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2007, 1. Aufl., ISBN 0470016086, xviii, 369
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental... 
Spectrum analysis | Optical properties | Materials | Ellipsometry | Spectroscopy
Book
2005, ISBN 0815514999, xvi, 870
The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and... 
Ellipsometry | Chemical spills
Book
Thin solid films, ISSN 0040-6090, 11/2014, Volume 571, Issue 3, pp. 744 - 748
Spectroscopic total internal reflection ellipsometry (TIRE) in its dynamic data acquisition mode has been applied for the in situ study of the interactions of... 
Granulocyte colony stimulating factor (GCSF) | SPR enchanced ellipsometry | In situ spectroscopic ellipsometry | Ligand-receptor interaction | Total internal reflection ellipsometry | Nonlinear dynamics | Spectroscopy | Receptors | Dynamic tests | Spectroscopic analysis | Tires | Reflection | Ellipsometry
Journal Article
by Meng, Y.H and Jin, G
Thin solid films, ISSN 0040-6090, 02/2011, Volume 519, Issue 9, pp. 2742 - 2745
In this work, a rotating compensator sampling for spectroscopic imaging ellipsometry (SIE) is presented and demonstrated by characterization of a SiO2 nanofilm... 
Imaging ellipsometry | Rotating compensator | Spectroscopic imaging ellipsometry | Spectroscopic ellipsometry | Nanofilm pattern | Ellipsometry | Thin films | Spectroscopy | Imaging | Nanostructure | Rotating | Sampling | Compensators
Journal Article
Thin solid films, ISSN 0040-6090, 11/2014, Volume 571, Issue 3, pp. 573 - 578
Standard variable-angle spectroscopic ellipsometry, mapping spectroscopic ellipsometry with microspot and imaging spectroscopic reflectometry are applied to... 
Imaging spectroscopic reflectometry | Non-uniform thin films | Variable-angle spectroscopic ellipsometry | Mapping spectroscopic ellipsometry | Thin films | Dielectric films | Spectroscopy | Imaging | Consistency | Reflectometry | Spectroscopic analysis | Constants | Mapping | Ellipsometry
Journal Article
Journal of magnetism and magnetic materials, ISSN 0304-8853, 07/2015, Volume 386, pp. 150 - 154
Journal Article
Thin solid films, ISSN 0040-6090, 06/2015, Volume 584, pp. 176 - 185
Ellipsometric scatterometry has gained wide industrial applications in semiconductor manufacturing after ten years of development. Among the various types of... 
Depolarization | Mueller matrix ellipsometry | Nanometrology | Computational metrology | Optical scatterometry | Mueller matrix polarimetry | Nanostructure | Optical metrology | Broadband transmission | Integrated circuit fabrication | Case studies | Thin films | Semiconductors | Computation | Metrology | Instrumentation | Ellipsometers | Ellipsometry
Journal Article
ACS applied materials & interfaces, ISSN 1944-8244, 10/2012, Volume 4, Issue 10, pp. 5673 - 5677
In this paper, SnO x films were produced by reactive radio frequency magnetron sputtering under various oxygen partial pressure (P O) in conjunction with a... 
ellipsometry | SnO | Hall effect | Raman | XPS | XRD | reactive magnetron sputtering
Journal Article
Applied optics. Optical technology and biomedical optics, ISSN 1559-128X, 02/2020, Volume 59, Issue 5, p. A26
Ellipsometric modeling of serially bi-deposited glancing-angle-deposition (GLAD) coatings with a high degree of accuracy is imperative for multilayer coatings.... 
Multilayers | Modelling | Dispersion curve analysis | Coatings | Deposition | Ellipsometry
Journal Article
12/1995, ISBN 0815514999, 857
The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and... 
Ellipsometry
eBook
Applied physics letters, ISSN 1077-3118, 11/2014, Volume 105, Issue 20, p. 201905
Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs).... 
CHEMICAL VAPOR DEPOSITION | CHALCOGENIDES | REFRACTIVE INDEX | OPTOELECTRONIC DEVICES | TRANSITION ELEMENTS | CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY | BINDING ENERGY | L-S COUPLING | ELECTRONIC STRUCTURE | ELLIPSOMETRY
Journal Article
Progress in polymer science, ISSN 0079-6700, 03/2015, Volume 42, pp. 42 - 78
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. This can have potential implications for many technological... 
In situ ellipsometry | Swelling | Thin polymer films | METIS-310304 | IR-95624 | Polymer Science | Physical Sciences | Science & Technology | Optical properties | Analysis | Lubrication and lubricants | Electrochemistry | Forecasts and trends | Information management | Nanotechnology | Electric properties | Thin films | Brushes | Automation | Penetrants | Polymeric films | Protective | Contact | Ellipsometry
Journal Article
Thin solid films, ISSN 0040-6090, 08/2013, Volume 541, pp. 41 - 45
In-situ infrared-spectroscopic characterization of polymer brushes plays an important role for a deeper understanding of the brushes' structural and chemical... 
Polymer brushes | In-situ visible ellipsometry | Poly(N-isopropylacrylamide) [PNIPAAm] | In-situ infrared-spectroscopic ellipsometry | Thin films | Brushes | Infrared | Swelling | Moisture content | Mathematical analysis | Spectra | Ellipsometry
Journal Article
Journal of polymer science. Part B, Polymer physics, ISSN 0887-6266, 01/2017, Volume 55, Issue 1, pp. 77 - 84
Journal Article