UofT Libraries is getting a new library services platform in January 2021.
Learn more about the change.
Search Articles
SAE technical paper series, Volume 2009-01-3129.
eJournal
2010, 1, ISBN 1856176894, xxxvi, 919
Book
IEEE transactions on power electronics, ISSN 0885-8993, 03/2007, Volume 22, Issue 2, pp. 613 - 625
Damping | Inverter | Power system stability | inverter model | Control systems | Inverters | Stability analysis | Power system modeling | Circuit testing | microgrid | Frequency | Eigenvalues and eigenfunctions | power control | small-signal stability | Circuit stability | Small-signal stability | Microgrid | Power control | Inverter model | Engineering, Electrical & Electronic | Engineering | Technology | Science & Technology | Electrical engineering. Electrical power engineering | Miscellaneous | Power networks and lines | Electrical power engineering | Exact sciences and technology | Disturbances. Regulation. Protection | Electronics | Applied sciences | Electronic equipment and fabrication. Passive components, printed wiring boards, connectics | Power electronics, power supplies | Electric inverters | Design and construction | Damping (Mechanics) | Electric power | Analysis | Power supply | Mathematical models | Circuits | Switching | Oscillators | Systems stability | Eigenvalues | Autonomous | Dynamical systems
Journal Article
2010, 1, Wiley series in systems engineering and management, ISBN 047052751X, xix, 687
Book
Nano letters, ISSN 1530-6984, 01/2009, Volume 9, Issue 1, pp. 422 - 426
Materials Science | Materials Science, Multidisciplinary | Physics, Condensed Matter | Science & Technology - Other Topics | Chemistry, Physical | Physics | Science & Technology | Physics, Applied | Physical Sciences | Chemistry | Nanoscience & Nanotechnology | Technology | Chemistry, Multidisciplinary | Fullerenes and related materials; diamonds, graphite | Exact sciences and technology | Electronics | Materials science | Applied sciences | Specific materials | Transistors | Cross-disciplinary physics: materials science; rheology | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Nanostructures - ultrastructure | Reproducibility of Results | Nanotechnology - methods | Molecular Conformation | Nanotechnology - instrumentation | Materials Testing | Equipment Design | Transistors, Electronic | Particle Size | Macromolecular Substances - chemistry | Sensitivity and Specificity | Surface Properties | Nanostructures - chemistry | Computer-Aided Design | Graphite - chemistry | Equipment Failure Analysis | Microwaves | Index Medicus
Journal Article
Nature (London), ISSN 0028-0836, 04/2010, Volume 464, Issue 7290, pp. 873 - 876
Science & Technology - Other Topics | Multidisciplinary Sciences | Science & Technology | Integrated circuits | Exact sciences and technology | Switching, multiplexing, switched capacity circuits | Electronics | Applied sciences | Design. Technologies. Operation analysis. Testing | Transistors | Circuit properties | Electronic equipment and fabrication. Passive components, printed wiring boards, connectics | Electric, optical and optoelectronic circuits | Electronic circuits | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Memory (Computers) | Thin film devices | Innovations | Design and construction | Semiconductor industry | Semiconductor chips | Wire | Arrays
Journal Article
Géotechnique, ISSN 0016-8505, 2020, Volume 70, Issue 11, pp. 945 - 960
soil/structure interaction | piles AND piling | in situ testing | laboratory tests | site investigation | full-scale tests | Engineering, Geological | Engineering | Technology | Science & Technology | Soil investigations | Historic sites | Research projects | Soil-pile interaction | Glacial till | Design | Soils | Offshore | Foundations | Offshore operations | Historic buildings & sites | Design improvements | Strains | Pile tests | Field tests | Piles
Journal Article
IEEE journal of solid-state circuits, ISSN 0018-9200, 03/2007, Volume 42, Issue 3, pp. 680 - 688
Costs | Data analysis | Instruments | Random access memory | Dynamic voltage scaling | Voltage control | Low-voltage memory | sub-threshold SRAM | Semiconductor device measurement | Low voltage | voltage scaling | Logic | Testing | Voltage scaling | Sub-threshold SRAM | Engineering, Electrical & Electronic | Engineering | Technology | Science & Technology | Integrated circuits | Exact sciences and technology | Electronics | Applied sciences | Design. Technologies. Operation analysis. Testing | Transistors | Integrated circuits by function (including memories and processors) | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Design engineering | Electric potential | Static random access memory | Circuits | Chips | Voltage | Cost engineering | Constraining
Journal Article
Mathematical programming, ISSN 0025-5610, 2/2018, Volume 167, Issue 2, pp. 235 - 292
Hypothesis testing | 62H15 (Multivariate Analysis: Hypothesis Testing) | Theoretical, Mathematical and Computational Physics | Mathematics | 80M50 (Optimization: Operations research, mathematical programming) | Mathematical Methods in Physics | Robust optimization | Chance-constraints | Calculus of Variations and Optimal Control; Optimization | Mathematics of Computing | Numerical Analysis | Combinatorics | Data-driven optimization | Operations Research & Management Science | Physical Sciences | Technology | Computer Science | Computer Science, Software Engineering | Mathematics, Applied | Science & Technology | Investment analysis | Management science | Business schools | Analysis | Concrete | Information management | Portfolio management | Mathematical optimization | Operations research | Uncertainty | Statistical analysis | Optimization techniques | Queues | Nonlinear programming | Design optimization
Journal Article
IEEE journal of solid-state circuits, ISSN 0018-9200, 09/2005, Volume 40, Issue 9, pp. 1778 - 1786
minimum energy point | Energy consumption | Energy model | Instruments | Energy measurement | Minimization | Circuit testing | subthreshold logic | Equations | Semiconductor device measurement | Measurement standards | low voltage operation | Frequency | Threshold voltage | Subthreshold logic | Minimum energy point | Low voltage operation | Integrated circuits | Exact sciences and technology | Electronics | Applied sciences | Design. Technologies. Operation analysis. Testing | Integrated circuits by function (including memories and processors) | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Circuits | Energy conservation | Mathematical analysis | Mathematical models | Sizing | Energy of solution | Optimization | Standards
Journal Article
IEEE transactions on electron devices, ISSN 0018-9383, 08/2009, Volume 56, Issue 8, pp. 1674 - 1680
Resistance | inversion charge density | virtual source velocity | Logic gates | MOSFET circuits | CMOS scaling | CMOS technology | Data models | Approximation methods | Data mining | Mathematical model | MOSFET compact modeling | Virtual source velocity | Inversion charge density | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Physics | Science & Technology | Physics, Applied | Integrated circuits | Exact sciences and technology | Electronics | Applied sciences | Design. Technologies. Operation analysis. Testing | Transistors | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Metal oxide semiconductor field effect transistors | Models | Electric fields | Analysis | Complementary metal oxide semiconductors | Electric potential | Saturation | Voltage | Inversions | Mathematical models | Devices | Channels | MOSFETs
Journal Article
Management science, ISSN 0025-1909, 10/2020, Volume 66, Issue 10, pp. 4477 - 4495
decision analysis: inference | dynamic programming | infinite state | Markov | statistics: design of experiments | Business & Economics | Operations Research & Management Science | Social Sciences | Management | Technology | Science & Technology | Generalizations | Estimation bias | Randomization | Algorithms | Endogenous | Probability | Selection bias | Random variables | Budgets | Optimization
Journal Article