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2011, 2. Aufl., ISBN 3527649905, 450
A comprehensive overview of the potential and virtues of modern diffraction methods, this book covers various applications in which these versatile and very... 
Diffraction | Science | Chemistry | Analytic | Neutrons | Microstructure | X-rays | Electrons
Book
Book
1987, Practical methods in electron microscopy, ISBN 9780444809179, Volume 12, xvi, 287
Book
1950, 3d. ed., Methuen's monographs on physical subjects, 107
Book
2011, International Union of Crystallography Texts on Crystallography, ISBN 0199580200, Volume 9780199580200, viii, 332, [4] p. of plates
This is the first textbook describing crystal structure determination (especially inorganic) from high-resolution transmission electron microscopy (HRTEM) and... 
Diffraction | Electron microscopy | Crystallography | Electrons | crystallography | Electrons-Diffraction | Electron crystallography | Precession electron diffraction | Electron diffraction | High-resolution transmission electron microscopy | Crystal structure factor | 3d reconstruction | Crystal structure | Symmetry
Book
1973, ISBN 9780198554288, Volume 10., xii, 100
Book
1970, x, 165 p. illus.
Book
1981, 2nd, rev. ed., ISBN 9780444861214, xiv, 430
Book
1975, ISBN 0720403111, xiii, 410
Book
1936, Methuen's monographs on physical subjects, viii, 107
Book
1950, 3d ed., Methuenʹs monographs on physical subjects., viii, 107 p. front., diagrs.
Book
1990, Laboratory ed., Practical methods in electron microscopy, ISBN 0720442532, Volume 1, pt. 2, 185-444
Book
Ultramicroscopy, ISSN 0304-3991, 2007, Volume 107, Issue 6, pp. 507 - 513
The ultimate aim of electron diffraction data collection for structure analysis is to sample the reciprocal space as accurately as possible to obtain a... 
Scanning transmission electron microscopy (STEM) | Transmission electron microscopy (TEM) | Electron nanodiffraction | transmission electron microscopy (TEM) | ENERGY | scanning transmission electron microscopy (STEM) | ELECTRON-DIFFRACTION | NANODIFFRACTION | MICROSCOPY | electron nanodiffraction | Structure | Crystals
Journal Article
2004, ISBN 0521453739, xi, 353
Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy,... 
Thin films | Surfaces | Reflection high energy electron diffraction | Analysis
Book
2014, First edition., Advances in Imaging and Electron Physics, ISBN 0128001453, Volume 184
Web Resource
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