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Applied physics letters, ISSN 1077-3118, 2012, Volume 100, Issue 25, p. 253112
We demonstrate x-ray scanning coherent diffraction microscopy (ptychography) with 10 nm spatial resolution, clearly exceeding the resolution limits of conventional hard x-ray microscopy... 
PHYSICS, APPLIED | INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY | APERTURES | AUGMENTATION | SPATIAL RESOLUTION | STRUCTURE FACTORS | HARD X RADIATION | X-RAY DIFFRACTION | BEAMS | COHERENT RADIATION | MICROSCOPES | PROBES | SHAPE | SCANNING LIGHT MICROSCOPY | OPTICAL MICROSCOPY | OPTICS
Journal Article
Review of scientific instruments, ISSN 1089-7623, 2013, Volume 84, Issue 5, p. 053102
Journal Article
Applied physics letters, ISSN 1077-3118, 2005, Volume 87, Issue 12, pp. 124103 - 124103-3
Based on nanofocusing refractive x-ray lenses a hard x-ray scanning microscope is currently being developed and is being implemented at beamline ID13 of the European Synchrotron Radiation Facility (Grenoble, France... 
DIFFRACTION | PHYSICS, APPLIED | FLUORESCENCE | MONOCHROMATIC RADIATION | HARD X RADIATION | ATOMIC AND MOLECULAR PHYSICS | EUROPEAN SYNCHROTRON RADIATION FACILITY | MICROSCOPES | LENSES | KEV RANGE 10-100
Journal Article
Astrophysical journal. Letters, ISSN 2041-8213, 2011, Volume 727, Issue 2, p. L40
Journal Article
Applied physics letters, ISSN 1077-3118, 2010, Volume 96, Issue 9, pp. 091102 - 091102-3
We have carried out a ptychographic scanning coherent diffraction imaging experiment on a test object in order to characterize the hard x-ray nanobeam in a scanning x-ray microscope... 
X-ray diffraction | PHYSICS, APPLIED | PHASE RETRIEVAL | X-ray microscopy | RESOLUTION | statistics | INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY | X RADIATION | SPATIAL RESOLUTION | HARD X RADIATION | STATISTICS | X-RAY DIFFRACTION | MICROSCOPES | COHERENT SCATTERING | MICROSCOPY | IONIZING RADIATIONS | MATHEMATICS | ELECTROMAGNETIC RADIATION | RADIATIONS | DIFFRACTION | POSITIONING | SCATTERING
Journal Article
by Harrison, Fiona A and Craig, William W and Christensen, Finn E and Hailey, Charles J and Zhang, William W and Boggs, Steven E and Stern, Daniel and Cook, W. Rick and Forster, Karl and Giommi, Paolo and Grefenstette, Brian W and Kim, Yunjin and Kitaguchi, Takao and Koglin, Jason E and Madsen, Kristin K and Mao, Peter H and Miyasaka, Hiromasa and Mori, Kaya and Perri, Matteo and Pivovaroff, Michael J and Puccetti, Simonetta and Rana, Vikram R and Westergaard, Niels J and Willis, Jason and Zoglauer, Andreas and An, Hongjun and Bachetti, Matteo and Barrière, Nicolas M and Bellm, Eric C and Bhalerao, Varun and Brejnholt, Nicolai F and Fuerst, Felix and Liebe, Carl C and Markwardt, Craig B and Nynka, Melania and Vogel, Julia K and Walton, Dominic J and Wik, Daniel R and Alexander, David M and Cominsky, Lynn R and Hornschemeier, Ann E and Hornstrup, Allan and Kaspi, Victoria M and Madejski, Greg M and Matt, Giorgio and Molendi, Silvano and Smith, David M and Tomsick, John A and Ajello, Marco and Ballantyne, David R and Baloković, Mislav and Barret, Didier and Bauer, Franz E and Blandford, Roger D and Brandt, W. Niel and Brenneman, Laura W and Chiang, James and Chakrabarty, Deepto and Chenevez, Jerome and Comastri, Andrea and Dufour, Francois and Elvis, Martin and Fabian, Andrew C and Farrah, Duncan and Fryer, Chris L and Gotthelf, Eric V and Grindlay, Jonathan E and Helfand, David J and Krivonos, Roman and Meier, David L and Miller, Jon M and Natalucci, Lorenzo and Ogle, Patrick and Ofek, Eran O and Ptak, Andrew and Reynolds, Stephen P and Rigby, Jane R and Tagliaferri, Gianpiero and Thorsett, Stephen E and Treister, Ezequiel and Urry, C. Megan
The Astrophysical journal, ISSN 1538-4357, 2013, Volume 770, Issue 2, pp. 103 - 19
Journal Article
Physical review. B, Condensed matter and materials physics, ISSN 1550-235X, 2010, Volume 81, Issue 14
.... Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime... 
PHYSICS, CONDENSED MATTER | CONDENSER | ZONE PLATES | ILLUMINATION | IMAGES | RESOLUTION | MICROSCOPY | SYNCHROTRONS | TOMOGRAPHY | OPENINGS | ILLUMINANCE | X RADIATION | APERTURES | SPATIAL RESOLUTION | DIAGNOSTIC TECHNIQUES | KEV RANGE 01-10 | HARD X RADIATION | ENERGY RANGE | CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY | NANOSTRUCTURES | KEV RANGE | IONIZING RADIATIONS | CYCLIC ACCELERATORS | SOFT X RADIATION | ACCELERATORS | ELECTROMAGNETIC RADIATION | RADIATIONS
Journal Article
New journal of physics, ISSN 1367-2630, 10/2015, Volume 17, Issue 11, p. 113004
...% and the peak intensity of the total x-ray flux (0.1 keV similar to 5.0 keV) increases by 5%. Radiation hydrodynamic code LARED is used to interpret the above observations... 
oxidization | hard x-ray emission | uranium hohlraum | uranium nitride | MATTER | FUSION | PHYSICS, MULTIDISCIPLINARY | PHYSICS BASIS | IGNITION | Emission | Nitrides | Uranium | Depletion | Flux density | X ray sources | Coating effects | Fluid dynamics | Lasers | X-rays | X-ray sources | Hohlraums
Journal Article