal morphology of novel organic photovoltaic (OPV) polymer blends is a major obstacle slowing the development of more efficient OPV devices.... 
Backscattered electrons | Scanning electron microscopy | Organic photovoltaics | Polymers | Morphology | PHYSICS, APPLIED | SOLAR-CELLS | ENERGY & FUELS | PERFORMANCE | MATERIALS SCIENCE, MULTIDISCIPLINARY | RESOLUTION | CONJUGATED POLYMER | ORDER | PHASE | Usage | Polymer industry | Solar energy industry | Nuclear physics | Industrial equipment | Electron microscopy
Journal Article
Journal of Applied Physics, ISSN 0021-8979, 12/2008, Volume 104, Issue 11, pp. 114907 - 114907-10
In this work, aimed primarily at providing more accurate electron inelastic mean free paths (IMFPs) and stopping powers (SPs) at low energies than are provided... 
LOW-ENERGY ELECTRONS | PHYSICS, APPLIED | MONTE-CARLO CALCULATION | STOPPING POWERS | MEAN FREE PATHS | CONDENSED MATTER | SOLID INTERACTIONS | 50-2000 EV RANGE | OPTICAL-DATA | BACKSCATTERED ELECTRONS | ELEMENTAL SOLIDS | Mechanical properties | Monte Carlo method | Usage | Copper | Aluminum | Electric properties
Journal Article
Indian Journal of Pure and Applied Physics, ISSN 0019-5596, 05/2015, Volume 53, Issue 5, pp. 298 - 303
On the basis of the characteristic of secondary electron emission, the number of secondary electrons (delta(PE theta)) released per primary electron entering... 
Incident angle | Backscattered electron | Emission angle distribution | Secondary electron yield | ENERGY | PHYSICS, MULTIDISCIPLINARY | EMISSION
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 08/2016, Volume 22, Issue 4, pp. 768 - 777
Dimensional measurements from secondary electron (SE) images were compared with those from backscattered electron (BSE) and low-loss electron (LLE) images.... 
JMONSEL | low loss electrons | metrology | secondary electrons | electron beam modeling | backscattered electrons | MATERIALS SCIENCE, MULTIDISCIPLINARY | DETECTOR | LIBRARY | MICROSCOPY | TRUTH | TELL | PART 1 | SEM | WOULD | ACCELERATING VOLTAGE
Journal Article
Journal of Nuclear Materials, ISSN 0022-3115, 11/2016, Volume 480, pp. 289 - 300
Journal Article
Journal of Microscopy, ISSN 0022-2720, 11/2017, Volume 268, Issue 2, pp. 107 - 118
Summary Characterising the impact of lithium additions in the precipitation sequence in Al–Li–Cu alloys is important to control the strengthening of the final... 
lithium | Backscattered electrons (BSE) | Monte Carlo modelling | sputtering | ion milling | STEM
Journal Article
Cement and Concrete Research, ISSN 0008-8846, 2006, Volume 36, Issue 6, pp. 1083 - 1090
Journal Article
Journal of Microscopy, ISSN 0022-2720, 06/2017, Volume 266, Issue 3, pp. 335 - 342
Journal Article