X
Search Filters
Format Format
Format Format
X
Sort by Item Count (A-Z)
Filter by Count
Journal Article (5876) 5876
Conference Proceeding (163) 163
Book Chapter (118) 118
Dissertation (36) 36
Magazine Article (34) 34
Newspaper Article (32) 32
Publication (23) 23
Government Document (9) 9
Trade Publication Article (7) 7
Book / eBook (6) 6
more...
Subjects Subjects
Subjects Subjects
X
Sort by Item Count (A-Z)
Filter by Count
depth profiling (2714) 2714
depth (807) 807
chemistry, physical (800) 800
physics, applied (763) 763
analysis (696) 696
spectroscopy (559) 559
physics, condensed matter (508) 508
materials science, multidisciplinary (461) 461
materials science, coatings & films (420) 420
sims (377) 377
meteorology & atmospheric sciences (374) 374
geosciences, multidisciplinary (363) 363
instruments & instrumentation (349) 349
profiling (348) 348
profiles (341) 341
oceanography (335) 335
thin films (326) 326
water depth (325) 325
chemistry, analytical (313) 313
temperature (312) 312
mass spectrometry (300) 300
tiefenprofil (300) 300
environmental sciences (294) 294
silicon (288) 288
secondary ion mass spectrometry (284) 284
nuclear science & technology (272) 272
resolution (269) 269
chemistry (263) 263
diffusion (260) 260
mathematical models (257) 257
depth resolution (238) 238
geochemistry & geophysics (236) 236
xps (236) 236
surface (232) 232
computer simulation (227) 227
physics, atomic, molecular & chemical (225) 225
earth sciences (223) 223
physics (221) 221
depth profile (218) 218
oxidation (217) 217
remote sensing (217) 217
oceans (215) 215
variability (213) 213
sediments (211) 211
tof-sims (210) 210
physics, nuclear (207) 207
thickness (207) 207
humans (203) 203
algorithms (200) 200
geology (198) 198
carbon (184) 184
research (184) 184
water (180) 180
materials science (179) 179
science (179) 179
dynamics (178) 178
aerosols (176) 176
x-ray photoelectron spectroscopy (176) 176
layers (174) 174
sputtering (172) 172
oxygen (171) 171
evolution (168) 168
multidisciplinary sciences (164) 164
organic chemistry (163) 163
geophysics (162) 162
mathematical analysis (159) 159
transport (159) 159
spectrum analysis (158) 158
lidar (155) 155
methods (155) 155
studies (155) 155
microscopy (152) 152
satellites (150) 150
sekundärionenmassenspektrometrie (150) 150
multilayers (147) 147
velocity (147) 147
lasers (146) 146
salinity (145) 145
coatings (144) 144
usage (144) 144
ecology (142) 142
soils (142) 142
deposition (141) 141
optical properties (141) 141
polymers (140) 140
climate change (137) 137
research article (137) 137
clouds (133) 133
thin-films (133) 133
biochemical research methods (132) 132
ion mass-spectrometry (130) 130
surfaces (129) 129
aes (128) 128
medicine (127) 127
spectra (127) 127
morphology (126) 126
dielectric films (123) 123
ion beams (122) 122
more...
Library Location Library Location
Language Language
Language Language
X
Sort by Item Count (A-Z)
Filter by Count
English (6194) 6194
Japanese (149) 149
Chinese (76) 76
French (9) 9
German (9) 9
Czech (5) 5
Norwegian (5) 5
Persian (2) 2
Portuguese (2) 2
Russian (2) 2
Croatian (1) 1
Indonesian (1) 1
Slovenian (1) 1
Spanish (1) 1
Ukrainian (1) 1
more...
Publication Date Publication Date
Click on a bar to filter by decade
Slide to change publication date range


Journal Article
Analytical and bioanalytical chemistry, ISSN 1618-2642, 2018, Volume 411, Issue 19, pp. 4587 - 4596
.... However, despite the continually improving sensitivity of LC-MS instrumentation, in-depth profiling of samples containing low-nanogram amounts of protein has remained challenging due to analyte... 
