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IET circuits, devices & systems, ISSN 1751-858X, 2007
Journal
2008, ISBN 9780849379963, xiii, 677
Book
SAE technical paper series, Volume 950300.
There are several types of automotive circuit protection devices being used today... 
Electrical, Electronics and Avionics
eJournal
IEEE circuits and devices magazine, ISSN 8755-3996, 1985
Journal
2009, 1. Aufl., ISBN 047099617X, xxii, 827
This book explains one of the hottest topics in wireless and electronic devices community, namely the wireless communication at mmWave frequencies, especially at the 60 GHz ISM band... 
Millimeter wave devices | Millimeter waves
Book
SAE technical paper series, Volume 2000-01-0456.
...) chart provide a mean to evaluate the compatibility of an over-current protection device and a particular type of wire... 
Insulation | Electrical, Electronics and Avionics | Failure modes and effects analysis
eJournal
Advanced materials (Weinheim), ISSN 1521-4095, 2019, Volume 31, Issue 26, pp. 1806483 - n/a
Journal Article
2006, ISBN 0470847549, xxvii, 384
Book
2013, ISBN 9781466509542, xxiii, 407 p., [32] p. of plates
"This book gives a comprehensive cross-section of promising MEMS and nanotechnologies that are important to the future growth of the electronics industry.... 
Microelectronics | TECHNOLOGY & ENGINEERING / Material Science | TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS | SCIENCE / Physics | Nanotechnology | Nanoelectronics
Book
Solid-state electronics, ISSN 0038-1101, 11/2016, Volume 125, pp. 52 - 62
As-fabricated (time-zero) variability and mean device aging are nowadays routinely considered in circuit simulations and design... 
Circuit simulations | Variability | BTI | Reliability | RTN | Defects | HCI | TRANSISTOR | PHYSICS, CONDENSED MATTER | PHYSICS, APPLIED | TRAPS | NOISE | SIMULATION | ENGINEERING, ELECTRICAL & ELECTRONIC | IMPACT | HOT-CARRIER DEGRADATION | INDIVIDUAL DEFECTS | DYNAMIC VARIABILITY | Circuit design | Electric properties
Journal Article
IEEE electron device letters, ISSN 0741-3106
Journal
Materials science in semiconductor processing, ISSN 1369-8001, 1998
Journal
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