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Malaysian Journal of Mathematical Sciences, ISSN 1823-8343, 07/2013, Volume 7, Issue 2, pp. 273 - 282
Journal Article
Expert Systems With Applications, ISSN 0957-4174, 2010, Volume 37, Issue 2, pp. 1784 - 1789
Being able to forecast time series accurately has been quite a popular subject for researchers both in the past and at present. However, the lack of ability of... 
Error corrected grey models | Grey models | Time series prediction | GM(1,1) | OPERATIONS RESEARCH & MANAGEMENT SCIENCE | SELECTION | COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
Applied Mathematics and Computation, ISSN 0096-3003, 10/2016, Volume 289, pp. 311 - 323
This study adopts the corrected Fourier series expansion method with only limited smooth degree to solve the Legendre equation with an arbitrary complex... 
Classical solution | Unified solution | Corrected Fourier series | Generalized solution | Singular function | MATHEMATICS, APPLIED | Differential equations
Journal Article
Defect and Diffusion Forum, ISSN 1012-0386, 09/2018, Volume 386, pp. 332 - 337
The aberration corrected transmission electron microscopy era inspires the development of new research methods. Due to small aberration many of HRTEM... 
3D structure | Amorphous alloys | Aberration corrected transmission electron microscopy | Focal series | Thin films | Transmission electron microscopy | Aberration | Power spectra | Roughness
Journal Article
Expert Systems With Applications, ISSN 0957-4174, 2011, Volume 38, Issue 8, pp. 9499 - 9505
Journal Article
Advances in Applied Probability, ISSN 0001-8678, 12/2007, Volume 39, Issue 4, pp. 1070 - 1097
Journal Article
Shuidonglixue Yanjiu yu Jinzhan/Chinese Journal of Hydrodynamics Ser. A, ISSN 1000-4874, 2017, Volume 32, Issue 6, pp. 659 - 670
Journal Article
Microscopy and Microanalysis, ISSN 1431-9276, 10/2012, Volume 18, Issue 5, pp. 982 - 994
The TEAM 0.5 electron microscope is employed to demonstrate atomic resolution phase contrast imaging and focal series reconstruction with acceleration voltages... 
lattice phonons | monochromator | aberration-corrected TEM | high-resolution TEM | exit wave reconstruction | low dose TEM | focal series | in-line electron holography | low voltage TEM | MATERIALS SCIENCE, MULTIDISCIPLINARY | SILICON | MICROSCOPY | TRANSMISSION ELECTRON-MICROSCOPY | ABERRATION | RADIATION-DAMAGE | TEM
Journal Article
The Annals of Applied Probability, ISSN 1050-5164, 5/2006, Volume 16, Issue 2, pp. 951 - 983
Journal Article
Ultramicroscopy, ISSN 0304-3991, 12/2017, Volume 183, pp. 109 - 116
•Compares Fourier optics (FO) and contrast transfer function (CTF) for low energy electron microscopy (LEEM).•Compares FO and CTF simulations to experimental... 
Low energy electron microscopy | Contrast transfer function | Fourier optics | CORRECTED LEEM | STEP CONTRAST | MICROSCOPY | LENS | Electron microscopy | Graphene | Models
Journal Article
Computational Economics, ISSN 0927-7099, 10/2003, Volume 22, Issue 2, pp. 187 - 212
Journal Article
Bulletin of the Seismological Society of America, ISSN 0037-1106, 12/2009, Volume 99, Issue 6, pp. 3340 - 3354
A new explicit differentiator series method based on the implicit Runge-Kutta method, called the IRK-DSM in brief, is developed for solving wave equations. To... 
GEOCHEMISTRY & GEOPHYSICS | ANISOTROPIC REFLECTIVITY TECHNIQUE | FINITE-DIFFERENCE SCHEMES | FLUX-CORRECTED TRANSPORT | FOURIER METHOD | SPECTRAL ELEMENT METHOD | SEISMIC RESPONSE | SYNTHETIC SEISMOGRAMS | DISCRETE METHOD | NUMERICAL-SIMULATION | EFFICIENT TOOL
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