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Chemical Reviews, ISSN 0009-2665, 05/2017, Volume 117, Issue 9, pp. 6447 - 6466
This review discusses a relatively new technique for optical nanoimaging at visible wavelength, known as tip-enhanced Raman spectroscopy (TERS). This technique... 
SURFACE-PLASMONS | NANOSCALE CHEMICAL-ANALYSIS | SCANNING OPTICAL MICROSCOPE | SINGLE-MOLECULE | SILVER | CANTILEVER TIP | DIFFRACTION LIMIT | LOW-TEMPERATURE | CHEMISTRY, MULTIDISCIPLINARY | CARBON NANOTUBES | SCATTERING
Journal Article
Ultramicroscopy, ISSN 0304-3991, 06/2019, Volume 201, pp. 28 - 37
Tip abrasion is a critical issue particularly for high-speed atomic force microscopy (AFM). In this paper, a quantitative investigation on the tip abrasion of... 
Atomic force microscopy (AFM) | Tip characterization | High-speed AFM | Tip wear | Tip-sample interaction | Tip breakage | CANTILEVER ARRAYS | SHAPE | SURFACE RECONSTRUCTION | MICROSCOPY | Atomic force microscopy | Optical instruments | Analysis
Journal Article
IEEE Sensors Journal, ISSN 1530-437X, 11/2017, Volume 17, Issue 21, pp. 6960 - 6965
A microcantilever at the end face of an integrated optical fiber is reported, fabrication is uniquely achieved using a precision dicing saw. The methodology is... 
Optical fibers | Integrated optics | Optical fiber sensors | Optical interferometry | Optical device fabrication | optical fiber devices | Cavity resonators | optical sensors | optical interferometry | optical fibers | TOP CANTILEVER | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | INTERROGATION | FBG | SENSORS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Nanoscale, ISSN 2040-3364, 09/2018, Volume 10, Issue 35, pp. 16881 - 16886
Cantilever based scanning force sensors, which probe a specific tip-sample interaction through a functional tip coating, are limited by the material... 
THIN-FILMS | BEAM | NANOPARTICLES | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | NANOSCIENCE & NANOTECHNOLOGY | DOTS | CHEMISTRY, MULTIDISCIPLINARY | Atomic force microscopy | Architecture | Coercivity | Permanent magnets | Cantilever beams | Substrates | Microscopy | Magnetic materials | Magnetism | Epitaxial growth | Magnetic fields | Samarium base alloys | Tips
Journal Article
Ultramicroscopy, ISSN 0304-3991, 07/2011, Volume 111, Issue 8, pp. 1423 - 1436
Journal Article
Nano Letters, ISSN 1530-6984, 07/2008, Volume 8, Issue 7, pp. 2017 - 2022
We demonstrate noncontact, high quality surface modification of soft and hard materials with spatial resolution of ∼20 nm. The nanowriting is based on the... 
NEAR-FIELD | DATA-STORAGE | HEAT-TRANSFER | CANTILEVERS | MATERIALS SCIENCE, MULTIDISCIPLINARY | OPTICAL MICROSCOPY | SURFACE | FORCE MICROSCOPE TIP | NANOSCIENCE & NANOTECHNOLOGY | PROBE | CHEMISTRY, MULTIDISCIPLINARY | Physics - Materials Science
Journal Article
Journal of Intelligent Material Systems and Structures, ISSN 1045-389X, 9/2012, Volume 23, Issue 13, pp. 1505 - 1521
A common energy harvesting device uses a piezoelectric patch on a cantilever beam with a tip mass. The usual configuration exploits the linear resonance of the... 
energy harvesting | piezoelectric | non-linear dynamics | INTELLIGENT STRUCTURES | ELEMENTS | EXCITATION | MICROSYSTEMS | MATERIALS SCIENCE, MULTIDISCIPLINARY | SYSTEMS | ACTUATORS | Harvesting | Resonant frequency | Piezoelectricity | Nonlinearity | Mathematical models | Excitation | Cantilever beams | Devices
Journal Article
Journal of Raman Spectroscopy, ISSN 0377-0486, 09/2012, Volume 43, Issue 9, pp. 1177 - 1182
Journal Article
Sensors, ISSN 1424-8220, 11/2019, Volume 19, Issue 22, p. 4826
This work demonstrates the potential of combining a microsphere with a tip for the functionality of the contact sensor. This sensor consists of a tip aligned... 