Thin tissue sections | Small sample | Microfluidics | Proteomics | PLATFORM | CHEMISTRY, ANALYTICAL | BIOCHEMICAL RESEARCH METHODS | IDENTIFICATION | GENE ONTOLOGY | MASS-SPECTROMETRY | Proteins | Biological products | Liver | Cells | Profiling | Peptides | Spatial discrimination | Workflow | Instrumentation | Peptide mapping | Depth profiling | Mammalian cells | Construction costs | Heterogeneity | Reproducibility | Reagents | Spatial resolution | thin tissue sections | microfluidics | small sample
Journal Article
PloS one, ISSN 1932-6203, 2010, Volume 5, Issue 12, p. e15224
Journal Article
Applied surface science, ISSN 0169-4332, 2019, Volume 488, pp. 783 - 790
..., scanning electron microscope and energy-dispersive X-ray spectroscopy, respectively. The binding energy of the core levels, chemical state, atomic fractions, depth profiling of the thin film were investigated by X-ray photo-electron spectroscopy... 
PLD | XPS | Phosphors | Depth profiling | Crystal structure | BaMoO4:Pr3 | BaMoO | Pr | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | MOLYBDENUM | OPTICAL-PROPERTIES | CHEMISTRY, PHYSICAL | LUMINESCENCE PROPERTIES | AES | SURFACE | LAYER | MATERIALS SCIENCE, COATINGS & FILMS | WATER
Journal Article
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, ISSN 0168-583X, 08/2016, Volume 381, pp. 58 - 66
.... Usually, this tool requires the use of a standard of well-known composition. The present work, by contrast, deals with standard-less hydrogen depth profiling... 
Hydrogen depth profiling | Nuclear resonant reaction analysis | Hydrogen storage | Thin films | Beams (radiation) | Hydrogen | Angular distribution | Polynomials | Computational efficiency | Depth profiling | Nuclear reactions
Journal Article
Analyst (London), ISSN 0003-2654, 10/2016, Volume 141, Issue 21, pp. 5944 - 5985
...s. Quantitative elemental depth profiling is basic to analysis, and many techniques exist, but all have limitations and quantitation is always an issue... 
Thin films | Backscattering | Emission analysis | Elastic scattering | Analytical techniques | Tools | Nanomaterials | Depth profiling
Journal Article
Surface and interface analysis, ISSN 0142-2421, 2016, Volume 48, Issue 13, pp. 1354 - 1369
Based on a brief review of the well‐established framework of definitions, measurement and evaluation principles of the depth resolution in sputter profiling for interfaces, delta layers, single layers and multilayers, an extension... 
depth resolution | sputter depth profiling | MRI model | FWHM | THIN-FILMS | RESPONSE FUNCTION | CHEMISTRY, PHYSICAL | MODEL | INFORMATION DEPTH | MULTILAYERS | DECONVOLUTION | SIMS | SURFACE-ANALYSIS | ION-MASS-SPECTROSCOPY | DELTA-LAYERS | Deltas | Multilayers | Interface analysis | Profiling | Clusters | Mathematical models | Sputtering
Journal Article
Journal of electron spectroscopy and related phenomena, ISSN 0368-2048, 04/2018, Volume 224, pp. 23 - 26
.... Depth profiling with changing photon energy shows that the unsputtered films are homogeneous and that the information obtained from sputtering thus, in this instance, represents sputter damages to the sample. 
Iron oxide | Hard X-ray photoelectron spectroscopy | HAXPES | Depth profiling | Synchrotron radiation | THIN-FILMS | ENERGY PHOTOELECTRON-SPECTROSCOPY | HEMATITE | BESSY | SPECTROSCOPY | KINETIC-ENERGY | MEAN FREE PATHS | PROGRESS | XPS SPECTRA | RANGE | WATER | Hematite | Oxides | Iron compounds | X-ray spectroscopy | Radiation
Journal Article