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1. Micron
Micron, ISSN 0968-4328, 1993
Periodicals | Microscope and microscopy
Journal
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2. Micron
Micron, ISSN 0047-7206, 1969
Electron microscopes | Periodicals
Journal
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3. Full Text Scanning Electron Microscopy and X-Ray Microanalysis
by Goldstein, Joseph I and Newbury, Dale E and Michael, Joseph R and Ritchie, Nicholas W. M and Scott, John Henry J and Joy, David C
2017, 4th ed. 2018, ISBN 9781493966745, 554
Spectroscopy/Spectrometry | Materials Science | Spectroscopy and Microscopy | Measurement Science and Instrumentation | Biological Microscopy | Characterization and Evaluation of Materials | Chemistry and Materials Science | Dual column instruments | Quantitative X-ray analysis | Electron backscatter diffraction | Table top SEM | X-ray microanalysis book | EBSD | SEM textbook | X-ray spectral measurement | Environmental SEM | SDD x-ray detectors | Focused ion beam | X-ray mapping | Variable pressure SEM | Ion beam microanalysis | Qualitative X-ray analysis | Scanning electron microscopy | X-ray microanalysis
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4. Scanning electron microscopy and x-ray microanalysis
by Goldstein, Joseph
2002, 3rd ed., ISBN 0306472929, xix, 689
Scanning electron microscopy | X-ray microanalysis | Microscopie électronique à balayage | Microanalyse aux rayons X
Book
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5. Full Text Electron Probe Microanalysis Through Coated Oxidized Surfaces
by Matthews, Mike B and Buse, Ben and Kearns, Stuart L
Microscopy and microanalysis, ISSN 1431-9276, 10/2019, Volume 25, Issue 5, pp. 1112 - 1129
Materials Applications | Materials Science | Microscopy | Technology | Materials Science, Multidisciplinary | Science & Technology | Reference materials | Bismuth trioxide | Metals | Bismuth oxides | Calibration | Coatings | Batch processing | Substrates | Thickness | Electron probe microanalysis | Silver | Low voltage | Electron probe | Oxidation | Coating | Arrays | Protective coatings | Electron probes | Linear functions | Index Medicus
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6. Full Text Standardless quantification methods in electron probe microanalysis
by Trincavelli, Jorge and Limandri, Silvina and Bonetto, Rita
Spectrochimica acta. Part B: Atomic spectroscopy, ISSN 0584-8547, 11/2014, Volume 101, pp. 76 - 85
Standardless analysis | Electron probe microanalysis | Quantification methods | Estimation of uncertainties | Spectroscopy | Technology | Science & Technology | Methods | Investigations | Algorithms | Usage | Analysis | Production methods | Mathematical analysis | X-rays | Field emission | Estimates | Electron probes | Standards
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7. Micron and microscopica acta
Micron and microscopica acta, ISSN 0739-6260, 1983
Electron probe microanalysis | Periodicals | Image processing | Microscopy | Electron microscopy
Journal
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8. Full Text Investigation into micro-physicochemical interaction between sodium dodecylbenzene sulfonate (SDBS) and partially hydrolyzed polyacrylamide (HPAM) utilizing electron probe microanalysis method
by Kong, Debin and Li, Yiqiang and Sarma, Hemanta and Xu, Shanzhi and Li, Qiang and Ming, Yu
Colloids and surfaces. A, Physicochemical and engineering aspects, ISSN 0927-7757, 01/2019, Volume 561, pp. 187 - 193
Polymer and surfactant | Electron probe microanalysis | Microstructures | Micro-physicochemical interaction | Physical Sciences | Chemistry | Chemistry, Physical | Science & Technology | Petroleum mining | Thin films | Surface active agents | Analysis | Polyacrylamide | Alkylbenzene sulfonate | Dielectric films | Methods
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9. Full Text Embracing Uncertainty: Modeling the Standard Uncertainty in Electron Probe Microanalysis-Part I
by Ritchie, Nicholas W. M
Microscopy and microanalysis, ISSN 1431-9276, 06/2020, Volume 26, Issue 3, pp. 469 - 483
