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E3S Web of Conferences, ISSN 2267-1242, 12/2018, Volume 73, p. 13019
There has been conducted Physics research on a material, that is, monitoring electric characteristic of a material using four-point probe method. This research... 
Conductivity | Four point probe | Current | Resistivity | Voltage | current | four point probe | conductivity | resistivity | voltage
Conference Proceeding
Journal of Electrical Engineering and Technology, ISSN 1975-0102, 05/2017, Volume 12, Issue 3, pp. 1314 - 1319
A handheld sheet resistance meter that can easily and quickly measure the sheet resistance of indium tin oxide films was developed. The dual-configuration... 
Resistance | Accuracy | Col-linear four point probe | Uncertainty | Four-point probe method | Linearity | Resistivity | Sheet resistance | Silicon wafer | Singe & dual configuration | ENGINEERING, ELECTRICAL & ELECTRONIC
Journal Article
AIP Conference Proceedings, ISSN 0094-243X, 01/2017, Volume 1788, Issue 1
Electric conductivity measurements of semiconductor materials such as thermoelectric need special treatment because of the uniqueness of material... 
Semiconductor materials | Circuit design | Aluminum | Short circuits | Feasibility studies | Conductors | Stainless steels | Temperature measurement | Zinc oxides | Thermoelectric materials | Ambient temperature | Electrical resistivity | Stainless steel | Zinc oxide | Copper | Four point probe method
Journal Article
Journal of Electrical Engineering & Technology, ISSN 1975-0102, 2015, Volume 10, Issue 1, pp. 325 - 330
With approval from the Asia Pacific Metrology Program Working Group on Materials Metrology (APMP WGMM), an international comparison for sheet resistance... 
Collinear four point probe | Uncertainty | Four-point probe method | Sheet resistance | Silicon wafer | Single and dual configuration | Single & dual configuration | ENGINEERING, ELECTRICAL & ELECTRONIC | 전기공학
Journal Article
Transactions of the Korean Institute of Electrical Engineers, ISSN 1975-8359, 2011, Volume 60, Issue 7, pp. 1434 - 1437
Journal Article
Materials Science Forum, ISSN 1662-9752, 08/2019, Volume 966, pp. 66 - 71
The amorphous carbon (a-C) thin films have been developed by many researchers due to many superior properties. The aim of this research to study the structure... 
Carbonization | Thin films | Diffraction patterns | Electrical properties | Electrical resistivity | Research | Configurations | Four point probe method | Carbon | Organic compounds | Structural analysis
Journal Article
Solid State Ionics, ISSN 0167-2738, 10/2018, Volume 324, p. 183
Spherical Na3V2−xNix(PO4)3/C composites with different Ni2+ doping contents (x = 0, 0.05, 0.1, 0.15, 0.2) were prepared through a spray drying-assisted method... 
Electrochemical analysis | Sodium | Doping | Mechanical properties | Spray drying | Polyvinyl chloride | Batteries | Charge transfer | Four point probe method | Electric properties | Electrochemical impedance spectroscopy
Journal Article
Transactions of the Korean Institute of Electrical Engineers, ISSN 1975-8359, 12/2010, Volume 59, Issue 4 P, pp. 423 - 427
Journal Article
AIP Conference Proceedings, ISSN 0094-243X, 10/2018, Volume 2023, Issue 1
MgB2 wire has been prepared by powder in tube method using magnesium and boron powder as raw materials. The powders were mixed and ground using an agate mortar... 
MgB | wire | transition temperature | powder in tube | Boron | Transition temperature | Borides | Electrical resistivity | Mortars (comminutors) | Raw materials | Wire | Four point probe method | Magnesium compounds | Sintering (powder metallurgy)
Journal Article
Materials Science & Engineering. B, Solid-State Materials for Advanced Technology, ISSN 0921-5107, 10/2017, Volume 224, p. 181
In this study, high-quality nanocrystalline CdS films are prepared on fluorine doped tin oxide (FTO) FTO/glass substrates by electrodeposition method. The... 
