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2005, ISBN 0815514999
The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and... 
Ellipsometry
Web Resource
2005, ISBN 0815514999
Web Resource
Web Resource
Applied Physics Letters, ISSN 0003-6951, 2008, Volume 92, Issue 12, p. 121915
Using spectroscopic ellipsometry, the room temperature refractive index and absorption versus wavelength of the ferroelectric antiferromagnet bismuth ferrite,... 
ELLIPSOMETRY | PHYSICS, APPLIED | FILMS
Journal Article
2013, Springer series in surface sciences, ISBN 3642401287, Volume 52
Web Resource
Web Resource
OPTICS LETTERS, ISSN 0146-9592, 10/2017, Volume 42, Issue 19, pp. 3900 - 3903
In this Letter we describe an experiment in which coherent light is sent through a calcite crystal that separates the photons by their polarization. The two... 
INTERFEROMETRIC ELLIPSOMETRY | INTERFERENCE | OPTICS
Journal Article
2007, 1. Aufl., ISBN 0470016086, xviii, 369
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental... 
Spectrum analysis | Optical properties | Materials | Ellipsometry | Spectroscopy
Book
Journal of the Optical Society of America A: Optics and Image Science, and Vision, ISSN 1084-7529, 12/2017, Volume 34, Issue 12, pp. 2243 - 2249
Dielectric waveguide resonant underlayers are employed in ultra-high NA interference photolithography to effectively double the depth of field. Generally a... 
SAPPHIRE | SPECTROSCOPIC ELLIPSOMETRY | OPTICS
Journal Article
by Li, KW and Wang, ZB and Wang, LM and Zhang, R
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, ISSN 1084-7529, 10/2016, Volume 33, Issue 10, pp. 2041 - 2046
In this report, a new type of double-drive photoelastic modulation effect is studied. Two piezoelectric actuators are connected to a symmetric photoelastic... 
BIREFRINGENCE | OPTICS | ELLIPSOMETRY
Journal Article
Applied Surface Science, ISSN 0169-4332, 11/2019, Volume 493, pp. 673 - 678
Journal Article
Optics Letters, ISSN 0146-9592, 12/2016, Volume 41, Issue 23, pp. 5495 - 5498
Mueller matrix ellipsometry has been used to determine the effective optical constants of island-like Ag films deposited by thermal evaporation. These films... 
SCULPTURED THIN-FILMS | OPTICS | RESONANCE | OBLIQUE ANGLE DEPOSITION | SPECTROSCOPIC ELLIPSOMETRY | GENERALIZED ELLIPSOMETRY | Silver | Anisotropy | Optical properties | Flux | Plasmons | Plasmonics | Evaporation | Ellipsometry
Journal Article
Applied Physics Letters, ISSN 0003-6951, 07/2018, Volume 113, Issue 3, p. 32105
A highly precise band gap measurement based on deep UV spectroscopic ellipsometry along with Bruggeman effective model approximation was developed for... 
SPECTROSCOPIC ELLIPSOMETRY | CU | PHYSICS, APPLIED
Journal Article
Optics Communications, ISSN 0030-4018, 11/2018, Volume 427, pp. 477 - 484
Journal Article
Optics Letters, ISSN 0146-9592, 02/2011, Volume 36, Issue 4, pp. 594 - 596
In order to characterize surface chemomechanical phenomena driving microelectromechanical systems behavior, we propose herein a method to simultaneously obtain... 
ELLIPSOMETRY | OPTICS
Journal Article
2005, ISBN 0815514999, xvi, 870
The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and... 
Ellipsometry | Technology: General Issues | Chemical spills
Book
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