Materials Science | Microscopy | Technology | Materials Science, Multidisciplinary | Science & Technology | Uncertainty | Error analysis | Surface roughness | Growth models | Optimization | Electron probe microanalysis | Accuracy | Electron probe | Quality standards | X rays | Measurement techniques | Sensors | Expert systems | Index Medicus
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10. Electron microprobe analysis and scanning electron microscopy in geology
by Reed, S. J. B
2005, 2nd ed., ISBN 052184875X, Volume 9780521848756, xiii, 189 p., [7] p. of plates
Scanning electron microscopy | Electron probe microanalysis | Petrofabric analysis | Geology
Book
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11. Electron probe microanalysis
by Marton, Ladislaus Laszlo and Tousimis, A. J
1969, ISBN 0120145669, Volume no. 6., xii, 450
Electron probe microanalysis | Microchemistry
Book
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12. Full Text High spatial resolution electron probe microanalysis of tephras and melt inclusions without beam-induced chemical modification
by Hayward, Chris
Holocene (Sevenoaks), ISSN 0959-6836, 1/2012, Volume 22, Issue 1, pp. 119 - 125
crypto-tephra | current density | high spatial resolution | Na-loss | EPMA | Geosciences, Multidisciplinary | Geography, Physical | Physical Sciences | Geology | Physical Geography | Science & Technology | Marine and continental quaternary | Igneous and metamorphic rocks petrology, volcanic processes, magmas | Exact sciences and technology | Earth, ocean, space | Earth sciences | Surficial geology | Crystalline rocks | Geochemistry | Volcanoes | Geological time | Electrons
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13. Full Text Ultra‐reduced phases in Apollo 16 regolith: Combined field emission electron probe microanalysis and atom probe tomography of submicron Fe‐Si grains in Apollo 16 sample 61500
by Gopon, Phillip and Spicuzza, Michael J and Kelly, Thomas F and Reinhard, David and Prosa, Ty J and Fournelle, John
Meteoritics & planetary science, ISSN 1086-9379, 09/2017, Volume 52, Issue 9, pp. 1941 - 1962
Physical Sciences | Science & Technology | Geochemistry & Geophysics | Tomography | Lunar soil | Silicides | Epoxy resins | Intermetallic compounds | Iron | Field emission | Minerals | Strontium | Phases | Iron compounds | High temperatures | Particle physics | Trace levels | Weathering | Silicon | Disilicides | Fugacity | Oxygen | Semiconductors | Iron silicide | Regolith | Carbon | Contamination | Lunar regolith | Electron probe microanalysis | Emissions control | Nickel | Lunar surface
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14. Atom probe microanalysis
: principles and applications to materials problems
by Miller, M. K and Smith, G. D. W
1989, ISBN 0931837995, xiv, 278 0.
Crystallography | Atom-probe field ion microscopy
Book
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15. Full Text Standardless Quantification of Heavy Elements by Electron Probe Microanalysis
by Moy, Aurélien and Merlet, Claude and Dugne, Olivier
Analytical chemistry (Washington), ISSN 0003-2700, 08/2015, Volume 87, Issue 15, pp. 7779 - 7786
Physical Sciences | Chemistry | Chemistry, Analytical | Science & Technology | Monte Carlo method | Probes (Electronic instruments) | Usage | Chemical properties | Heavy elements (Cosmochemistry) | X rays | Experiments | Heavy metals | Monte Carlo simulation | Electrons | Lead tellurides | Monte Carlo methods | Computer simulation | X-rays | Detectors | Electron probes | Lead (metal) | Standards | Analytical chemistry | Chemical Sciences
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16. Full Text Analysis of elemental composition of Fe1‐xNix and Si1‐xGex alloy thin films by electron probe microanalysis and micro‐focus X‐ray fluorescence
by Hodoroaba, Vasile‐Dan and Terborg, Ralf and Boehm, Stephan and Kim, Kyung Joong
Surface and interface analysis, ISSN 0142-2421, 12/2020, Volume 52, Issue 12, pp. 929 - 932
Thin films | Analysis | Alloys | Fluorescence | X-ray spectroscopy | Dielectric films | Investigations | Silicon wafers | Chemical analysis | Laboratories | Ion beam sputtering | Standardization | Substrates | Standards | Aluminum oxide | Thickness | Electron probe microanalysis | Chemical composition | Ion beam assisted deposition | Interlaboratory
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