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1. Introduction to focused ion beams
: instrumentation, theory, techniques, and practice
by Giannuzzi, Lucille A and Stevie, F. A
2005, ISBN 0387231161, xiv, 357
Focused ion beams | Condensed Matter Physics | Solid State Physics | Spectroscopy and Microscopy | Physics and Astronomy | Optical and Electronic Materials | Surfaces and Interfaces, Thin Films | Physics
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2. Full Text Ion beam nanoscale fabrication and lithography—A review
by Baglin, J.E.E
Applied surface science, ISSN 0169-4332, 02/2012, Volume 258, Issue 9, pp. 4103 - 4111
Nanofabrication | Self-assembly | Focused-ion-beam | ITRS Roadmap | Lithography | Ion-implantation | Lithography, masks and pattern transfer | Exact sciences and technology | Condensed matter: structure, mechanical and thermal properties | Microelectronic fabrication (materials and surfaces technology) | Methods of nanofabrication | Electronics | Materials science | Thin film structure and morphology | Condensed matter: electronic structure, electrical, magnetic, and optical properties | Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) | Physics | Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices | Defects and impurities: doping, implantation, distribution, concentration, etc | Applied sciences | Cross-disciplinary physics: materials science; rheology | Nanotechnology | Self assembly | Instrumentation | Evolution | Joining | Nanostructure | Ion beams
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3. Full Text Three-Dimensional Superconducting Nanohelices Grown by He+‑Focused-Ion-Beam Direct Writing
by Córdoba, Rosa and Mailly, Dominique and Rezaev, Roman O and Smirnova, Ekaterina I and Schmidt, Oliver G and Fomin, Vladimir M and Zeitler, Uli and Guillamón, Isabel and Suderow, Hermann and De Teresa, José María
Nano letters, ISSN 1530-6984, 12/2019, Volume 19, Issue 12, pp. 8597 - 8604
Materials Science | Materials Science, Multidisciplinary | Physics, Condensed Matter | Science & Technology - Other Topics | Chemistry, Physical | Physics | Science & Technology | Physics, Applied | Physical Sciences | Chemistry | Nanoscience & Nanotechnology | Technology | Chemistry, Multidisciplinary | Index Medicus | Condensed Matter | Letter | Helium ion microscope | three-dimensional nanoprinting | nanosuperconductors | focused-ion-beam-induced deposition | Ginzburg−Landau equation | phase slips
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4. Focused ion beam systems
: basics and applications
by Yao, Nan
2007, ISBN 0521831997, xi, 395
Industrial applications | Focused ion beams
Book
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5. Full Text Revealing the Cell–Material Interface with Nanometer Resolution by Focused Ion Beam/Scanning Electron Microscopy
by Santoro, Francesca and Zhao, Wenting and Joubert, Lydia-Marie and Duan, Liting and Schnitker, Jan and van de Burgt, Yoeri and Lou, Hsin-Ya and Liu, Bofei and Salleo, Alberto and Cui, Lifeng and Cui, Yi and Cui, Bianxiao
ACS nano, ISSN 1936-0851, 08/2017, Volume 11, Issue 8, pp. 8320 - 8328
scanning electron microscopy | Research Support, U.S. Gov't, Non-P.H.S | focused ion beam | Materials Science(all) | Physics and Astronomy(all) | cell-material interface | nanostructures | Journal Article | ultrathin resin plasticization | Engineering(all) | Physical Sciences | Chemistry | Materials Science | Nanoscience & Nanotechnology | Technology | Materials Science, Multidisciplinary | Science & Technology - Other Topics | Chemistry, Multidisciplinary | Chemistry, Physical | Science & Technology
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6. Full Text Inductance Investigation of YBa2Cu3O7−δ Nano-Slit SQUIDs Fabricated With a Focused Helium Ion Beam
by Li, Hao and Cho, Ethan Y and Cai, Han and Wang, Yan-Ting and McCoy, Stephen J and Cybart, Shane A
IEEE transactions on applied superconductivity, ISSN 1051-8223, 08/2019, Volume 29, Issue 5, pp. 1 - 4
Inductance | Strips | YBCO thin film | Nano-slit SQUID | Josephson junctions | Helium | focused helium ion beam | Yttrium barium copper oxide | Junctions | SQUIDs | Engineering | Physical Sciences | Technology | Engineering, Electrical & Electronic | Physics | Science & Technology | Physics, Applied | Temperature dependence | Magnetometers | Electrical properties | YBCO superconductors | Helium ions | Electrical junctions | Superconducting quantum interference devices | Ion beams | Penetration depth
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7. Full Text Unravelling new principles of site-selective doping contrast in the dual-beam focused ion beam/scanning electron microscope
by Chee, Augustus K.W
Ultramicroscopy, ISSN 0304-3991, 06/2020, Volume 213, pp. 112947 - 112947
