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2017, 4th ed. 2018, ISBN 9781493966745, 554
Spectroscopy/Spectrometry | Materials Science | Spectroscopy and Microscopy | Measurement Science and Instrumentation | Biological Microscopy | Characterization and Evaluation of Materials | Chemistry and Materials Science | Dual column instruments | Quantitative X-ray analysis | Electron backscatter diffraction | Table top SEM | X-ray microanalysis book | EBSD | SEM textbook | X-ray spectral measurement | Environmental SEM | SDD x-ray detectors | Focused ion beam | X-ray mapping | Variable pressure SEM | Ion beam microanalysis | Qualitative X-ray analysis | Scanning electron microscopy | X-ray microanalysis
eBook
2002, 3rd ed., ISBN 0306472929, xix, 689
Book
Microscopy and microanalysis, ISSN 1431-9276, 10/2019, Volume 25, Issue 5, pp. 1112 - 1129
Materials Applications | Materials Science | Microscopy | Technology | Materials Science, Multidisciplinary | Science & Technology | Reference materials | Bismuth trioxide | Metals | Bismuth oxides | Calibration | Coatings | Batch processing | Substrates | Thickness | Electron probe microanalysis | Silver | Low voltage | Electron probe | Oxidation | Coating | Arrays | Protective coatings | Electron probes | Linear functions | Index Medicus
Journal Article
Spectrochimica acta. Part B: Atomic spectroscopy, ISSN 0584-8547, 11/2014, Volume 101, pp. 76 - 85
Standardless analysis | Electron probe microanalysis | Quantification methods | Estimation of uncertainties | Spectroscopy | Technology | Science & Technology | Methods | Investigations | Algorithms | Usage | Analysis | Production methods | Mathematical analysis | X-rays | Field emission | Estimates | Electron probes | Standards
Journal Article
Micron and microscopica acta, ISSN 0739-6260, 1983
Journal
Colloids and surfaces. A, Physicochemical and engineering aspects, ISSN 0927-7757, 01/2019, Volume 561, pp. 187 - 193
Polymer and surfactant | Electron probe microanalysis | Microstructures | Micro-physicochemical interaction | Physical Sciences | Chemistry | Chemistry, Physical | Science & Technology | Petroleum mining | Thin films | Surface active agents | Analysis | Polyacrylamide | Alkylbenzene sulfonate | Dielectric films | Methods
Journal Article
Microscopy and microanalysis, ISSN 1431-9276, 06/2020, Volume 26, Issue 3, pp. 469 - 483
Materials Science | Microscopy | Technology | Materials Science, Multidisciplinary | Science & Technology | Uncertainty | Error analysis | Surface roughness | Growth models | Optimization | Electron probe microanalysis | Accuracy | Electron probe | Quality standards | X rays | Measurement techniques | Sensors | Expert systems | Index Medicus
Journal Article
2005, 2nd ed., ISBN 052184875X, Volume 9780521848756, xiii, 189 p., [7] p. of plates
Book
1969, ISBN 0120145669, Volume no. 6., xii, 450
Book
Holocene (Sevenoaks), ISSN 0959-6836, 1/2012, Volume 22, Issue 1, pp. 119 - 125
crypto-tephra | current density | high spatial resolution | Na-loss | EPMA | Geosciences, Multidisciplinary | Geography, Physical | Physical Sciences | Geology | Physical Geography | Science & Technology | Marine and continental quaternary | Igneous and metamorphic rocks petrology, volcanic processes, magmas | Exact sciences and technology | Earth, ocean, space | Earth sciences | Surficial geology | Crystalline rocks | Geochemistry | Volcanoes | Geological time | Electrons
Journal Article
Meteoritics & planetary science, ISSN 1086-9379, 09/2017, Volume 52, Issue 9, pp. 1941 - 1962
Physical Sciences | Science & Technology | Geochemistry & Geophysics | Tomography | Lunar soil | Silicides | Epoxy resins | Intermetallic compounds | Iron | Field emission | Minerals | Strontium | Phases | Iron compounds | High temperatures | Particle physics | Trace levels | Weathering | Silicon | Disilicides | Fugacity | Oxygen | Semiconductors | Iron silicide | Regolith | Carbon | Contamination | Lunar regolith | Electron probe microanalysis | Emissions control | Nickel | Lunar surface
Journal Article
1989, ISBN 0931837995, xiv, 278 0.
Book
Analytical chemistry (Washington), ISSN 0003-2700, 08/2015, Volume 87, Issue 15, pp. 7779 - 7786
Physical Sciences | Chemistry | Chemistry, Analytical | Science & Technology | Monte Carlo method | Probes (Electronic instruments) | Usage | Chemical properties | Heavy elements (Cosmochemistry) | X rays | Experiments | Heavy metals | Monte Carlo simulation | Electrons | Lead tellurides | Monte Carlo methods | Computer simulation | X-rays | Detectors | Electron probes | Lead (metal) | Standards | Analytical chemistry | Chemical Sciences
Journal Article
Surface and interface analysis, ISSN 0142-2421, 12/2020, Volume 52, Issue 12, pp. 929 - 932
Thin films | Analysis | Alloys | Fluorescence | X-ray spectroscopy | Dielectric films | Investigations | Silicon wafers | Chemical analysis | Laboratories | Ion beam sputtering | Standardization | Substrates | Standards | Aluminum oxide | Thickness | Electron probe microanalysis | Chemical composition | Ion beam assisted deposition | Interlaboratory
Journal Article