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2012, Springer series in surface sciences, ISBN 3642225659, Volume 48., xiv, 331 pages
This volume presents a concise introduction to Kelvin probe force microscopy. The text discusses potential studies on semiconductor materials, nanostructures... 
Measurement | Atomic force microscopy | Kelvin-Sonde | Electrostatics | Rasterkraftmikroskopie | Kraftmikroskopie | Mechanical engineering & materials
Book
Angewandte Chemie International Edition, ISSN 1433-7851, 11/2013, Volume 52, Issue 47, pp. 12317 - 12321
The w(hole) picture: A tetrel bond is a directional noncovalent interaction between a covalently bonded atom of Group IV and a negative site, for example, the... 
ab initio calculations | silicon | noncovalent interactions | supramolecular chemistry | group 14 elements | HYDROGEN | CRYSTAL-STRUCTURE | OCTADECASIL | BETA-DONOR BONDS | UNITS | CHEMISTRY, MULTIDISCIPLINARY | Pictures | Covalence | Anions | Hydrogen bonds | Chemical bonds | Lewis base | Electrostatics | Bonding
Journal Article
The Journal of Physical Chemistry B, ISSN 1520-6106, 04/2014, Volume 118, Issue 14, pp. 3864 - 3880
Journal Article
Surface Science Reports, ISSN 0167-5729, 2011, Volume 66, Issue 1, pp. 1 - 27
Journal Article
Physical Review Letters, ISSN 0031-9007, 2016, Volume 116, Issue 9, p. 096102
The forces governing the contrast in submolecular resolution imaging of molecules with atomic force microscopy (AFM) have recently become a topic of intense... 
SCANNING TUNNELING MICROSCOPE | GRAPHENE NANORIBBONS | MANIPULATION | CHEMICAL-STRUCTURE | PHYSICS, MULTIDISCIPLINARY | SINGLE-MOLECULE | CONTRAST | IDENTIFICATION | PROBE | SURFACES | Atomic force microscopy | Charging | Imaging | Images | Inversions | Electrostatics | Image contrast | Tips
Journal Article
Scientific Reports, ISSN 2045-2322, 01/2017, Volume 7, Issue 1, p. 41657
Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most... 
SCANNING PROBE MICROSCOPY | MULTIDISCIPLINARY SCIENCES | Surface properties | Atomic force microscopy | Microscopy | Electrostatic properties | Microscopes
Journal Article
ChemPhysChem, ISSN 1439-4235, 09/2014, Volume 15, Issue 13, pp. 2768 - 2773
Chemical information can be obtained by using atomic force microscopy (AFM) and force spectroscopy (FS) with atomic or molecular resolution, even in liquid... 
force spectroscopy | lipids | scanning probe microscopy | bilayers | proteins | Proteins | Lipids | Force spectroscopy | Scanning probe microscopy | Bilayers | PROTEIN | HIGH-RESOLUTION | PHYSICS, ATOMIC, MOLECULAR & CHEMICAL | AFM | CHEMISTRY, PHYSICAL | BIOTINYLATED LIPID MONOLAYERS | BINDING | Physiological aspects | Atomic force microscopy | Spectrum analysis | Microscope and microscopy
Journal Article