Cadmium | Scanning electron microscopy | Optoelectronics | Wurtzite | Band music | Fluorine | Weight gain measurement | Cadmium sulfides | Field emission | Substrates | Thin films | Weight loss measurement | Thickness | Morphology | Electrodeposition | Band gap | Four point probe method
Journal Article
Diamond & Related Materials, ISSN 0925-9635, 10/2019, Volume 98, p. 107457
The examination of the interactions between graphene and other components commonly used in thermal applications is an important approach for the development of... 
Metal matrix composites | Thermal conductivity | Modelling | Interface modification | Interfacial thermal conductance | Computer simulation | Aluminum | Heat conductivity | Boron carbide | Data transfer (computers) | Composite materials | Graphene | Electrical resistivity | Electron mobility | Silicon | Mathematical models | Porosity | Four point probe method | Heat transfer
Journal Article
IEEE Journal of the Electron Devices Society, ISSN 2168-6734, 2019, Volume 7, Issue 1, pp. 303 - 308
Field-effect mobility (mu(FET)) of organic semiconductor films plays a key role in the performance of field-effect transistors (FETs). Numerical extraction of... 
Organic semiconductor films | charge carrier mobility | point-contact four-probes method | RESISTANCE | TRANSPORT | ENGINEERING, ELECTRICAL & ELECTRONIC | Current carriers | Electrodes | Charge density | Resistance | Semiconductor devices | Electric contacts | Field effect transistors | Morphology | Numerical models | Carrier mobility
Journal Article
Gaoya Wuli Xuebao/Chinese Journal of High Pressure Physics, ISSN 1000-5773, 09/2008, Volume 22, Issue 3, pp. 232 - 236
Journal Article
Journal of Sol-Gel Science and Technology, ISSN 0928-0707, 08/2019, Volume 91, Issue 2, pp. 364 - 373
This paper presents the optimal configuration of parameters for the elaborated Cu2ZnSnS4 (CZTS) absorber layer, using the sol-gel method associated with... 
Optical bandgap | ZnSnS | Dip coating | Sol–gel | ANOVA | Taguchi method | CELLS | ROUTE | DESIGN | Cu2ZnSnS4 | QUALITY | Sol-gel | DEPOSITION | CZTS THIN-FILMS | PARAMETERS | SULFURIZATION | MATERIALS SCIENCE, CERAMICS | FABRICATION
Journal Article
Key Engineering Materials, ISSN 1013-9826, 10/2006, Volume 321-323, pp. 1470 - 1474
Besides well-known destructive methods for material degradation, the electrical resistivity method has been used as one of nondestructive evaluation methods... 
Nondestructive | Dual Configuration Four-Point Probe Method | Van der Pauw Method | Electrical Resistivity | Uncertainty Estimation | Single Configuration Four-Point Probe Method
Journal Article
Journal of the Physical Society of Japan, ISSN 0031-9015, 11/2018, Volume 87, Issue 11, p. 1
Two-dimensional superconductivity in atomic layers has recently attracted considerable attention owing to its intriguing different physical properties compared... 
Superconductivity | Proximity effect (electricity) | Film thickness | Physical properties | Substrates | Thickness measurement | Surface structure | Coherence length | Low temperature resistance | Dependence | Ultrahigh vacuum | Islands | Four point probe method | Structural analysis
Journal Article
RSC Advances, ISSN 2046-2069, 01/2019, Volume 9, Issue 6, pp. 3162 - 3168
Transparent conductive films (TCFs) were fabricated via a spray-coating method with a solution prepared by dispersing single-walled carbon nanotubes (SWCNTs)... 
RAMAN-SPECTRA | CHEMISTRY, MULTIDISCIPLINARY | FABRICATION | Electrical resistivity | Spectrum analysis | Reagents | Conductivity | Oxidation | Photoelectrons | Raman spectroscopy | Four point probe method | Single wall carbon nanotubes | Strong interactions (field theory) | Deionization
Journal Article
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