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Applied Physics Letters, ISSN 0003-6951, 04/2012, Volume 100, Issue 15, pp. 154101 - 154101-4
Using aberration-corrected scanning transmission electron microscope and energy dispersive x-ray spectroscopy, single, isolated impurity atoms of silicon and... 
ELEMENTS | ELECTRON | YIELDS | PHYSICS, APPLIED | FLUORESCENCE | TRANSMISSION ELECTRON MICROSCOPY | X RADIATION | ELECTRONS | SILICON | PLATINUM | CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY | GRAPHITE | X-RAY SPECTROSCOPY | LAYERS | ENERGY-LOSS SPECTROSCOPY | NANOSCIENCE AND NANOTECHNOLOGY | ATOMS | SCANNING ELECTRON MICROSCOPY | SEMICONDUCTOR MATERIALS
Journal Article
MRS Bulletin, ISSN 0883-7694, 01/2012, Volume 37, Issue 1, pp. 47 - 52
We review the recently introduced technique of atomic-resolution chemical mapping in scanning transmission electron microscopy (STEM) based on... 
crystallographic structure | Chemical composition | scanning transmission electron microscopy | CONTRAST | PHYSICS, APPLIED | MATERIALS SCIENCE, MULTIDISCIPLINARY | Mapping | X-ray spectroscopy | Atomic beam spectroscopy | Scanning transmission electron microscopy | Crystallography
Journal Article
Scientific Reports, ISSN 2045-2322, 02/2014, Volume 4, Issue 1, p. 3945
Determination of atomic-scale crystal structure for nanostructured intermetallic alloys, such as magnetic alloys containing Al, Ni, Co (alnico) and Fe, is... 
SYSTEM | CO | MULTIDISCIPLINARY SCIENCES | FE | Spectroscopy | Energy | Spectrum analysis | Alloys | Mapping | Chemical composition | X-ray spectroscopy | Crystal structure | Materials science, nanoscience and technology | MATERIALS SCIENCE
Journal Article
Ultramicroscopy, ISSN 0304-3991, 09/2016, Volume 168, pp. 7 - 16
Journal Article
Micron, ISSN 0968-4328, 05/2017, Volume 96, pp. 103 - 111
Scanning transmission electron microscopy (STEM) coupled with energy-dispersive X-ray spectroscopy (EDS) is a common technique for chemical mapping in thin... 
Precipitation | Energy-dispersive X-ray spectroscopy | Aluminium alloys | Scanning transmission electron microscopy | PHASE | CU | 1ST-PRINCIPLES | CRYSTAL-STRUCTURE | QUANTIFICATION | STABILITY | MICROSCOPY | STEM | Atoms | Alloys | X-ray spectroscopy | Aluminum alloys
Journal Article
Powder Technology, ISSN 0032-5910, 06/2018, Volume 332, p. 197
Journal Article
Ultramicroscopy, ISSN 0304-3991, 01/2018, Volume 184, Issue Pt A, pp. 100 - 108
Transmission electron microscopy specimens typically exhibit local distortion at thin foil edges, which can influence the absorption of X-rays for quantitative... 
Super-X | Energy dispersive X-ray spectroscopy (EDS) | Multiple EDS detectors | Error counter-balancing | 3D specimen geometry | Absorption correction | ABSOLUTE-SCALE | DETECTOR | ELECTRON-MICROSCOPY | EDX TOMOGRAPHY | MICROSCOPY | NANOPARTICLES | ZETA-FACTOR | Models | X-ray spectroscopy | Analysis | Detectors
Journal Article
Powder Technology, ISSN 0032-5910, 06/2018, Volume 332, pp. 197 - 209
Impregnation of active pharmaceutical ingredients (APIs) onto porous excipients has numerous benefits for solid dosage formulations. Previous work has... 
Impregnation profile | Active pharmaceutical ingredient | Particle imaging | SEM/EDS | Fluidized bed | Fenofibrate | Ecological footprint | X-ray spectroscopy | Bees
Journal Article
Ultramicroscopy, ISSN 0304-3991, 12/2016, Volume 171, pp. 1 - 7
Journal Article
Ultramicroscopy, ISSN 0304-3991, 05/2016, Volume 164, pp. 51 - 61
Journal Article
LASER PHYSICS, ISSN 1054-660X, 11/2019, Volume 29, Issue 11, p. 116001
The quantitative and qualitative investigation of silicon dioxide (SiO2) and cobalt titanate (CoTiO3) nanoparticles was performed using laser-induced breakdown... 
CALIBRATION | PHYSICS, APPLIED | NITROGEN DISSOCIATION | nanomaterials | elemental analysis | energy dispersive x-ray spectroscopy (EDS) | TRACE-ELEMENTS | laser-induced breakdown spectroscopy (LIBS) | electron number density | DISCRIMINATION | PRODUCTS | electron temperature | SAMPLES | OPTICS | WATER
Journal Article
Applied Physics Letters, ISSN 0003-6951, 04/2017, Volume 110, Issue 14
Energy dispersive X-ray spectroscopy (EDX) in scanning transmission electron microscopy and atom probe tomography are used to characterize N-polar InGaN/GaN... 
Scanning electron microscopy | Barrier layers | Quantum wells | Indium | Dispersion | Transmission electron microscopy | Indium gallium nitrides | Energy transmission | Spectrum analysis | Tomography | X ray spectra | Scanning transmission electron microscopy | Energy dispersive X ray spectroscopy
Journal Article
Journal Article