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IEEE Transactions on Microwave Theory and Techniques, ISSN 0018-9480, 12/2016, Volume 64, Issue 12, pp. 4250 - 4261
Journal Article
IEEE Transactions on Microwave Theory and Techniques, ISSN 0018-9480, 08/2013, Volume 61, Issue 8, pp. 3083 - 3098
Journal Article
IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 03/2018, Volume 65, Issue 3, pp. 870 - 880
Journal Article
IEEE Transactions on Microwave Theory and Techniques, ISSN 0018-9480, 10/2013, Volume 61, Issue 10, pp. 3774 - 3782
This paper presents the first built-in self-test system (BIST) for W-band transmit-receive phased-array modules. Low-loss high-isolation switches are attached... 
Semiconductor device measurement | Built-in self-test (BIST) | millimeter wave integrated circuits | phased arrays | Receivers | Insertion loss | Built-in self-test | silicon-germanium (SiGe) | Noise measurement | Gain | Mixers | phase shifters | SIGE BICMOS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
IEEE Journal of Solid-State Circuits, ISSN 0018-9200, 01/2016, Volume 51, Issue 1, pp. 177 - 186
Journal Article
IEEE Transactions on Microwave Theory and Techniques, ISSN 0018-9480, 01/2012, Volume 60, Issue 1, pp. 139 - 148
Journal Article
IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 10/2018, Volume 65, Issue 10, pp. 3445 - 3458
Journal Article
Vietnam Journal of Computer Science, ISSN 2196-8888, 09/2018, Volume 5, Issue 3-4, pp. 263 - 278
The paper presents the use of Genetic Algorithm to search for non-linear Autonomous Test Structures (ATS) in Built-In Testing approach. Such structures can... 
Model testing | Linear feedback shift registers | Computer simulation | Test procedures | Semicontinuous design | Shift registers | Self tests | Stochastic models | Test pattern generators | Genetic algorithms | Self-test path | Built-in self-test | Digital testing | Genetic algorithm
Journal Article
IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 8/2019, pp. 1 - 1
State-of-the-art ADC built-in self-test methods relax the test stimulus linearity but require a constant voltage shift during testing. A low-cost on-chip... 
ADC | Histograms | DNL | linearity test | Linearity | INL | Built-in self-test | Signal generators | Mathematical model | R2R DAC | Signal resolution
Journal Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ISSN 0278-0070, 02/2019, Volume 38, Issue 2, pp. 309 - 321
Journal Article
IEEE Transactions on Computers, ISSN 0018-9340, 07/2011, Volume 60, Issue 7, pp. 1030 - 1044
Journal Article
IEEE Transactions on Circuits and Systems I: Regular Papers, ISSN 1549-8328, 07/2018, Volume 65, Issue 7, pp. 2059 - 2069
Journal Article
Lecture Notes in Electrical Engineering, ISSN 1876-1100, 2019, Volume 480, pp. 385 - 395
Journal Article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 02/2010, Volume 18, Issue 2, pp. 329 - 333
Journal Article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 03/2017, Volume 25, Issue 3, pp. 942 - 953
Journal Article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ISSN 1063-8210, 06/2016, Volume 24, Issue 6, pp. 2286 - 2298
Journal Article
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