detection | cantilever | microsphere | sensor | tip | vibration | physic | optic | optical fiber structure
Journal Article
Journal Article
Journal of Micromechanics and Microengineering, ISSN 0960-1317, 01/2019, Volume 29, Issue 1, p. 17002
The fabrication and application of a new type of cantilever for atomic force microscopes are presented. The beams of the cantilevers are made from a thin sheet... 
atomic force microscopy | cantilever | friction | ADHESION | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | FORCE | NANOSCIENCE & NANOTECHNOLOGY | MEMS | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Applied Physics Letters, ISSN 0003-6951, 07/2017, Volume 111, Issue 4, p. 43105
In atomic force microscopy (AFM), the angle relative to the vertical axis (θi ) that the tip apex of a cantilever moves is determined by the tilt of the probe... 
PHYSICS, APPLIED | CANTILEVERS | SUBSURFACE | TILT | NANOSTRUCTURES | SPRING CONSTANT | ADHESION MEASUREMENTS | VECTOR | Physics - Mesoscale and Nanoscale Physics
Journal Article
Nanotechnology, ISSN 0957-4484, 11/2014, Volume 25, Issue 45, pp. 455301 - 8
Journal Article
International Journal of Mechanical Sciences, ISSN 0020-7403, 05/2018, Volume 140, pp. 200 - 210
A number of recent publications have explored the crucial relationship between the length of a thin cylindrical shell and the influence of pre-buckling... 
Helical meshing | Nonlinear mechanics | Ovalisation | Imperfection sensitivity | Cylindrical cantilever shells | Global transverse shear | Turbines
Journal Article
Engineering Structures, ISSN 0141-0296, 05/2019, Volume 187, pp. 34 - 42
This article presents a general solution for the free transverse vibration of non-uniform, axially functionally graded cantilevers loaded at the tips with... 
Axially functionally graded | Tapered cantilever | Myklestad Method | Tip mass | Free vibration | ENGINEERING, CIVIL | SUBJECT | NONUNIFORM | FREE-VIBRATION ANALYSIS | CRACKS | Mechanical engineering | Analysis | Vibration | Cantilevers | Beam theory (structures) | Resonant frequencies | Functionally gradient materials | Euler-Bernoulli beams | Cantilever beams
Journal Article
Sensors (Switzerland), ISSN 1424-8220, 03/2018, Volume 18, Issue 3, p. 804
Journal Article
Applied Physics Letters, ISSN 0003-6951, 05/2009, Volume 94, Issue 19, pp. 193112 - 193112-3
The use of silicon tips and nonlinear response of materials can be used in overcoming the two major drawbacks of the near-field fluorescence detection which... 
PROBE TIP | FIELD ENHANCEMENT | PHYSICS, APPLIED | silicon | EXCITATION | SPECTROSCOPY | fluorescence | optical microscopy | SCANNING OPTICAL MICROSCOPY | cantilevers | SINGLE MOLECULES
Journal Article
Nanoscale, ISSN 2040-3364, 3/2016, Volume 8, Issue 1, pp. 5634 - 564
Near-field scanning optical microscopy (NSOM) combined with plasmon nanofocusing is a powerful nano-analytical tool due to its attractive feature of efficient... 
Optical microscopy | Compressing | Plasmons | Nanostructure | Plasmonics | Flexibility | Optimization | Tips
Journal Article
Review of Scientific Instruments, ISSN 0034-6748, 06/2019, Volume 90, Issue 6, p. 063707
A high-speed atomic force microscope (HS-AFM) based on a tip-sample combined scanning architecture is presented. In this system, the X-scanner, which is... 
COMPONENTS | INSTRUMENTS & INSTRUMENTATION | PHYSICS, APPLIED | Atomic force microscopy | Carrying capacity | Architecture | Optical scanners | Atomic force microscopes | Laser beams | Cantilever beams | Algorithms | Control algorithms | High speed | Optical beam deflection | Control theory | Proportional integral derivative | Microscopes
Journal Article
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