Microfabrication | Semiconductor metrology | Focused ion beam | Surface band-bending | p–n junctions | Amorphous damage | Scanning electron microscope | secondary electron emission | Dopant profiling | Low-voltage milling | Ga+ ions | Microscopy | Technology | Science & Technology | Index Medicus
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8. Full Text GaAs milling with neon focused ion beam: Comparison with gallium focused ion beam milling and subsurface damage analysis
by Xia, Deying and Jiang, Ying-Bing and Notte, John and Runt, Doug
Applied surface science, ISSN 0169-4332, 02/2021, Volume 538
Semiconductor | Nanopatterning | Helium ion microscope | GaAs | Focused ion beam | Milling
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9. Full Text Local heat generated by a focused He+ ion beam
by Sakurai, Makoto and Nagano, Shoko and Joachim, Christian
Nanotechnology, ISSN 0957-4484, 6/2020, Volume 31, Issue 34, pp. 345708 - 345708
scanning helium microscope | focused He ion beam | size-dependent melting temperature | gold nano-disk | heat generation | Physical Sciences | Materials Science | Nanoscience & Nanotechnology | Technology | Materials Science, Multidisciplinary | Science & Technology - Other Topics | Physics | Science & Technology | Physics, Applied | Index Medicus
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10. Full Text Fabrication of Sub-5 nm Nanochannels in Insulating Substrates Using Focused Ion Beam Milling
by Menard, Laurent D and Ramsey, J. Michael
Nano letters, ISSN 1530-6984, 02/2011, Volume 11, Issue 2, pp. 512 - 517
FIB milling | Nanochannels | DNA translocation | focused ion beam | nanofluidics | Materials Science | Materials Science, Multidisciplinary | Physics, Condensed Matter | Science & Technology - Other Topics | Chemistry, Physical | Physics | Science & Technology | Physics, Applied | Physical Sciences | Chemistry | Nanoscience & Nanotechnology | Technology | Chemistry, Multidisciplinary | Methods of nanofabrication | Materials science | Nanoscale pattern formation | Cross-disciplinary physics: materials science; rheology | Exact sciences and technology | Nanostructures - ultrastructure | Nanotechnology - methods | Molecular Conformation | Materials Testing | Electric Conductivity | Metals - radiation effects | Particle Size | Macromolecular Substances - chemistry | Metals - chemistry | Surface Properties | Nanostructures - chemistry | Heavy Ions | Nanostructures - radiation effects | Crystallization - methods | Index Medicus
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11. Full Text Nanostructuring Ferroelectrics via Focused Ion Beam Methodologies
by Burns, Stuart R and Gregg, J. Marty and Nagarajan, Valanoor
Advanced functional materials, ISSN 1616-301X, 12/2016, Volume 26, Issue 46, pp. 8367 - 8381
exotic domain states | focused‐ion‐beam microscopy | nano‐ferroelectrics | piezoresponse force microscopy | domain wall nanoelectronics | focused-ion-beam microscopy | nano-ferroelectrics | Materials Science | Materials Science, Multidisciplinary | Physics, Condensed Matter | Science & Technology - Other Topics | Chemistry, Physical | Physics | Science & Technology | Physics, Applied | Physical Sciences | Chemistry | Nanoscience & Nanotechnology | Technology | Chemistry, Multidisciplinary | Memory devices | Ferroelectric materials | Microscopy | Scanning force microscopy | Electronics | Silicon | Nanostructure | Ion beams
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12. Full Text Folding Sheets with Ion Beams
by Wu, Cheng-Lun and Li, Fang-Cheng and Pao, Chun-Wei and Srolovitz, David J
Nano letters, ISSN 1530-6984, 01/2017, Volume 17, Issue 1, pp. 249 - 254
Molecular dynamics | Nanostructure deformation | Ion irradiation | GPU | Focused ion beam | Defects | Materials Science | Materials Science, Multidisciplinary | Physics, Condensed Matter | Science & Technology - Other Topics | Chemistry, Physical | Physics | Science & Technology | Physics, Applied | Physical Sciences | Chemistry | Nanoscience & Nanotechnology | Technology | Chemistry, Multidisciplinary
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13. Full Text Pore structure refinement of cement paste incorporating nanosilica: Study with dual beam scanning electron microscopy/focused ion beam (SEM/FIB)
by Lim, Seungmin and Lee, Han-Seung and Kawashima, Shiho
Materials characterization, ISSN 1044-5803, 11/2018, Volume 145, pp. 323 - 328
3D pore structure | Cement paste | Nanosilica | Scanning electron microscopy (SEM)/focused ion beam (FIB) | Materials Science | Materials Science, Characterization & Testing | Technology | Materials Science, Multidisciplinary | Metallurgy & Metallurgical Engineering | Science & Technology | Porosity | Scanning devices | Analysis | Cement | POROSITY | POROUS MATERIALS | WEAR RESISTANCE | DISTRIBUTION | PORE STRUCTURE | CEMENTS | LAYERS | NANOPARTICLES | NANOSCIENCE AND NANOTECHNOLOGY | CAPILLARIES | REDUCTION | HARDNESS | SILICA | SCANNING ELECTRON MICROSCOPY | SURFACES
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