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2009, IEEE Press series on microelectronic systems, ISBN 9780471731726, Volume 12, xv, 624
A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS... 
Reliability | Metal oxide semiconductors, Complementary | Components, Circuits, Devices and Systems | Electricity | Technology | Microelectronics
Book
Microelectronics Reliability, ISSN 0026-2714, 05/2012, Volume 52, Issue 5, pp. 762 - 782
Journal Article
Reliability Engineering and System Safety, ISSN 0951-8320, 2007, Volume 92, Issue 1, pp. 92 - 108
Over the last decade, Bayesian networks (BNs) have become a popular tool for modelling many kinds of statistical problems. We have also seen a growing interest... 
Reliability analysis | Modelling | Bayesian networks | Causality | COVERAGE | COMPONENTS | INFERENCE | modelling | SOFTWARE | causality | DISTRIBUTIONS | DIAGRAMS | OPERATIONS RESEARCH & MANAGEMENT SCIENCE | reliability analysis | MODELS | EM ALGORITHM | SYSTEMS | ENGINEERING, INDUSTRIAL
Journal Article
Quality and Reliability Engineering International, ISSN 0748-8017, 12/2017, Volume 33, Issue 8, pp. 1641 - 1654
Journal Article
IEEE Transactions on Industry Applications, ISSN 0093-9994, 05/2011, Volume 47, Issue 3, pp. 1441 - 1451
Journal Article
2019, 1, Quality and Reliability Engineering Series, ISBN 1119507634, 256
<p><b>Offers Timely and Comprehensive Coverage of Dynamic System Reliability Theory</b> <p>This book focuses on hot issues in dynamic... 
Components, Circuits, Devices and Systems | Computing and Processing | Power, Energy and Industry Applications | System analysis | Reliability (Engineering)
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